Maximilien Glorieux

21 papers C 5Journal 9Unranked 7

Year	Rank	Type	Title / Venue / Authors
2021	J	`jnl`	Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects. CoRR Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
2021	J	`jnl`	Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models. CoRR Dan Alexandrescu, Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux
2021	—	`conf`	Gate-Level Graph Representation Learning: A Step Towards the Improved Stuck-at Faults Analysis. ISQED Aneesh Balakrishnan, Dan Alexandrescu, Maksim Jenihhin, Thomas Lange, Maximilien Glorieux
2021	J	`jnl`	Modeling Gate-Level Abstraction Hierarchy Using Graph Convolutional Neural Networks to Predict Functional De-Rating Factors. CoRR Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
2021	J	`jnl`	The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications. CoRR Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
2020	—	`conf`	Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects. MECO Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
2020	C	`conf`	Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models. IOLTS Dan Alexandrescu, Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux
2020	J	`jnl`	Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks. CoRR Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
2020	C	`conf`	Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features. IOLTS Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
2020	J	`jnl`	Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features. CoRR Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
2020	J	`jnl`	Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits. CoRR Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
2020	J	`jnl`	On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques. CoRR Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
2019	—	`conf`	Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks. DTIS Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
2019	C	`conf`	Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits. IOLTS Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
2019	—	`conf`	Modeling Gate-Level Abstraction Hierarchy Using Graph Convolutional Neural Networks to Predict Functional De-Rating Factors. AHS Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
2019	—	`conf`	On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques. DSN (Supplements) Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
2019	—	`conf`	The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications. NORCAS Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
2018	—	`conf`	A Novel Error Rate Estimation Approach forUltraScale+ SRAM-based FPGAs. AHS Luca Sterpone, Sarah Azimi, Ludovica Bozzoli, Boyang Du, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Cesar Boatella Polo, David Merodio Codinachs
2017	C	`conf`	EDA support for functional safety - How static and dynamic failure analysis can improve productivity in the assessment of functional safety. IOLTS Dan Alexandrescu, Adrian Evans, Maximilien Glorieux, Issam Nofal
2015	C	`conf`	A call for cross-layer and cross-domain reliability analysis and management. IOLTS Dan Alexandrescu, Adrian Evans, Enrico Costenaro, Maximilien Glorieux
2014	J	`jnl`	Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits. Microelectron. Reliab. Jean-Luc Autran, Maximilien Glorieux, Daniela Munteanu, Sylvain Clerc, Gilles Gasiot, Philippe Roche