Mauro Ciappa

54 papers B 2Journal 49Unranked 3
YearRankTypeTitle / Venue / Authors
2021 — conf
Assessing the pre-breakdown carriers' multiplication in SiC power MOSFETs by soft gamma radiation and its correlation to the Terrestrial Cosmic Rays failure rate data as measured by neutron irradiation.
IRPS
Mauro Ciappa, Marco Pocaterra
2020 — conf
Measurement of the Pre-Breakdown Characteristics in Silicon Carbide Power Devices by the Use of Radioactive Gamma Sources.
IRPS
Mauro Ciappa, Marco Pocaterra
2018 J jnl
Charge and energy deposition in thick silicon depletion layers by environmental ionizing radiation and terrestrial cosmic rays.
Microelectron. Reliab.
Ying Pang, Mauro Ciappa
2018 J jnl
Editorial.
Microelectron. Reliab.
Mauro Ciappa, Paolo Cova, Gaudenzio Meneghesso, Francesco Iannuzzo
2018 J jnl
Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources.
Microelectron. Reliab.
Mauro Ciappa, Ying Pang, Chenchen Sun
2017 J jnl
Reliability investigation of the copper-zinc system for solid diffusion bonding in power modules.
Microelectron. Reliab.
Franc Dugal, Mauro Ciappa
2016 J jnl
Electro-thermal simulation of current sharing in silicon and silicon carbide power modules under short circuit condition of types I and II.
Microelectron. Reliab.
Hiroshi Suzuki, Mauro Ciappa
2016 J jnl
Modeling the threshold voltage instability in SiC MOSFETs by multiphonon-assisted tunneling.
Microelectron. Reliab.
Takuo Kikuchi, Mauro Ciappa
2016 J jnl
Reliability issues in power electronics.
Microelectron. Reliab.
Francesco Iannuzzo, Mauro Ciappa
2015 J jnl
Reliability odometer for real-time and in situ lifetime measurement of power devices.
Microelectron. Reliab.
Mauro Ciappa, Alessandro Blascovich
2015 J jnl
TCAD simulation of current filamentation in adjacent IGBT cells under turn-on and turn-off short circuit condition.
Microelectron. Reliab.
Hiroshi Suzuki, Mauro Ciappa
2014 J jnl
Exact 3D simulation of Scanning Electron Microscopy images of semiconductor devices in the presence of electric and magnetic fields.
Microelectron. Reliab.
Mauro Ciappa, Alexey Yu. Illarionov, Emre Ilgünsatiroglu
2014 J jnl
Exploring the limits of scanning electron microscopy for the metrology of critical dimensions of photoresist structures in the nanometer range.
Microelectron. Reliab.
Mauro Ciappa, Emre Ilgünsatiroglu, Alexey Yu. Illarionov
2014 — conf
Monte Carlo modeling of the extraction of roughness parameters at nanometer scale by Critical Dimension Scanning Electron Microscopy.
ESSDERC
Mauro Ciappa, Emre Ilgünsatiroglu, Alexey Yu. Illarionov, F. Filosomi, C. Santini
2014 J jnl
Study of thermal cycling and temperature aging on PbSnAg die attach solder joints for high power modules.
Microelectron. Reliab.
Franc Dugal, Mauro Ciappa
2013 J jnl
A new two-dimensional TCAD model for threshold instability in silicon carbide MOSFETs.
Microelectron. Reliab.
Takuo Kikuchi, Mauro Ciappa
2013 J jnl
Avoiding misleading artefacts in metallurgical preparation of die attach solder joints in high power modules.
Microelectron. Reliab.
Franc Dugal, Mauro Ciappa
2013 J jnl
Unstructured tetrahedric meshes for the description of complex three-dimensional sample geometries in Monte Carlo simulation of scanning electron microscopy images for metrology applications.
Microelectron. Reliab.
Emre Ilgünsatiroglu, Alexey Yu. Illarionov, Mauro Ciappa
2012 J jnl
Editorial.
Microelectron. Reliab.
Mauro Ciappa, Paolo Cova, Francesco Iannuzzo, Gaudenzio Meneghesso
2012 J jnl
Electro-thermal simulation in the time domain of GaN HEMT for RF switch-mode amplifier.
Microelectron. Reliab.
Satoshi Ono, Mauro Ciappa, Shigeru Hiura, Wolfgang Fichtner
2012 J jnl
Monte Carlo simulation of emission site, angular and energy distributions of secondary electrons in silicon at low beam energies.
Microelectron. Reliab.
Mauro Ciappa, Emre Ilgünsatiroglu, Alexey Yu. Illarionov
2011 J jnl
A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment.
J. Electron. Test.
Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner
2011 J jnl
Design of optimum electron beam irradiation processes for the reliability of electric cables used in critical applications.
Microelectron. Reliab.
Mauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner
2011 J jnl
Synthesis of scanning electron microscopy images by high performance computing for the metrology of advanced CMOS processes.
Microelectron. Reliab.
Aniello Esposito, Mauro Ciappa, Wolfgang Fichtner
2010 J jnl
A new built-in screening methodology for Successive Approximation Register Analog to Digital Converters.
Microelectron. Reliab.
Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, M. Hommel, Wolfgang Fichtner
2010 J jnl
Accurate extraction of the mechanical properties of thin films by nanoindentation for the design of reliable MEMS.
Microelectron. Reliab.
Yuji Sasaki, Mauro Ciappa, Takayuki Masunaga, Wolfgang Fichtner
2010 J jnl
Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy.
Microelectron. Reliab.
Mauro Ciappa, Alexander Koschik, Maurizio Dapor, Wolfgang Fichtner
2010 B conf
Novel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications.
ETS
Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner
2009 J jnl
A new built-in screening methodology to achieve zero defects in the automotive environment.
Microelectron. Reliab.
Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner
2009 J jnl
Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation.
Microelectron. Reliab.
Mauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner
2009 J jnl
Multiscale simulation of aluminum thin films for the design of highly-reliable MEMS devices.
Microelectron. Reliab.
Haruka Kubo, Mauro Ciappa, Takayuki Masunaga, Wolfgang Fichtner
2009 B conf
Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications.
ETS
Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner
2008 J jnl
Novel simulation approach for transient analysis and reliable thermal management of power devices.
Microelectron. Reliab.
Alberto Castellazzi, Mauro Ciappa
2007 J jnl
A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs.
Microelectron. Reliab.
Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, M. Piton, Michel Mermet-Guyennet
2007 J jnl
Measurement of the transient junction temperature in MOSFET devices under operating conditions.
Microelectron. Reliab.
Davide Barlini, Mauro Ciappa, Michel Mermet-Guyennet, Wolfgang Fichtner
2007 J jnl
Robustness test and failure analysis of IGBT modules during turn-off.
Microelectron. Reliab.
Jesús Urresti-Ibañez, Alberto Castellazzi, M. Piton, José Rebollo, Michel Mermet-Guyennet, Mauro Ciappa
2007 J jnl
SCR operation mode of diode strings for ESD protection.
Microelectron. Reliab.
Ulrich Glaser, Kai Esmark, Martin Streibl, Christian Russ, Krzysztof Domanski, Mauro Ciappa, Wolfgang Fichtner
2007 J jnl
Virtual reliability assessment of integrated power switches based on multi-domain simulation approach.
Microelectron. Reliab.
Pierre Solomalala, J. Saiz, Michel Mermet-Guyennet, Alberto Castellazzi, Mauro Ciappa, X. Chauffleur, Jean-Pierre Fradin
2006 J jnl
Characterization of photonic devices by secondary electron potential contrast.
Microelectron. Reliab.
Marco Buzzo, Mauro Ciappa, Wolfgang Fichtner
2006 J jnl
Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications.
Microelectron. Reliab.
Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, G. Lourdel, Michel Mermet-Guyennet
2006 J jnl
New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions.
Microelectron. Reliab.
Davide Barlini, Mauro Ciappa, Alberto Castellazzi, Michel Mermet-Guyennet, Wolfgang Fichtner
2005 J jnl
Assessment of the Analytical Capabilities of Scanning Capacitance and Scanning Spreading Resistance Microscopy Applied to Semiconductor Devices.
Microelectron. Reliab.
Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
2005 J jnl
Extraction of Accurate Thermal Compact Models for Fast Electro-Thermal Simulation of IGBT Modules in Hybrid Electric Vehicles.
Microelectron. Reliab.
Mauro Ciappa, Wolfgang Fichtner, T. Kojima, Y. Yamada, Y. Nishibe
2005 J jnl
Lifetime prediction on the base of mission profiles.
Microelectron. Reliab.
Mauro Ciappa
2005 J jnl
Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast.
Microelectron. Reliab.
Marco Buzzo, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner
2004 J jnl
2D Dopant Profiling on 4H Silicon Carbide P
Microelectron. Reliab.
Marco Buzzo, Markus Leicht, Thomas Schweinböck, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner
2004 J jnl
Characterization of self-heating effects in semiconductor resistors during transmission line pulses.
Microelectron. Reliab.
Chiara Corvasce, Mauro Ciappa, Davide Barlini, S. Sponton, Gaudenzio Meneghesso, Wolfgang Fichtner
2004 J jnl
On the Use of Neural Networks to Solve the Reverse Modelling Problem for the Quantification of Dopant Profiles Extracted by Scanning Probe Microscopy Techniques.
Microelectron. Reliab.
Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner, Elisa Ricci, Andrea Scorzoni
2003 J jnl
A New Procedure to Define the Zero-Field Condition and to Delineate pn-Junctions in Silicon Devices by Scanning Capacitance Microscopy.
Microelectron. Reliab.
Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
2003 J jnl
On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices.
Microelectron. Reliab.
Giovanna Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
2002 J jnl
A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle Fatigue Failure Mechanisms in Power Semiconductors.
Microelectron. Reliab.
Mauro Ciappa, Flavio Carbognani, Paolo Cova, Wolfgang Fichtner
2002 J jnl
Selected failure mechanisms of modern power modules.
Microelectron. Reliab.
Mauro Ciappa
2002 J jnl
Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction.
Microelectron. Reliab.
Maria Stangoni, Mauro Ciappa, Marco Buzzo, Markus Leicht, Wolfgang Fichtner
2001 J jnl
Diamond-Coated Cantilevers for Scanning Capacitance Microscopy Applications.
Microelectron. Reliab.
H. Yabuhara, Mauro Ciappa, Wolfgang Fichtner