Maurice Lousberg

18 papers A 7Misc 5Journal 3Unranked 3
YearRankTypeTitle / Venue / Authors
2007 Misc conf
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
VTS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2007 Misc conf
Diagnosis of Full Open Defects in Interconnecting Lines.
VTS
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2007 J jnl
Memory Testing Under Different Stress Conditions: An Industrial Evaluation
CoRR
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
2005 Misc conf
A New Algorithm for Dynamic Faults Detection in RAMs.
VTS
Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg
2005 — conf
IEEE Std 1500 Compliant Infrastructure forModular SOC Testing.
Asian Test Symposium
Tom Waayers, Erik Jan Marinissen, Maurice Lousberg
2005 A conf
Memory Testing Under Different Stress Conditions: An Industrial Evaluation.
DATE
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
2005 — conf
Memory testing improvements through different stress conditions.
ESSCIRC
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
2003 Misc conf
Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model.
VTS
Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger
2003 J jnl
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up.
J. Electron. Test.
Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg
2002 A conf
An Effective Diagnosis Method to Support Yield Improvement.
ITC
Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg
2002 J jnl
On IEEE P1500's Standard for Embedded Core Test.
J. Electron. Test.
Erik Jan Marinissen, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti, Yervant Zorian
2001 A conf
CTL the language for describing core-based test.
ITC
Rohit Kapur, Maurice Lousberg, Tony Taylor, Brion L. Keller, Paul Reuter, Douglas Kay
2001 Misc conf
IP and Automation to Support IEEE P1500.
VTS
Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti
2000 A conf
Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?
ITC
Will R. Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg
2000 A conf
Wrapper design for embedded core test.
ITC
Yervant Zorian, Erik Jan Marinissen, Maurice Lousberg, Sandeep Kumar Goel
1999 A conf
Static component interconnect test technology (SCITT) a new technology for assembly testing.
ITC
Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg
1999 — conf
The role of test protocols in testing embedded-core-based system ICs.
ETW
Erik Jan Marinissen, Maurice Lousberg
1998 A conf
A structured and scalable mechanism for test access to embedded reusable cores.
ITC
Erik Jan Marinissen, Robert G. J. Arendsen, Gerard Bos, Hans Dingemanse, Maurice Lousberg, Clemens Wouters