Matthias Stecher

11 papers Journal 10Unranked 1
YearRankTypeTitle / Venue / Authors
2015 — conf
High voltage robustness of mold compounds under different environmental conditions.
IRPS
Julie Paye, Albert Claudi, Matthias Stecher
2011 J jnl
On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP).
Microelectron. Reliab.
Martin Sauter, Werner Simbürger, David Johnsson, Matthias Stecher
2010 J jnl
Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization.
Microelectron. Reliab.
A. Podgaynaya, Ralf Rudolf, B. Elattari, Dionyz Pogany, Erich Gornik, Matthias Stecher, Marc Strasser
2010 J jnl
System ESD robustness by co-design of on-chip and on-board protection measures.
Microelectron. Reliab.
Harald Gossner, Werner Simbürger, Matthias Stecher
2009 J jnl
Modeling and characterization of molding compound properties during cure.
Microelectron. Reliab.
Kaspar M. B. Jansen, C. Qian, Leo J. Ernst, C. Bohm, A. Kessler, Harald Preu, Matthias Stecher
2009 J jnl
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system.
Microelectron. Reliab.
Georg Haberfehlner, Sergey Bychikhin, Viktor Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany
2005 J jnl
Automated setup for thermal imaging and electrical degradation study of power DMOS devices.
Microelectron. Reliab.
Michael Heer, Viktor Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Marie Denison, Matthias Stecher, Gerhard Groos
2004 J jnl
Multiple-time-instant 2D thermal mapping during a single ESD event.
Microelectron. Reliab.
Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik
2003 J jnl
Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method.
Microelectron. Reliab.
M. Blaho, Dionyz Pogany, Erich Gornik, Marie Denison, Gerhard Groos, Matthias Stecher
2001 J jnl
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.
Microelectron. Reliab.
Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, Gerhard Groos, Matthias Stecher
2001 J jnl
Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology.
Microelectron. Reliab.
Harald Gossner, T. Müller-Lynch, Kai Esmark, Matthias Stecher