Matthias Kampmann

13 papers A 5C 2Journal 3Unranked 3

Year	Rank	Type	Title / Venue / Authors
2025	J	`jnl`	Expert Experiences in Anonymizing Personal Data and Its Use as Open Data: Qualitative Insights. Data Norbert Lichtenauer, Johann Guggumos, Matthias Kampmann, Juliane Kis, Florian Laumer, Elena März, Florian Wahl, Sebastian Wilhelm
2025	A	`conf`	Holistic Validation Pattern Generation for IEEE 1687 and Streaming Scan Networks. ITC Sebastian Huhn, Matthias Kampmann, Jan Burchard, Reinhard Meier, Kacper Czerniawski, Lori Schramm, Sandipan Sharma, Nikita Naresh, Wilson Pradeep, Prachi Sinha, Mayank Parasrampuria, Jonathan Gaudet, Martin Keim
2025	A	`conf`	Persistent High-Bandwidth IJTAG Data Delivery. ITC Jan Burchard, Matthias Kampmann, Ayush Patel, Marta Stepniewska, Przemyslaw Szymanski, Wojciech Janiszewski, Jean-François Côté, Michal Olejarz, Olga Przybysz, Lori Schramm, Jonathan Gaudet, Martin Keim
2024	A	`conf`	High-Bandwidth IJTAG over SSN. ITC Jonathan Gaudet, Jan Burchard, Matthias Kampmann, Jean-François Côté, Tim Callahan, Hung Ho Chai, Ivy Ee Hsia Lim, Lori Schramm, Olga Przybysz, Marta Stepniewska, Sascha Ochsenknecht, Michal Olejarz, Martin Keim
2020	A	`conf`	Logic Fault Diagnosis of Hidden Delay Defects. ITC Stefan Holst, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, Xiaoqing Wen
2019	J	`jnl`	Built-In Test for Hidden Delay Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Matthias Kampmann, Michael A. Kochte, Chang Liu, Eric Schneider, Sybille Hellebrand, Hans-Joachim Wunderlich
2018	C	`conf`	A "Laboratory" as an approach to foster writing skills at software engineering studies: Learning software engineering is easier when writing courses are directly applied to lecture's content and the problems and examples enrolled in. EDUCON Matthias Kampmann, Jürgen Mottok
2018	J	`jnl`	Design for Small Delay Test - A Simulation Study. Microelectron. Reliab. Matthias Kampmann, Sybille Hellebrand
2018	—	`conf`	Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. ATS Chang Liu, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, Hans-Joachim Wunderlich
2017	C	`conf`	Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. DDECS Matthias Kampmann, Sybille Hellebrand
2016	—	`conf`	X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. ATS Matthias Kampmann, Sybille Hellebrand
2015	—	`conf`	Optimized Selection of Frequencies for Faster-Than-at-Speed Test. ATS Matthias Kampmann, Michael A. Kochte, Eric Schneider, Thomas Indlekofer, Sybille Hellebrand, Hans-Joachim Wunderlich
2014	A	`conf`	FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects. ITC Sybille Hellebrand, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, Hans-Joachim Wunderlich