Matteo Buffolo

13 papers C 1Journal 11Unranked 1
YearRankTypeTitle / Venue / Authors
2025 J jnl
Long-Term Analysis of Temperature and Current-Dependent Degradation in Green High-Power Light-Emitting Diodes.
IEEE Access
Alexander Herzog, Matteo Buffolo, Francesco Piva, Simon Benkner, Babak Zandi, Jens Balasus, Paul Myland, Felix Wirth, Willem D. van Driel, Matteo Meneghini, Tran Quoc Khanh
2023 J jnl
Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes.
IEEE Access
Alexander Herzog, Simon Benkner, Babak Zandi, Matteo Buffolo, Willem D. van Driel, Matteo Meneghini, Tran Quoc Khanh
2021 C conf
Current crowding as a major cause for InGaN LED degradation at extreme high current density.
IECON
Nicola Trivellin, Matteo Buffolo, Carlo De Santi, Enrico Zanoni, Gaudenzio Meneghesso, Matteo Meneghini
2021 J jnl
Full Optical Contactless Thermometry Based on LED Photoluminescence.
IEEE Trans. Instrum. Meas.
Nicola Trivellin, Matteo Buffolo, Carlo De Santi, Matteo Meneghini, Michele Forzan, Fabrizio Dughiero, Enrico Zanoni, Gaudenzio Meneghesso
2018 J jnl
Current induced degradation study on state of the art DUV LEDs.
Microelectron. Reliab.
Nicola Trivellin, Desiree Monti, Carlo De Santi, Matteo Buffolo, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
2018 J jnl
Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits.
Microelectron. Reliab.
Matteo Buffolo, M. Pietrobon, Carlo De Santi, F. Samparisi, Michael L. Davenport, John E. Bowers, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
2018 J jnl
Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress.
Microelectron. Reliab.
N. Renso, Matteo Buffolo, Carlo De Santi, Matteo Ronzani, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
2017 J jnl
Understanding the degradation processes of GaN based LEDs submitted to extremely high current density.
Microelectron. Reliab.
N. Renso, Matteo Meneghini, Matteo Buffolo, Carlo De Santi, Gaudenzio Meneghesso, Enrico Zanoni
2016 J jnl
Experimental observation of TDDB-like behavior in reverse-biased green InGaN LEDs.
Microelectron. Reliab.
Matteo Buffolo, Matteo Meneghini, Carlo De Santi, Henry Felber, N. Renso, Gaudenzio Meneghesso, Enrico Zanoni
2015 — conf
Analysis of the mechanisms limiting the reliability of retrofit LED lamps.
RTSI
Carlo De Santi, Matteo Dal Lago, Matteo Buffolo, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni
2015 J jnl
Failure causes and mechanisms of retrofit LED lamps.
Microelectron. Reliab.
Carlo De Santi, Matteo Dal Lago, Matteo Buffolo, Desiree Monti, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni
2015 J jnl
Long-term degradation mechanisms of mid-power LEDs for lighting applications.
Microelectron. Reliab.
Matteo Buffolo, Carlo De Santi, Matteo Meneghini, D. Rigon, Gaudenzio Meneghesso, Enrico Zanoni
2014 J jnl
Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage.
Microelectron. Reliab.
Carlo De Santi, Matteo Meneghini, Michael Marioli, Matteo Buffolo, Nicola Trivellin, T. Weig, K. Holc, K. Köhler, J. Wagner, U. T. Schwarz, Gaudenzio Meneghesso, Enrico Zanoni