Mathieu Lisart

20 papers A 1C 6Journal 5Unranked 8
YearRankTypeTitle / Venue / Authors
2021 J jnl
Modeling and Simulating Electromagnetic Fault Injection.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Mathieu Dumont, Mathieu Lisart, Philippe Maurine
2019 C conf
Electromagnetic Fault Injection : How Faults Occur.
FDTC
Mathieu Dumont, Mathieu Lisart, Philippe Maurine
2015 — conf
Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation.
IRPS
Nicolas Borrel, Clement Champeix, Mathieu Lisart, Alexandre Sarafianos, Edith Kussener, Wenceslas Rahajandraibe, Jean-Max Dutertre
2015 J jnl
Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation.
Microelectron. Reliab.
Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Jean-Max Dutertre, Alexandre Sarafianos
2015 C conf
Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents.
IOLTS
Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos
2015 — conf
Influence of triple-well technology on laser fault injection and laser sensor efficiency.
DFTS
Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Alexandre Sarafianos, Jean-Max Dutertre
2015 — conf
SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology.
DFTS
Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos
2014 C conf
Electromagnetic analysis and fault injection onto secure circuits.
VLSI-SoC
Paolo Maistri, Régis Leveugle, Lilian Bossuet, Alain Aubert, Viktor Fischer, Bruno Robisson, Nicolas Moro, Philippe Maurine, Jean-Max Dutertre, Mathieu Lisart
2014 — conf
Laser attacks on integrated circuits: From CMOS to FD-SOI.
DTIS
Jean-Max Dutertre, Stephan De Castro, Alexandre Sarafianos, Noemie Boher, Bruno Rouzeyre, Mathieu Lisart, Joel Damiens, Philippe Candelier, Marie-Lise Flottes, Giorgio Di Natale
2014 C conf
Laser-induced fault effects in security-dedicated circuits.
VLSI-SoC
Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier
2013 J jnl
Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell.
Microelectron. Reliab.
Alexandre Sarafianos, Cyril Roscian, Jean-Max Dutertre, Mathieu Lisart, Assia Tria
2013 — conf
Robustness improvement of an SRAM cell against laser-induced fault injection.
DFTS
Alexandre Sarafianos, Mathieu Lisart, Olivier Gagliano, Valerie Serradeil, Cyril Roscian, Jean-Max Dutertre, Assia Tria
2013 C conf
Voltage Spikes on the Substrate to Obtain Timing Faults.
DSD
Karim Tobich, Philippe Maurine, Pierre-Yvan Liardet, Mathieu Lisart, Thomas Ordas
2012 J jnl
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology.
Microelectron. Reliab.
Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis
2011 C conf
Local and Direct EM Injection of Power Into CMOS Integrated Circuits.
FDTC
François Poucheret, Karim Tobich, Mathieu Lisart, Laurent Chusseau, Bruno Robisson, Philippe Maurine
2010 — conf
Modeling Time Domain Magnetic Emissions of ICs.
PATMOS
Victor Lomné, Philippe Maurine, Lionel Torres, Thomas Ordas, Mathieu Lisart, Jérome Toublanc
2009 J jnl
Electrical modeling of the effect of beam profile for pulsed laser fault injection.
Microelectron. Reliab.
C. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart
2008 — conf
Near-Field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits.
PATMOS
Thomas Ordas, Mathieu Lisart, Etienne Sicard, Philippe Maurine, Lionel Torres
2007 A conf
Signoff power methodology for contactless smartcards.
ISLPED
Julien Mercier, Christian Dufaza, Mathieu Lisart
2006 — conf
Methodology for Dynamic Power Verification of Contactless Smartcards.
PATMOS
Julien Mercier, Christian Dufaza, Mathieu Lisart