Massimo Vanzi

47 papers A 1Journal 43Unranked 3
YearRankTypeTitle / Venue / Authors
2021 — conf
Identifying the lights position in photometric stereo under unknown lighting.
ICCSA (Workshops)
Anna Concas, Riccardo Dessì, Caterina Fenu, Giuseppe Rodriguez, Massimo Vanzi
2018 J jnl
Further improvements of an extended Hakki-Paoli method.
Microelectron. Reliab.
Massimo Vanzi, Giovanna Mura, G. Martines
2017 J jnl
Practical optical gain by an extended Hakki-Paoli method.
Microelectron. Reliab.
Massimo Vanzi, Giulia Marcello, Giovanna Mura, G. Le Galès, S. Joly, Yannick Deshayes, Laurent Béchou
2016 J jnl
ESD tests on 850 nm GaAs-based VCSELs.
Microelectron. Reliab.
Massimo Vanzi, Giovanna Mura, Giulia Marcello, Kunhui Xiao
2015 J jnl
Clamp voltage and ideality factor in laser diodes.
Microelectron. Reliab.
Massimo Vanzi, Giovanna Mura, Giulia Marcello, G. Martines
2015 J jnl
Recent improvements in photometric stereo for rock art 3D imaging.
Digit. Appl. Archaeol. Cult. Heritage
Riccardo Dessì, Carla Mannu, Giuseppe Rodriguez, Giuseppa Tanda, Massimo Vanzi
2014 J jnl
FIB-induced electro-optical alterations in a DFB InP laser diode.
Microelectron. Reliab.
Giovanna Mura, Massimo Vanzi, Giulia Marcello
2013 J jnl
"Hot-plugging" of LED modules: Electrical characterization and device degradation.
Microelectron. Reliab.
Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
2013 J jnl
Optical losses in single-mode laser diodes.
Microelectron. Reliab.
Massimo Vanzi, Giovanna Mura, M. Marongiu, T. Tomasi
2013 J jnl
The role of the optical trans-characteristics in laser diode analysis.
Microelectron. Reliab.
Giovanna Mura, Massimo Vanzi, Giulia Marcello, Robert Cao
2013 J jnl
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells.
Microelectron. Reliab.
Alessandro Compagnin, Matteo Meneghini, Marco Barbato, Valentina Giliberto, Andrea Cester, Massimo Vanzi, Giovanna Mura, Enrico Zanoni, Gaudenzio Meneghesso
2013 J jnl
XEBIC at the Dual Beam.
Microelectron. Reliab.
Massimo Vanzi, Simona Podda, Elodia Musu, Robert Cao
2012 J jnl
Chip and package-related degradation of high power white LEDs.
Microelectron. Reliab.
Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
2012 J jnl
Phosphors for LED-based light sources: Thermal properties and reliability issues.
Microelectron. Reliab.
Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
2011 J jnl
An original DoE-based tool for silicon photodetectors EoL estimation in space environments.
Microelectron. Reliab.
Piero Spezzigu, Laurent Béchou, Gianandrea Quadri, Olivier Gilard, Yves Ousten, Massimo Vanzi
2011 J jnl
DC parameters for laser diodes from experimental curves.
Microelectron. Reliab.
Massimo Vanzi, Giovanna Mura, G. Martines
2010 J jnl
Editorial.
Microelectron. Reliab.
Massimo Vanzi
2010 J jnl
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis.
Microelectron. Reliab.
Giovanna Mura, Massimo Vanzi
2009 J jnl
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices.
Microelectron. Reliab.
Giovanna Mura, Massimo Vanzi
2008 — conf
A model for the DC characteristics of a laser diode.
ICECS
Massimo Vanzi
2008 J jnl
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy.
IEEE Trans. Instrum. Meas.
Ruggero Pintus, Simona Podda, Massimo Vanzi
2008 J jnl
Sulfur-contamination of high power white LED.
Microelectron. Reliab.
Giovanna Mura, G. Cassanelli, Fausto Fantini, Massimo Vanzi
2007 J jnl
High temperature electro-optical degradation of InGaN/GaN HBLEDs.
Microelectron. Reliab.
Matteo Meneghini, Lorenzo Trevisanello, C. Sanna, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
2007 A conf
Life begins at 65: unless you are mixed signal?
DATE
Reimund Wittmann, Massimo Vanzi, Hans-Joachim Wassener, Navraj Nandra, Joachim Kunkel, José E. da Franca, Christian Münker
2006 J jnl
Failure Analysis-assisted FMEA.
Microelectron. Reliab.
G. Cassanelli, Giovanna Mura, Fausto Fantini, Massimo Vanzi, Bernard Plano
2006 J jnl
High brightness GaN LEDs degradation during dc and pulsed stress.
Microelectron. Reliab.
Matteo Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni
2005 J jnl
Image alignment for 3D reconstruction in a SEM.
Microelectron. Reliab.
Ruggero Pintus, Simona Podda, Massimo Vanzi
2005 J jnl
Reliability predictions in electronic industrial applications.
Microelectron. Reliab.
G. Cassanelli, Giovanna Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini
2005 — conf
Video Streaming in Electron Microscopy Applications.
VLBV
Francesca Mighela, Cristian Perra, Massimo Vanzi
2004 J jnl
Failure Analysis of RuO
Microelectron. Reliab.
Simona Podda, G. Cassanelli, Fausto Fantini, Massimo Vanzi
2004 J jnl
Failure analysis of RFIC amplifiers.
Microelectron. Reliab.
Giovanna Mura, Massimo Vanzi, G. Micheletti
2004 J jnl
Quantitative 3D reconstruction from BS imaging.
Microelectron. Reliab.
Ruggero Pintus, Simona Podda, Francesca Mighela, Massimo Vanzi
2003 J jnl
On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices.
Microelectron. Reliab.
Giovanna Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
2003 J jnl
Reliability of visible GaN LEDs in plastic package.
Microelectron. Reliab.
Gaudenzio Meneghesso, S. Levada, Enrico Zanoni, Gaetano Scamarcio, Giovanna Mura, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich
2002 J jnl
A specimen-current branching approach for FA of long Electromigration test lines.
Microelectron. Reliab.
C. Caprile, Ilaria De Munari, Maurizio Impronta, Simona Podda, Andrea Scorzoni, Massimo Vanzi
2002 J jnl
An automated lifetest equipment for optical emitters.
Microelectron. Reliab.
M. Giglio, G. Martines, Giovanna Mura, Simona Podda, Massimo Vanzi
2002 J jnl
Backside Failure Analysis of GaAs ICs after ESD tests.
Microelectron. Reliab.
Gaudenzio Meneghesso, A. Cocco, Giovanna Mura, Simona Podda, Massimo Vanzi
2002 J jnl
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology.
Microelectron. Reliab.
Luca Sponton, Lorenzo Cerati, Giuseppe Croce, Giovanna Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
2002 J jnl
Editorial.
Microelectron. Reliab.
Fausto Fantini, Massimo Vanzi
2002 J jnl
Reliability tests on WDM filters.
Microelectron. Reliab.
Massimo Vanzi, Giulia Salmini, R. Pastorelli, S. Pessina, Paola Furcas
2001 J jnl
Damp Heat test on LiNbO optical modulators.
Microelectron. Reliab.
Paola Furcas, Rosaria De Palo, Maria Elena Patella, Giulia Salmini, Massimo Vanzi
2001 J jnl
Editorial.
Microelectron. Reliab.
Daniel L. Barton, Shigeru Nakajima, Massimo Vanzi
2001 J jnl
Investigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs.
Microelectron. Reliab.
Gaudenzio Meneghesso, Simona Podda, Massimo Vanzi
1988 J jnl
A physically based mobility model for numerical simulation of nonplanar devices.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Claudio Lombardi, Stefano Manzini, Antonio Saporito, Massimo Vanzi
1988 J jnl
Measurement of the local latch-up sensitivity by means of computer-controller scanning electron microscopy.
IEEE J. Solid State Circuits
Claudio Canali, Manuela Giannini, Andrea Scorzoni, Massimo Vanzi, Enrico Zanoni
1987 J jnl
An Extension to Newton's Method in Device Simulators--On An Efficient Algorithm to Evaluate Small-Signal Parameters and to Predict Initial Guess.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Zhiping Yu, Robert W. Dutton, Massimo Vanzi
1986 J jnl
A Meyer-Like Approach for the Transient Analysis of Digital MOS IC's.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Claudio Turchetti, P. Prioretti, Guido Masetti, E. Profumo, Massimo Vanzi