| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
Design Criteria of High-Temperature Integrated Circuits Using Standard SOI CMOS Process up to 300°C.
IEEE Access
|
| 2024 | — | conf |
I2MTC
|
| 2023 | — | conf |
I2MTC
|
| 2023 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2023 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2020 | J | jnl |
J. Sensors
|
| 2019 | — | conf |
RTSI
|
| 2018 | J | jnl |
IEEE Instrum. Meas. Mag.
|
| 2018 | — | conf |
RTSI
|
| 2017 | — | conf |
MeMeA
|
| 2016 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2016 | — | conf |
ISC2
|
| 2016 | — | conf |
ApplePies
|
| 2015 | J | jnl |
IET Circuits Devices Syst.
|
| 2015 | — | conf |
M&N
|
| 2008 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2007 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2005 | — | conf |
ECCTD
|
| 2001 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2001 | J | jnl |
VLSI Design
|
| 2001 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2001 | J | jnl |
VLSI Design
|
| 1998 | J | jnl |
VLSI Design
|
| 1998 | J | jnl |
VLSI Design
|
| 1993 | — | — |