Masanori Tsukuda

15 papers Journal 14Unranked 1
YearRankTypeTitle / Venue / Authors
2019 — conf
Switching of 3300V Scaled IGBT by 5V Gate Drive.
ASICON
Toshiro Hiramoto, Katsumi Satoh, Tomoko Matsudai, Wataru Saito, Kuniyuki Kakushima, Takuya Hoshii, Kazuyoshi Furukawa, Masahiro Watanabe, Naoyuki Shigyo, Hitoshi Wakabayashi, Kazuo Tsutsui, Hiroshi Iwai, Atsushi Ogura, Shinichi Nishizawa, Ichiro Omura, Hiromichi Ohashi, Kazuo Itou, Toshihiro Takakura, Munetoshi Fukui, Shinichi Suzuki, Ken Takeuchi, Masanori Tsukuda, Yohichiroh Numasawa
2018 J jnl
A fully digital feedback control of gate driver for current balancing of parallel connected power devices.
Microelectron. Reliab.
Ravi N. Tripathi, Masanori Tsukuda, Ichiro Omura
2018 J jnl
Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena.
Microelectron. Reliab.
Masanori Tsukuda, Seiya Abe, Kazunori Hasegawa, Tamotsu Ninomiya, Ichiro Omura
2018 J jnl
Envelop tracking based embedded current measurement for monitoring of IGBT and power converter system.
Microelectron. Reliab.
Bat-Otgon Bat-Ochir, Battuvshin Bayarkhuu, Kazunori Hasegawa, Masanori Tsukuda, Bayasgalan Dugarjav, Ichiro Omura
2017 J jnl
Clamp type built-in current sensor using PCB in high-voltage power modules.
Microelectron. Reliab.
Masanori Tsukuda, K. Nakashima, S. Tabata, Kazunori Hasegawa, Ichiro Omura
2017 J jnl
Modelling of the shoot-through phenomenon introduced by the next generation IGBT in inverter applications.
Microelectron. Reliab.
Seiya Abe, Kazunori Hasegawa, Masanori Tsukuda, Keiji Wada, Ichiro Omura, Tamotsu Ninomiya
2016 J jnl
Micro PCB Rogowski coil for current monitoring and protection of high voltage power modules.
Microelectron. Reliab.
Masanori Tsukuda, Masahiro Koga, Kenta Nakashima, Ichiro Omura
2015 J jnl
16-Channel micro magnetic flux sensor array for IGBT current distribution measurement.
Microelectron. Reliab.
H. Tomonaga, Masanori Tsukuda, S. Okoda, R. Noda, K. Tashiro, Ichiro Omura
2015 J jnl
Failure analysis of power devices based on real-time monitoring.
Microelectron. Reliab.
Akihiko Watanabe, Masanori Tsukuda, Ichiro Omura
2015 J jnl
High-throughput and full automatic DBC-module screening tester for high power IGBT.
Microelectron. Reliab.
Masanori Tsukuda, H. Tomonaga, S. Okoda, R. Noda, K. Tashiro, Ichiro Omura
2014 J jnl
Short-circuit protection for an IGBT with detecting the gate voltage and gate charge.
Microelectron. Reliab.
Kazunori Hasegawa, Kenichi Yamamoto, Hidetaro Yoshida, Kota Hamada, Masanori Tsukuda, Ichiro Omura
2014 J jnl
Structure oriented compact model for advanced trench IGBTs without fitting parameters for extreme condition: Part II.
Microelectron. Reliab.
Junpei Takaishi, Syohei Harada, Masanori Tsukuda, Ichiro Omura
2013 J jnl
Real time degradation monitoring system for high power IGBT module under power cycling test.
Microelectron. Reliab.
Akihiko Watanabe, Masanori Tsukuda, Ichiro Omura
2011 J jnl
"Design for EMI" approach on power PiN diode reverse recovery.
Microelectron. Reliab.
Masanori Tsukuda, Keiichiro Kawakami, Kenichi Takahama, Ichiro Omura
2011 J jnl
Tiny-scale "stealth" current sensor to probe power semiconductor device failure.
Microelectron. Reliab.
Yuya Kasho, Hidetoshi Hirai, Masanori Tsukuda, Ichiro Omura