Masahiro Ishida

56 papers A 25B 1C 1Misc 7Journal 10Unranked 12

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	TDR-Based S-Parameter Estimation of Signal Path to DUT Utilizing Built-In Driver and Comparator of ATE. ATS Kazuki Shirahata, Masahiro Ishida, Koji Asami, Toru Nakura, Akio Higo, Tetsuya Iizuka
2021	—	`conf`	Application of Residue Sampling to RF/AMS Device Testing. ATS Shogo Katayama, Yudai Abe, Anna Kuwana, Koji Asami, Masahiro Ishida, Ryuya Ohta, Haruo Kobayashi
2019	A	`conf`	A Jitter Injection Module for Production Test of 52-Gbps PAM4 Signal Interfaces. ITC Kiyotaka Ichiyama, Takashi Kusaka, Masahiro Ishida
2018	A	`conf`	A Stressed Eye Testing Module for Production Test of 30-Gbps NRZ Signal Interfaces. ITC Kiyotaka Ichiyama, Takashi Kusaka, Masahiro Ishida
2018	J	`jnl`	Digitally-Controlled Compensation Current Injection to ATE Power Supply for Emulation of Customer Environment. J. Electron. Test. Naoki Terao, Toru Nakura, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada
2017	A	`conf`	A jitter separation and BER estimation method for asymmetric total jitter distributions. ITC Masahiro Ishida, Kiyotaka Ichiyama
2017	B	`conf`	Extension of power supply impedance emulation method on ATE for multiple power domain. ETS Naoki Terao, Toru Nakura, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada
2017	Misc	`conf`	Innovative practices session 10B innovative practices in Asia-2: From cost perspective. VTS Kazumi Hatayama, Masahiro Ishida
2017	Misc	`conf`	Innovative practices session 9B innovative practices in Asia-1: From quality perspective. VTS Kazumi Hatayama, Masahiro Ishida
2016	—	`conf`	A fully integrated GaN-based power IC including gate drivers for high-efficiency DC-DC Converters. VLSI Circuits Shinji Ujita, Yusuke Kinoshita, Hidekazu Umeda, Tatsuo Morita, Kazuhiro Kaibara, Satoshi Tamura, Masahiro Ishida, Tetsuzo Ueda
2016	J	`jnl`	An ATE System for Testing RF Digital Communication Devices With QAM Signal Interfaces. IEEE Des. Test Masahiro Ishida, Kiyotaka Ichiyama
2016	—	`conf`	An Optical Interconnection Test Method Applicable to 100-Gb/s Transceivers Using an ATE Based Hardware. ATS Kazuki Shirahata, Takeshi Mizushima, Tasuku Fujibe, Hidenobu Matsumura, Tomoyuki Itakura, Masahiro Ishida, Daisuke Watanabe, Shin Masuda
2016	J	`jnl`	Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing. J. Electron. Test. Masahiro Ishida, Toru Nakura, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada
2016	J	`jnl`	Power Supply Voltage Control for Eliminating Overkills and Underkills in Delay Fault Testing. IEICE Trans. Electron. Masahiro Ishida, Toru Nakura, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada
2016	A	`conf`	Power supply impedance emulation to eliminate overkills and underkills due to the impedance difference between ATE and customer board. ITC Toru Nakura, Naoki Terao, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada
2015	—	`conf`	A Technique for Analyzing On-Chip Power Supply Impedance. ATS Masahiro Ishida, Toru Nakura, Akira Matsukawa, Rimon Ikeno, Kunihiro Asada
2015	A	`conf`	A new method for measuring alias-free aperture jitter in an ADC output. ITC Takahiro J. Yamaguchi, Katsuhiko Degawa, Masayuki Kawabata, Masahiro Ishida, Koichiro Uekusa, Mani Soma
2015	A	`conf`	An ATE system for testing 2.4-GHz RF digital communication devices with QAM signal interfaces. ITC Masahiro Ishida, Kiyotaka Ichiyama
2015	J	`jnl`	Conducted noise of GaN Schottky barrier diode in a DC-DC converter. IEICE Electron. Express Takaaki Ibuchi, Tsuyoshi Funaki, Shinji Ujita, Masahiro Ishida, Tetsuzo Ueda
2014	—	`conf`	30.5 A GaN 3×3 matrix converter chipset with Drive-by-Microwave technologies. ISSCC Shuichi Nagai, Yasuhiro Yamada, Noboru Negoro, Hiroyuki Handa, Yuji Kudoh, Hiroaki Ueno, Masahiro Ishida, Nobuyuki Otuska, Daisuke Ueda
2014	—	`conf`	An ATE Based 32 Gbaud PAM-4 At-Speed Characterization and Testing Solution. ATS Jose Moreira, Hubert Werkmann, Masahiro Ishida, Bernhard Roth, Volker Filsinger, Sui-Xia Yang
2014	Misc	`conf`	Special session 8C: Hot topic: Designers' and test researchers' roles in analog design-for-test. VTS Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma, Terri S. Fiez, Mike Peng Li
2014	A	`conf`	Statistical silicon results of dynamic power integrity control of ATE for eliminating overkills and underkills. ITC Masahiro Ishida, Takashi Kusaka, Toru Nakura, Satoshi Komatsu, Kunihiro Asada
2013	A	`conf`	A functional test of 2-GHz/4-GHz RF digital communication device using digital tester. ITC Kiyotaka Ichiyama, Masahiro Ishida, Kenichi Nagatani, Toshifumi Watanabe
2012	—	`conf`	Marker based camera pose estimation for underwater robots. SII Masahiro Ishida, Kazuhiro Shimonomura
2012	—	`conf`	Post-Silicon Jitter Measurements. Asian Test Symposium Kiichi Niitsu, Takahiro J. Yamaguchi, Masahiro Ishida, Haruo Kobayashi
2012	A	`conf`	Power integrity control of ATE for emulating power supply fluctuations on customer environment. ITC Masahiro Ishida, Toru Nakura, Toshiyuki Kikkawa, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada
2012	J	`jnl`	Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost. IEEE Des. Test Comput. Masahiro Ishida, Kiyotaka Ichiyama, Tasuku Fujibe, Daisuke Watanabe, Masayuki Kawabata
2012	A	`conf`	Real-time testing method for 16 Gbps 4-PAM signal interface. ITC Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu
2011	A	`conf`	Real-time testing method for 16 Gbps 4-PAM signal interface. ITC Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu
2009	A	`conf`	A robust method for identifying a deterministic jitter model in a total jitter distribution. ITC Takahiro J. Yamaguchi, Kiyotaka Ichiyama, X. H. Hou, Masahiro Ishida
2008	A	`conf`	A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing. ITC Takahiro J. Yamaguchi, Masayuki Kawabata, Mani Soma, Masahiro Ishida, K. Sawami, Koichiro Uekusa
2008	—	`conf`	Total Jitter Measurement for Testing HSIO Integrated SoCs. ATS Takahiro J. Yamaguchi, Masahiro Ishida
2007	A	`conf`	An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time. ITC Takahiro J. Yamaguchi, H. X. Hou, Koji Takayama, Dave Armstrong, Masahiro Ishida, Mani Soma
2007	C	`conf`	An On-Chip Delta-Time-to-Voltage Converter for Real-Time Measurement of Clock Jitter. ISCAS Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma
2007	A	`conf`	Data jitter measurement using a delta-time-to-voltage converter method. ITC Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma
2007	—	`conf`	Mismatch-Tolerant Circuit for On-Chip Measurements of Data Jitter. CICC Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma
2006	A	`conf`	A Real-Time Delta-Time-to-Voltage Converter for Clock Jitter Measurement. ITC Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma
2006	A	`conf`	A Study of Per-Pin Timing Jitter Scope. ITC Takahiro J. Yamaguchi, Satoshi Iwamoto, Masahiro Ishida, Mani Soma
2005	A	`conf`	A wideband low-noise ATE-based method for measuring jitter in GHz signals. ITC Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma
2004	A	`conf`	A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems. ITC Takahiro J. Yamaguchi, Masahiro Ishida, Kiyotaka Ichiyama, Mani Soma, Christian Krawinkel, Katsuaki Ohsawa, Masao Sugai
2004	J	`jnl`	Skew measurements in clock distribution circuits using an analytic signal method. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Takahiro J. Yamaguchi, Mani Soma, Jim Nissen, David Halter, Rajesh Raina, Masahiro Ishida
2003	A	`conf`	Effects of Deterministic Jitter in a Cable on Jitter Tolerance Measurements. ITC Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Makoto Kurosawa, Hirobumi Musha
2003	J	`jnl`	Extraction of instantaneous and RMS sinusoidal jitter using an analytic signal method. IEEE Trans. Circuits Syst. II Express Briefs Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Toshifumi Watanabe, Tadahiro Ohmi
2003	J	`jnl`	Timing Jitter Measurement of Intrinsic Random Jitter and Sinusoidal Jitter Using Frequency Division. J. Electron. Test. Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Louis Malarsie, Hirobumi Musha
2002	J	`jnl`	A Method for Compressing Test Data Based on Burrows-Wheeler Transformation. IEEE Trans. Computers Takahiro J. Yamaguchi, Dong Sam Ha, Masahiro Ishida, Tadahiro Ohmi
2002	A	`conf`	A New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter. ITC Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Hirobumi Musha, Louis Malarsie
2002	—	`conf`	Effects of Amplitude Modulation in Jitter Tolerance Measurements of Communication Devices. Asian Test Symposium Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma, Hirobumi Musha
2002	Misc	`conf`	Timing Jitter Measurement of 10 Gbps Bit Clock Signals Using Frequency Division. VTS Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Louis Malarsie, Hirobumi Musha
2001	Misc	`conf`	A Method for Measuring the Cycle-to-Cycle Period Jitter of High-Frequency Clock Signals. VTS Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, David Halter, Rajesh Raina, Jim Nissen
2001	A	`conf`	Testing clock distribution circuits using an analytic signal method. ITC Takahiro J. Yamaguchi, Mani Soma, Jim Nissen, David Halter, Rajesh Raina, Masahiro Ishida
2000	Misc	`conf`	Extraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method. VTS Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Toshifumi Watanabe, Tadahiro Ohmi
2000	A	`conf`	Jitter measurements of a PowerPC ITC Takahiro J. Yamaguchi, Mani Soma, David Halter, Jim Nissen, Rajesh Raina, Masahiro Ishida, Toshifumi Watanabe
1998	Misc	`conf`	COMPACT: A Hybrid Method for Compressing Test Data. VTS Masahiro Ishida, Dong Sam Ha, Takahiro J. Yamaguchi
1997	A	`conf`	An Efficient Method for Compressing Test Data. ITC Takahiro J. Yamaguchi, Masahiro Ishida, Marco Tilgner, Dong Sam Ha
1991	A	`conf`	Programming for Parallel Pattern Generators. ITC M. Kanzaki, Masahiro Ishida