Masafumi Watari

14 papers A 1B 2Journal 4Unranked 7
YearRankTypeTitle / Venue / Authors
2015 — conf
UE-based network access timing control scheme for avoiding signaling spikes.
ICC
Daisuke Arai, Tomohiko Ogishi, Masafumi Watari, Shigehiro Ano, Masakatsu Nishigaki, Hiroshi Mineno
2012 — conf
Evaluating the Performance of Locator/ID Separation Based on LISP Map Cache Emulation.
SAINT
Masafumi Watari, Atsushi Tagami, Shigehiro Ano
2011 — conf
A Method for Real-Time Identification of Malformed BGP Messages.
SAINT
Masafumi Watari, Peng Jiang, Atsuo Tachibana, Shigehiro Ano
2011 B conf
Inferring the Origin of Routing Changes Based on Preferred Path Changes.
PAM
Masafumi Watari, Atsuo Tachibana, Shigehiro Ano
2009 B conf
OSPF-Based Fast Reroute for BGP Link Failures.
GLOBECOM
Masafumi Watari, Yuichiro Hei, Shigehiro Ano, Katsuyuki Yamazaki
2008 — conf
Improving the Sustainability of Autonomous Systems.
ICN
Masafumi Watari, Yuichiro Hei, Shigehiro Ano, Katsuyuki Yamazaki
2007 — conf
A Scalable and Efficient Client Emulation Method for IP Multicast Performance Evaluation.
AINA Workshops (1)
Masafumi Watari, Atsushi Tagami, Teruyuki Hasegawa, Shigehiro Ano
2007 J jnl
Network Mobility Route Optimization Problem Statement.
RFC
Chan-Wah Ng, Pascal Thubert, Masafumi Watari, Fan Zhao
2007 J jnl
Network Mobility Route Optimization Solution Space Analysis.
RFC
Chan-Wah Ng, Fan Zhao, Masafumi Watari, Pascal Thubert
2006 J jnl
Routing Optimization for Nested Mobile Networks.
IEICE Trans. Commun.
Masafumi Watari, Thierry Ernst, Ryuji Wakikawa, Jun Murai
2004 J jnl
A New Solution to Power Supply Voltage Drop Problems in Scan Testing.
IEICE Trans. Inf. Syst.
Takaki Yoshida, Masafumi Watari
2003 A conf
A New Approach for Low Power Scan Testing.
ITC
Takaki Yoshida, Masafumi Watari
2002 — conf
MD-SCAN Method for Low Power Scan Testing.
Asian Test Symposium
Takaki Yoshida, Masafumi Watari
1999 — conf
Practical Application of Automated Fault Diagnosis for Stuck-at, Bridging, and Measurement Condition Dependent Faults in Fully Scanned Sequential Circuits.
Asian Test Symposium
Reisuke Shimoda, Takaki Yoshida, Masafumi Watari, Yasuhiro Toyota, Kiyokazu Nishi, Akira Motohara