Maryline Bawedin

12 papers Journal 1Unranked 11
YearRankTypeTitle / Venue / Authors
2019 — conf
1T1C Ultra low power relative Thermal-Voltage sensor in 28nm UTBB FD-SOI CMOS technology for standard, spatial and quantum applications.
ICICDT
Philippe Galy, R. Lethiecq, Maryline Bawedin
2019 — conf
Compact MOS Structure & Design for Ion-Ioff Thermal control in 28nm UTBB FD-SOI CMOS technology.
ICICDT
R. Lethiecq, Maryline Bawedin, Philippe Galy
2018 — conf
Optimized in situ heating control on a new MOS device structure in 28nm UTBB FD-SOI CMOS technology.
ICICDT
Philippe Galy, R. Lethiecq, Maryline Bawedin
2018 — conf
Sharp switching, hysteresis-free characteristics of Z
ESSDERC
Kyunghwa Lee, Hassan El Dirani, Pascal Fonteneau, Maryline Bawedin, Shingo Sato, Sorin Cristoloveanu
2017 — conf
Carrier lifetime evaluation in FD-SOI layers.
ESSDERC
Kyung Hwa Lee, Maryline Bawedin, Hyungjin Park, Mukta Singh Parihar, Sorin Cristoloveanu
2016 — conf
FDSOI devices: Issues and innovative solutions.
ESSDERC
Sorin Cristoloveanu, Maryline Bawedin
2015 — conf
Back-gate effects and detailed characterization of junctionless transistor.
ESSDERC
Mukta Singh Parihar, Fanyu Liu, Carlos Navarro, Sylvain Barraud, Maryline Bawedin, Irina Ionica, Abhinav Kranti, Sorin Cristoloveanu
2014 — conf
CMOS VT characterization by capacitance measurements in FDSOI PIN gated diodes.
ESSDERC
Carlos Navarro, Maryline Bawedin, François Andrieu, Jacques Cluzel, Xavier Garros, Sorin Cristoloveanu
2014 — conf
Mobility spectrum analysis of magnetoresistance in fully-depleted MOSFETs.
ESSDERC
Gilberto Antonio Umana-Membreno, Sung-Jae Chang, Maryline Bawedin, Jaroslaw Antoszewski, Sorin Cristoloveanu, Lorenzo Faraone
2013 — conf
Magnetoresistance measurements and unusual mobilitiy behavior in FD MOSFETs.
ESSDERC
Sung-Jae Chang, Sorin Cristoloveanu, Maryline Bawedin, Jong-Hyun Lee, Jung-Hee Lee, Sutirtha Mukhopadhyay, Benjamin A. Piot
2013 J jnl
Remote carrier trapping in FinFETs with ONO buried layer: Temperature effects.
Microelectron. Reliab.
Sung-Jae Chang, Maryline Bawedin, Wade Xiong, Jong-Hyun Lee, Jung-Hee Lee, Sorin Cristoloveanu
2013 — conf
Why are SCE overestimated in FD-SOI MOSFETs?
ESSDERC
Carlos Navarro, Maryline Bawedin, François Andrieu, Bruno Sagnes, Sorin Cristoloveanu