Mary Yvonne Lanzerotti

13 papers Journal 9Unranked 4
YearRankTypeTitle / Venue / Authors
2024 J jnl
Multi-tier dynamic sampling weak RF signal estimation theory.
EURASIP J. Adv. Signal Process.
Brett Smith, Mary Yvonne Lanzerotti
2023 J jnl
Quantization error for weak RF simultaneous signal estimation.
EURASIP J. Adv. Signal Process.
Mary Yvonne Lanzerotti, Adaya Queen, Charles Cerny
2015 J jnl
Erratum.
IEEE Trans. Aerosp. Electron. Syst.
Mary Yvonne Lanzerotti, C. L. Cerny
2015 J jnl
Theoretical phase calculation approach for N simultaneous signals.
IEEE Trans. Aerosp. Electron. Syst.
Mary Yvonne Lanzerotti, C. L. Cerny, R. K. Martin
2015 J jnl
Ultraweak simultaneous signal detection with theoretical phase calculation approaches.
IEEE Trans. Aerosp. Electron. Syst.
Mary Yvonne Lanzerotti, C. L. Cerny
2014 J jnl
Topological constraints for E. F. Rent's work on microminiature packaging and circuitry.
IBM J. Res. Dev.
G. Vernizzi, Mary Yvonne Lanzerotti, J. Kujawski, Allan Weatherwax
2007 — conf
Design of the Power6 Microprocessor.
ISSCC
Joshua Friedrich, Bradley D. McCredie, Norman K. James, Bill Huott, Brian W. Curran, Eric Fluhr, Gaurav Mittal, Eddie Chan, Yuen H. Chan, Donald W. Plass, Sam G. Chu, Hung Q. Le, Leo Clark, John R. Ripley, Scott A. Taylor, Jack DiLullo, Mary Yvonne Lanzerotti
2007 — conf
Impact of interconnect length changes on effective materials properties (dielectric constant).
SLIP
Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand
2005 — conf
Characterization of the impact of interconnect design on the capacitive load driven by a global clock distribution.
ACM Great Lakes Symposium on VLSI
Gerald G. Lopez, Giovanni Fiorenza, Thomas J. Bucelot, Phillip J. Restle, Mary Yvonne Lanzerotti
2005 J jnl
Microminiature packaging and integrated circuitry: The work of E. F. Rent, with an application to on-chip interconnection requirements.
IBM J. Res. Dev.
Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand
2005 — conf
Predicting interconnect requirements in ultra-large-scale integrated control logic circuitry.
SLIP
Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand
2004 J jnl
Assessment of on-chip wire-length distribution models.
IEEE Trans. Very Large Scale Integr. Syst.
Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand
2004 J jnl
Interpretation of rent's rule for ultralarge-scale integrated circuit designs, with an application to wirelength distribution models.
IEEE Trans. Very Large Scale Integr. Syst.
Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand