| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2019 | A* | conf |
ICML
|
| 2019 | J | jnl |
CoRR
|
| 2018 | J | jnl |
Data Min. Knowl. Discov.
|
| 2018 | J | jnl |
Multifeature, Sparse-Based Approach for Defects Detection and Classification in Semiconductor Units.
IEEE Trans Autom. Sci. Eng.
|
| 2016 | A | conf |
CIKM
|
| 2016 | B | conf |
ICIP
|
| 2010 | — | conf |
CASE
|
| 2007 | — | conf |
CASE
|
| 2003 | J | jnl |
Annu. Rev. Control.
|
| 2003 | C | conf |
ACC
|
| 2003 | J | jnl |
Simul.
|