Martin Versen

12 papers A 1B 7C 1Journal 2Unranked 1
YearRankTypeTitle / Venue / Authors
2025 B conf
Identification of Microplastic Contamination in Food using FD-FLIM.
SAS
Nina Leiter, Sebastian Heitzmann, Martin Versen, Maximilian Wohlschläger, Martin G. J. Löder, Christian Laforsch
2023 B conf
Combining BLOB-Detection and MLP to Detect and Identify Plastics in an Environmental Matrix.
SAS
Maximilian Wohlschläger, Yamna Khan, Nina Leiter, Martin Versen, Martin G. J. Löder, Christian Laforsch
2023 B conf
Comparative Analysis of Fluorescence Properties of Post-Consumer Wood Using FD-FLIM.
SAS
Nina Leiter, Maximilian Wohlschläger, Maximilian Dietlmeier, Martin Versen, Martin G. J. Löder, Christian Laforsch
2023 B conf
Comparison of Two Classification Methods Trained with FD-FLIM Data to Identify and Distinguish Plastics from Environmental Materials.
IJCNN
Maximilian Wohlschläger, Nina Leiter, Maximilian Dietlmeier, Martin G. J. Löder, Martin Versen, Christian Laforsch
2023 B conf
Development of a Neural Network for Automatic Classification of Post-Consumer Wood Using Rapid-FLIM.
SAS
Nina Leiter, Maximilian Dietlmeier, Maximilian Wohlschläger, Martin G. J. Löder, Martin Versen, Christian Laforsch
2022 B conf
Development of a neural network to identify plastics using Fluorescence Lifetime Imaging Microscopy.
SAS
Georgekutty Jose Maniyattu, Eldho Geegy, Nina Leiter, Maximilian Wohlschläger, Martin Versen, Christian Laforsch
2019 B conf
A method for sorting of plastics with an apparatus specific quantum efficiency approach.
SAS
Maximilian Wohlschläger, Martin Versen, Heinz Langhals
2017 J jnl
A row hammer pattern analysis of DDR2 SDRAM.
Microelectron. Reliab.
Martin Versen, W. Ernst, Prince Gulati
2015 J jnl
Test setup for reliability studies of DDR2 SDRAM.
Microelectron. Reliab.
Martin Versen, W. Ernst, G. Singh, Prince Gulati
2014 C conf
Introduction to microcomputer technology with the MSP430 Launch Pad in remote labs.
EDUCON
Martin Versen, Stefan Kipfelsberger
2008 A conf
Test Instrumentation for a Laser Scanning Localization Technique for Analysis of High Speed DRAM devices.
DATE
Martin Versen, Achim Schramm, Jan Schnepp, Dorina Diaconescu
2006 — conf
Address Decoder Test and Verification by Generalization of Application Fail Sequences.
MBMV
Martin Versen, Achim Schramm, Daewon Lee, Ronny Schneider