Martin Keim - RankMe

68 papers A* 1A 19B 16C 1Misc 11Journal 7Unranked 12

Year	Rank	Type	Title / Venue / Authors
2025	B	`conf`	A Novel BIST Method for Multi-Port Register Files. ETS Andy Chen, Vianney Choserot, Munish Kumar, Khushal Gelda, Shreyas Pramod Dixit, Wei Zou, Jongsin Yun, Harshitha Kodali, Albert Au, Lori Schramm, Martin Keim
2025	B	`conf`	DFT Techniques For Efficient 3D IC Interconnect Test For Chiplet and Multi-Die Package. ETS Anshuman Chandra, Chi-Chun Yang, Quoc Phan, Martin Keim
2025	A	`conf`	Holistic Validation Pattern Generation for IEEE 1687 and Streaming Scan Networks. ITC Sebastian Huhn, Matthias Kampmann, Jan Burchard, Reinhard Meier, Kacper Czerniawski, Lori Schramm, Sandipan Sharma, Nikita Naresh, Wilson Pradeep, Prachi Sinha, Mayank Parasrampuria, Jonathan Gaudet, Martin Keim
2025	B	`conf`	MBIST-guided Reliability Improvement Scheme for SRAM-based Computation in Memory. ETS Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori
2025	—	`conf`	March-CIM: An MBIST-guided Modified March Test for SRAM-based Computation-in-Memory. ATS Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
2025	B	`conf`	Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance. ETS Vinayak Bharat Naik, Gregory Billus, Amit Kumar Shukla, Andre Vogel, Veit Kriegerstein, Patrick Scharf, Venkata Siva Komma, Johannes Mueller, Thomas Merbeth, Ralf Flemming, Ingolf Lorenz, Muthu Kumaran Nambi, Ee Ee Yeoh, Hemavathi Chaya, Siddharth Gupta, Yentsai Huang, Sushma Sambatur, Joerg Winkler, Tom Andre, Shane Hollmer, Steven Soss, Jongsin Yun, Wei Zou, Harshitha Kodali, Luc Romain, Albert Au, Lori Schramm, Martin Keim
2025	Misc	`conf`	Periodic Non-Destructive Memory BIST for Automotive Applications. VTS Wei Zou, Artur Pogiel, Albert Au, Martin Keim
2025	A	`conf`	Persistent High-Bandwidth IJTAG Data Delivery. ITC Jan Burchard, Matthias Kampmann, Ayush Patel, Marta Stepniewska, Przemyslaw Szymanski, Wojciech Janiszewski, Jean-François Côté, Michal Olejarz, Olga Przybysz, Lori Schramm, Jonathan Gaudet, Martin Keim
2025	B	`conf`	Testing Functional Interfaces And Complex PADs Within Multi-Die Packages With IEEE P3405. ETS Anshuman Chandra, Nir Sever, Martin Keim
2024	B	`conf`	Combining Built-In Redundancy Analysis with ECC for Memory Testing. ETS Luc Romain, Paul-Patrick Nordmann, Benoit Nadeau-Dostie, Lori Schramm, Martin Keim
2024	A	`conf`	Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies. ITC Jaehoon Lee, HyeonUk Son, Seohyun Kang, Dahyun Kang, Dongkwan Han, Jongsin Yun, Artur Pogiel, Etienne Racine, Krzysztof Jurga, Lori Schramm, Martin Keim
2024	A	`conf`	High-Bandwidth IJTAG over SSN. ITC Jonathan Gaudet, Jan Burchard, Matthias Kampmann, Jean-François Côté, Tim Callahan, Hung Ho Chai, Ivy Ee Hsia Lim, Lori Schramm, Olga Przybysz, Marta Stepniewska, Sascha Ochsenknecht, Michal Olejarz, Martin Keim
2024	Misc	`conf`	IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair. VTS Erik Jan Marinissen, Vineet Pancholi, Po-Yao Chuang, Martin Keim
2024	A	`conf`	MBIST-based MRAM defect screening for safety-critical applications. ITC Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
2024	B	`conf`	MBIST-based weak bit screening method for embedded MRAM. ETS Jongsin Yun, Sina Bakhtavari Mamaghani, Mehdi B. Tahoori, Christopher Münch, Martin Keim
2024	Misc	`conf`	Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM. VTS Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
2024	B	`conf`	New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405. ETS Erik Jan Marinissen, Adrian Evans, Po-Yao Chuang, Martin Keim, Anshuman Chandra
2024	A	`conf`	Physical-Aware Interconnect Test for Multi-Die Systems Using 3Dblox Open Standard. ITC Sandeep Kumar Goel, Ankita Patidar, Moiz Khan, Frank Lee, Anshuman Chandra, Martin Keim, Naim Lemar, Jonathan Gaudet, Quoc Phan, Vidya Neerkundar
2024	B	`conf`	What Would Interactive Testing With 1687 Look Like? ETS Michele Portolan, Martin Keim, J. F. Coté, Hans-Martin Von Staud
2023	Misc	`conf`	Refreshing the JTAG Family. VTS Michele Portolan, Martin Keim, Jeff Rearick, Heiko Ehrenberg
2023	A	`conf`	Smart Hammering: A practical method of pinhole detection in MRAM memories. DATE Sina Bakhtavari Mamaghani, Christopher Münch, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori
2023	A	`conf`	Transitioning eMRAM from Pilot Project to Volume Production. ITC Cyrille Dray, Khushal Gelda, Benoit Nadeau-Dostie, Wei Zou, Luc Romain, Jongsin Yun, Harshitha Kodali, Lori Schramm, Martin Keim
2022	J	`jnl`	Affordable and Comprehensive Testing of 3-D Stacked Die Devices. IEEE Des. Test Jean-François Côté, Jeff Fan, Sean Shen, Givargis Danialy, Marcin Lipinski, Michael Garbers, Wu Yang, Martin Keim, Andreas Glowatz, Joe Reynick, Ayush Patel, Joanna Michna
2022	A	`conf`	IEEE P1687.1: Extending the Network Boundaries for Test. ITC Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo
2022	Misc	`conf`	MBIST-based Trim-Search Test Time Reduction for STT-MRAM. VTS Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
2021	B	`conf`	Convolutional Compaction-Based MRAM Fault Diagnosis. ETS Bartosz Grzelak, Martin Keim, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
2021	B	`conf`	Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces. ETS Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim
2021	B	`conf`	MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM. ETS Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
2020	A	`conf`	Fast Bring-Up of an AI SoC through IEEE 1687 Integrating Embedded TAPs and IEEE 1500 Interfaces. ITC Haiying Ma, Ligang Lu, Haitao Qian, Jing Han, Xin Wen, Fanjin Meng, Rahul Singhal, Martin Keim, Yu Huang, Wu Yang
2020	A	`conf`	IJTAG Through a Two-Pin Chip Interface. ITC Manu Baby, Bernd Büttner, Piet Engelke, Ulrike Pfannkuchen, Reinhard Meier, Jonathan Gaudet, Jean-François Côté, Givargis Danialy, Martin Keim, Lori Schramm
2020	B	`conf`	Linking Chip, Board, and System Test via Standards. ETS Michele Portolan, Jeff Rearick, Martin Keim
2020	B	`conf`	MBIST Support for Reliable eMRAM Sensing. ETS Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Cyrille Dray, El Mehdi Boujamaa
2020	A	`conf`	MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. ITC Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda
2020	A	`conf`	Modeling Novel Non-JTAG IEEE 1687-Like Architectures. ITC Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick
2018	—	`conf`	Implementing Design-for-Test Within a Tile-Based Design Methodology - Challenges and Solutions. ITC-Asia Venkat Yellapragada, Suresh Raman, Banadappa Shivaray, Luc Romain, Benoit Nadeau-Dostie, Martin Keim, Jean-Francois Cote, Albert Au, Giri Podichetty, Ashok Anbalan
2018	Misc	`conf`	Innovative practices on memory test practice. VTS M. Casarsa, Gurgen Harutyunyan, Kaitlyn Chen, Ramesh Sharma, Giri Podichetty, Martin Keim, Sreejit Chakravarty, Ramesh C. Tekumalla
2017	—	`conf`	Adapting an industrial memory BIST solution for testing CAMs. ITC-Asia Jais Abraham, Uttam Garg, Glenn Colón-Bonet, Ramesh Sharma, Chennian Di, Benoit Nadeau-Dostie, Etienne Racine, Martin Keim
2017	J	`jnl`	Generalizing Access to Instrumentation Embedded in a Semiconductor Device. Computer Al Crouch, Michael Laisne, Martin Keim
2015	A	`conf`	A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor. ITC Tassanee Payakapan, Senwen Kan, Ken Pham, Kathy Yang, Jean-Francois Cote, Martin Keim, Jennifer Dworak
2014	J	`jnl`	Cell-Aware Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Friedrich Hapke, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, Marek Hustava, Martin Keim, Juergen Schloeffel, Anja Fast
2014	—	`conf`	Quo Vadis DFT? Aspekte der Technischen Informatik Martin Keim
2013	C	`conf`	Industrial Application of IEEE P1687 for an Automotive Product. DSD Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath
2013	J	`jnl`	Thinking About Adopting IEEE P1687? IEEE Des. Test Martin Keim
2012	B	`conf`	Re-using chip level DFT at board level. ETS Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson
2008	Misc	`conf`	Automatic Test Pattern Generation for Interconnect Open Defects. VTS Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng
2008	A	`conf`	Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. ITC Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann
2008	A	`conf`	Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. ITC Stefan Hillebrecht, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng
2007	B	`conf`	Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. ETS Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware
2007	—	`conf`	Scan Diagnosis and Its Successful Industrial Applications. ATS Wu Yang, Wu-Tung Cheng, Yu Huang, Martin Keim, Randy Klingenberg
2007	Misc	`conf`	Silicon Evaluation of Static Alternative Fault Models. VTS Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware
2006	A	`conf`	A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. ITC Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware
2004	A	`conf`	Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski
2003	J	`jnl`	Polynomial Formal Verification of Multipliers. Formal Methods Syst. Des. Martin Keim, Rolf Drechsler, Bernd Becker, Michael Martin, Paul Molitor
2003	—	`—`	Symbolic methods for testing digital circuits. Martin Keim
2002	—	`conf`	Sequential n -Detection Criteria: Keep It Simple. IOLTW Ilia Polian, Martin Keim, Nicolai Mallig, Bernd Becker
2001	J	`jnl`	Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits. J. Electron. Test. Martin Keim, Nicole Drechsler, Rolf Drechsler, Bernd Becker
2000	—	`conf`	A parameterizable fault simulator for bridging faults. ETW Piet Engelke, Bernd Becker, Martin Keim
1999	—	`conf`	A scalable BIST architecture for delay faults. ETW Martin Keim, Ilia Polian, Harry Hengster, Bernd Becker
1999	—	`conf`	Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits. ASP-DAC Martin Keim, Nicole Drechsler, Bernd Becker
1999	J	`jnl`	Hybrid Fault Simulation for Synchronous Sequential Circuits. J. Electron. Test. Bernd Becker, Martin Keim, Rolf Krieger
1998	—	`conf`	Test Generation for (Sequential) Multi-Valued Logic Networks based on Genetic Algorithm. ISMVL Martin Keim, Nicole Drechsler, Rolf Drechsler, Bernd Becker
1997	—	`conf`	Fault Simulation in Sequential Multi-Valued Logic Networks. ISMVL Rolf Drechsler, Martin Keim, Bernd Becker
1997	Misc	`conf`	On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms. VTS Can Ökmen, Martin Keim, Rolf Krieger, Bernd Becker
1997	Misc	`conf`	Polynomial Formal Verification of Multipliers. VTS Martin Keim, Michael Martin, Bernd Becker, Rolf Drechsler, Paul Molitor
1997	—	`conf`	Sympathy-MV: Fast Exact Minimization of Fixed Polarity Multi-Valued Linear Expressions. ISMVL Rolf Drechsler, Martin Keim, Bernd Becker
1996	Misc	`conf`	On the (non-)resetability of synchronous sequential circuits. VTS Martin Keim, Bernd Becker, Birgitta Stenner
1995	A*	`conf`	Symbolic Fault Simulation for Sequential Circuits and the Multiple Observation Time Test Strategy. DAC Rolf Krieger, Bernd Becker, Martin Keim
1994	A	`conf`	A Hybrid Fault Simulator for Synchronous Sequential Circuits. ITC Rolf Krieger, Bernd Becker, Martin Keim