Martin Huch

21 papers A 4B 4C 3Journal 4Unranked 5
YearRankTypeTitle / Venue / Authors
2025 J jnl
COSMO: COmpressed Sensing for Models and Logging Optimization in MCU Performance Screening.
IEEE Trans. Computers
Nicolò Bellarmino, Riccardo Cantoro, Sophie M. Fosson, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero
2025 J jnl
Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero
2025 — conf
Grouped Feature Selection for SMONs Placement in MCU Performance Screening.
LATS
Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Giovanni Squillero
2025 C conf
In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models.
DSD
Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Giovanni Squillero
2025 A conf
Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction.
ITC
Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Annachiara Ruospo
2024 — conf
Embedded Feature Selection in MCU Performance Screening.
DTTIS
Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero
2023 J jnl
A Multilabel Active Learning Framework for Microcontroller Performance Screening.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero
2023 — conf
An efficient High-Volume Production Performance Screening using On-Chip Ring Oscillators.
DFT
Tobias Kilian, Abhishek Sengupta, Daniel Tille, Martin Huch, Ulf Schlichtmann
2023 — conf
Enabling Inter-Product Transfer Learning on MCU Performance Screening.
ATS
Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero
2023 — conf
Feature Selection for Cost Reduction In MCU Performance Screening.
LATS
Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero
2023 J jnl
Performance Screening Using Functional Path Ring Oscillators.
IEEE Trans. Very Large Scale Integr. Syst.
Tobias Kilian, Daniel Tille, Martin Huch, Markus Hanel, Ulf Schlichtmann
2023 B conf
Semi-Supervised Deep Learning for Microcontroller Performance Screening.
ETS
Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero
2022 A conf
A Path Selection Flow for Functional Path Ring Oscillators using Physical Design Data.
ITC
Tobias Kilian, Markus Hanel, Daniel Tille, Martin Huch, Ulf Schlichtmann
2022 C conf
Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data.
IOLTS
Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero
2022 B conf
Reducing Routing Overhead by Self-Enabling Functional Path Ring Oscillators.
ETS
Tobias Kilian, Markus Hanel, Daniel Tille, Martin Huch, Ulf Schlichtmann
2022 B conf
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip.
ETS
Francesco Angione, Davide Appello, Joseph Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, Juan-David Guerrero-Balaguera, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli
2021 A conf
A Scalable Design Flow for Performance Monitors Using Functional Path Ring Oscillators.
ITC
Tobias Kilian, Heiko Ahrens, Daniel Tille, Martin Huch, Ulf Schlichtmann
2021 B conf
Exploiting Active Learning for Microcontroller Performance Prediction.
ETS
Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero
2020 A conf
Machine Learning based Performance Prediction of Microcontrollers using Speed Monitors.
ITC
Riccardo Cantoro, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero
2011 C conf
Variations of fault manifestation during Burn-In - A case study on industrial SRAM test results.
IOLTS
Michael Linder, Alfred Eder, Klaus Oberländer, Martin Huch
1991 — —
Höchstintegration von defekttoleranten Array-Prozessoren für die Echtzeitbildverarbeitung.
Martin Huch