| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
ICECS
|
| 2025 | C | conf |
ISCAS
|
| 2025 | — | conf |
NewCAS
|
| 2025 | Misc | conf |
CSR
|
| 2024 | — | conf |
NewCAS
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2022 | — | conf |
PRIME
|
| 2022 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2022 | — | conf |
PRIME
|
| 2021 | J | jnl |
J. Circuits Syst. Comput.
|
| 2021 | J | jnl |
Microprocess. Microsystems
|
| 2019 | J | jnl |
Integr.
|
| 2019 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2019 | — | conf |
IVSW
|
| 2019 | — | conf |
IVSW
|
| 2019 | J | jnl |
Circuits Syst. Signal Process.
|
| 2018 | — | conf |
IVSW
|
| 2018 | — | conf |
iSES
|
| 2018 | — | conf |
PATMOS
|
| 2018 | — | conf |
ATS
|
| 2018 | A | conf |
DATE
|
| 2018 | A | conf |
DATE
|
| 2018 | — | conf |
PATMOS
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2017 | C | conf |
ISCAS
|
| 2017 | — | conf |
SMACD
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | — | conf |
FDL (Selected Papers)
|
| 2017 | C | conf |
FDL
|
| 2017 | — | conf |
IVSW
|
| 2017 | — | conf |
IVSW
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2016 | J | jnl |
Circuits Syst. Signal Process.
|
| 2016 | — | conf |
ERMAVSS@DATE
|
| 2016 | J | jnl |
IET Comput. Digit. Tech.
|
| 2016 | B | conf |
IJCNN
|
| 2016 | J | jnl |
IEEE Access
|
| 2016 | — | conf |
ERMAVSS@DATE
|
| 2016 | C | conf |
IOLTS
|
| 2016 | — | conf |
MWSCAS
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | — | conf |
ERMAVSS@DATE
|
| 2016 | — | conf |
EWME
|
| 2016 | B | conf |
The influence of hysteresis voltage on single event transients in a 65nm CMOS high speed comparator.
ETS
|
| 2016 | — | conf |
PATMOS
|
| 2015 | — | conf |
VDAT
|
| 2015 | Misc | conf |
VLSID
|
| 2015 | C | conf |
FDL
|
| 2015 | J | jnl |
CoRR
|
| 2015 | J | jnl |
CoRR
|
| 2015 | J | jnl |
CoRR
|
| 2015 | — | conf |
VDAT
|
| 2015 | J | jnl |
IEEE Trans. Computers
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2015 | — | conf |
ISCIT
|
| 2015 | — | conf |
VDAT
|
| 2014 | C | conf |
ISCAS
|
| 2014 | A | conf |
DATE
|
| 2014 | C | conf |
VLSI-SoC
|
| 2014 | — | conf |
NOCS
|
| 2014 | Misc | conf |
VLSID
|
| 2014 | A | conf |
DATE
|
| 2014 | — | conf |
DFT
|
| 2014 | — | conf |
NORCHIP
|
| 2014 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2014 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2013 | — | conf |
VDAT
|
| 2013 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2013 | — | conf |
ISPD
|
| 2013 | J | jnl |
Comput. Electr. Eng.
|
| 2013 | — | ed. |
VDAT
|
| 2012 | — | conf |
UKSim
|
| 2012 | C | conf |
IOLTS
|
| 2011 | — | conf |
DELTA
|
| 2011 | C | conf |
SIN
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2011 | A | conf |
DATE
|
| 2011 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2011 | C | conf |
HPCC
|
| 2011 | — | conf |
AHS
|
| 2011 | B | conf |
ETS
|
| 2010 | — | conf |
Conf. Computing Frontiers
|
| 2010 | C | conf |
ISCAS
|
| 2010 | C | conf |
EUC
|
| 2010 | C | conf |
ISCAS
|
| 2010 | J | jnl |
IET Comput. Digit. Tech.
|
| 2009 | C | conf |
ISCAS
|
| 2009 | J | jnl |
Microelectron. Reliab.
|
| 2009 | A | conf |
DATE
|
| 2008 | — | conf |
BMAS
|
| 2008 | A | conf |
CHES
|
| 2008 | — | conf |
ICECS
|
| 2008 | J | jnl |
Des. Autom. Embed. Syst.
|
| 2008 | A* | conf |
DAC
|
| 2007 | — | conf |
AHS
|
| 2007 | Misc | conf |
Evaluation of Dynamic Voltage and Frequency Scaling as a Differential Power Analysis Countermeasure.
VLSI Design
|
| 2007 | — | conf |
ICECS
|
| 2007 | C | conf |
ISCAS
|
| 2007 | — | conf |
ICECS
|
| 2007 | J | jnl |
Microelectron. Reliab.
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | J | jnl |
Microelectron. Reliab.
|
| 2006 | B | conf |
ETS
|
| 2006 | J | jnl |
IEEE Trans. Computers
|
| 2006 | J | jnl |
CoRR
|
| 2005 | — | conf |
ISCAS (5)
|
| 2004 | — | conf |
ISCAS (5)
|
| 2004 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2004 | J | jnl |
J. Electron. Test.
|
| 2004 | Misc | conf |
VLSI Design
|
| 2003 | C | conf |
IOLTS
|
| 2003 | J | jnl |
IEEE Trans. Evol. Comput.
|
| 2003 | J | jnl |
Microelectron. Reliab.
|
| 2003 | — | conf |
ISCAS (3)
|
| 2003 | A | conf |
DATE
|
| 2002 | A | conf |
DATE
|
| 2002 | — | conf |
IOLTW
|
| 2002 | B | conf |
IEEE Congress on Evolutionary Computation
|
| 2001 | J | jnl |
Microelectron. Reliab.
|
| 2001 | J | jnl |
IEEE Trans. Pattern Anal. Mach. Intell.
|
| 2001 | — | conf |
ISCAS (5)
|
| 2001 | — | conf |
ISCAS (4)
|
| 2000 | C | conf |
IDEAL
|
| 2000 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1999 | A | conf |
DATE
|
| 1999 | — | conf |
CICC
|
| 1998 | — | conf |
ICECS
|
| 1997 | — | conf |
DFT
|
| 1996 | — | conf |
ED&TC
|
| 1992 | J | jnl |
Comput. Aided Des.
|
| 1992 | J | jnl |
Comput. Aided Des.
|
| 1991 | — | conf |
VLSI
|
| 1990 | J | jnl |
Comput. Aided Des.
|