Marise Bafleur

38 papers Journal 32Unranked 6
YearRankTypeTitle / Venue / Authors
2018 — conf
A power management system using reconfigurable storage scheme for batteryless wireless sensor nodes.
MOCAST
A. Siskos, F. El Mahboubi, V. Boitier, Theodore Laopoulos, Marise Bafleur
2018 — conf
Energy-harvesting powered variable storage topology for battery-free wireless sensors.
MOCAST
F. El Mahboubi, Marise Bafleur, V. Boitier, Jean-Marie Dilhac
2017 J jnl
New triggering-speed-characterization method for diode-triggered SCR using TLP.
Microelectron. Reliab.
Mouna Mahane, David Trémouilles, Marise Bafleur, Benjamin Thon, Marianne Diatta, Lionel Jaouen
2017 J jnl
Prediction of LIN communication robustness against EFT events using dedicated failure models.
Microelectron. Reliab.
Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur
2017 J jnl
Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis.
Microelectron. Reliab.
Nathalie Labat, François Marc, Hélène Frémont, Marise Bafleur
2017 J jnl
Single Piezoelectric Transducer as Strain Sensor and Energy Harvester Using Time-Multiplexing Operation.
IEEE Trans. Ind. Electron.
Zheng Jun Chew, Tingwen Ruan, Meiling Zhu, Marise Bafleur, Jean-Marie Dilhac
2016 — conf
A multifunctional device as both strain sensor and energy harvester for structural health monitoring.
IEEE SENSORS
Zheng Jun Chew, Tingwen Ruan, Meiling Zhu, Marise Bafleur, Jean-Marie Dilhac
2016 J jnl
Impact of non-linear capacitances on transient waveforms during system level ESD stress.
Microelectron. Reliab.
Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur
2015 J jnl
20 GHz on-chip measurement of ESD waveform for system level analysis.
Microelectron. Reliab.
Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran
2015 J jnl
Editorial.
Microelectron. Reliab.
Marise Bafleur, Philippe Perdu, François Marc, Hélène Frémont, Nicolas Nolhier
2015 J jnl
Optimization of a MOS-IGBT-SCR ESD protection component in smart power SOI technology.
Microelectron. Reliab.
Houssam Arbess, Marise Bafleur, David Trémouilles, Moustafa Zerarka
2014 J jnl
Reliability of ESD protection devices designed in a 3D technology.
Microelectron. Reliab.
Bertrand Courivaud, Nicolas Nolhier, Gilles Ferru, Marise Bafleur, Fabrice Caignet
2013 J jnl
Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation.
Microelectron. Reliab.
Nicolas Monnereau, Fabrice Caignet, David Trémouilles, Nicolas Nolhier, Marise Bafleur
2013 J jnl
On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress.
Microelectron. Reliab.
Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran
2013 — conf
Towards Energy Autonomy of Wireless Sensors in Aeronautics Applications: SMARTER Collaborative Project.
GreenCom/iThings/CPScom
Marise Bafleur, Jean-Marie Dilhac
2012 — conf
Energy Harvesting for Powering Wireless Sensor Networks On-Board Geostationary Broadcasting Satellites.
GreenCom
Alexandru Takacs, Hervé Aubert, Marise Bafleur, Jean-Marie Dilhac, F. Courtade, S. Fredon, L. Despoisse, C. Vanhecke, G. Cluzet
2011 J jnl
Comparative study of sensitive volume and triggering criteria of SEB in 600 V planar and trench IGBTs.
Microelectron. Reliab.
Moustafa Zerarka, Patrick Austin, Marise Bafleur
2011 J jnl
MOS-IGBT power devices for high-temperature operation in smart power SOI technology.
Microelectron. Reliab.
Houssam Arbess, Marise Bafleur
2010 J jnl
Evaluation of the ESD performance of local protections based on SCR or bi-SCR with dynamic or static trigger circuit in 32 nm.
Microelectron. Reliab.
J. Bourgeat, Christophe Entringer, Philippe Galy, Marise Bafleur, D. Marin-Cudraz
2009 J jnl
Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD).
Microelectron. Reliab.
Marianne Diatta, Emilien Bouyssou, David Trémouilles, P. Martinez, F. Roqueta, O. Ory, Marise Bafleur
2008 J jnl
ESD failure signature in capacitive RF MEMS switches.
Microelectron. Reliab.
Jinyu Jason Ruan, George J. Papaioannou, Nicolas Nolhier, Nicolas Mauran, Marise Bafleur, Fabio Coccetti, Robert Plana
2007 J jnl
Electrostatic discharge failure analysis of capacitive RF MEMS switches.
Microelectron. Reliab.
Jinyu Jason Ruan, Nicolas Nolhier, Marise Bafleur, Laurent Bary, Fabio Coccetti, T. Lisec, Robert Plana
2007 J jnl
Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements.
Microelectron. Reliab.
Yuan Gao, Nicolas Guitard, Christophe Salamero, Marise Bafleur, Laurent Bary, Laurent Escotte, Patrick Gueulle, Lionel Lescouzères
2007 J jnl
Long-term reliability of silicon bipolar transistors subjected to low constraints.
Microelectron. Reliab.
A. Crosson, Laurent Escotte, Marise Bafleur, D. Talbourdet, L. Crétinon, Philippe Perdu, Guy Perez
2006 J jnl
Application of various optical techniques for ESD defect localization.
Microelectron. Reliab.
Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis
2006 J jnl
Potentialities of substrate-thinning technique to control minority carrier injection in smart power IC's.
Microelectron. J.
C. Lochot, Jean-Philippe Lainé, Marise Bafleur, A. Cazarré, J. Tasselli
2005 J jnl
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.
Microelectron. Reliab.
Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis
2004 J jnl
Latch-up ring design guidelines to improve electrostatic discharge (ESD) protection scheme efficiency.
IEEE J. Solid State Circuits
David Trémouilles, Marise Bafleur, Géraldine Bertrand, Nicolas Nolhier, Nicolas Mauran, Lionel Lescouzères
2004 J jnl
Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications.
Microelectron. Reliab.
Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas
2004 J jnl
Study of the ESD defects impact on ICs reliability.
Microelectron. Reliab.
Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis
2003 J jnl
Determination of the ESD Failure Cause Through its Signature.
Microelectron. Reliab.
M. Zecri, P. Besse, Philippe Givelin, M. Nayrolles, Marise Bafleur, Nicolas Nolhier
2003 J jnl
TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology.
Microelectron. Reliab.
David Trémouilles, Géraldine Bertrand, Marise Bafleur, Felix Beaudoin, Philippe Perdu, Nicolas Guitard, Lionel Lescouzères
2003 J jnl
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.
Microelectron. Reliab.
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles
2002 J jnl
In the memory of Georges Charitat.
Microelectron. Reliab.
Marise Bafleur
2001 J jnl
Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology.
IEEE J. Solid State Circuits
Géraldine Bertrand, Christelle Delage, Marise Bafleur, Nicolas Nolhier, Jean-Marie Dorkel, Quang Nguyen, Nicolas Mauran, David Trémouilles, Philippe Perdu
2001 J jnl
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation.
Microelectron. Reliab.
Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis
1999 J jnl
The mirrored lateral SCR (MILSCR) as an ESD protection structure: design and optimization using 2-D device simulation.
IEEE J. Solid State Circuits
Christelle Delage, Nicolas Nolhier, Marise Bafleur, Jean-Marie Dorkel, Jo Hamid, Philippe Givelin, Jacques Lin-Kwang
1996 — conf
A current conveyor based BIC sensor for current monitoring in mixed-signal circuits.
ICECS
Stelios Siskos, Theodore Laopoulos, Alkiviades A. Hatzopoulos, Marise Bafleur