Mariane Comte

49 papers A 3B 5C 2Misc 2Journal 19Unranked 18
YearRankTypeTitle / Venue / Authors
2025 J jnl
Cost-Effective Analytical Models of Resistive Opens Defects in FinFET Technology.
IEEE Trans. Very Large Scale Integr. Syst.
Gustavo Aguirre, Freddy Forero, Víctor H. Champac, Michel Renovell, Florence Azaïs, Mariane Comte, Jean-Marc Gallière
2023 J jnl
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits.
J. Electron. Test.
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
2021 J jnl
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit.
J. Electron. Test.
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
2021 — conf
Exploring on-line RF performance monitoring based on the indirect test strategy.
LATS
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, François Lefèvre
2020 C conf
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs.
IOLTS
Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel
2020 — conf
Implementing indirect test of RF circuits without compromising test quality: a practical case study.
LATS
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, Francois Lefevre, I. Gorenflot
2020 J jnl
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits.
J. Electron. Test.
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
2019 J jnl
Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies.
J. Electron. Test.
Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell
2019 — conf
Use of ensemble methods for indirect test of RF circuits: can it bring benefits?
LATS
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
2019 — conf
Which metrics to use for RF indirect test strategy?
SMACD
Hassan El Badawi, Mariane Comte, Florence Azaïs, Vincent Kerzèrho, Serge Bernard, François Lefevre
2018 — conf
Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies.
LATS
Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell
2017 — conf
Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology.
ISVLSI
Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell, Keshav Singh
2017 B conf
Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions.
ETS
Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell, Keshav Singh
2017 J jnl
Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies.
J. Electron. Test.
Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell
2016 — conf
Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect.
LATS
Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell
2016 J jnl
Guest Editorial Special Issue on Nanoelectronic Circuit and System Design Methods for the Mobile Computing Era.
ACM J. Emerg. Technol. Comput. Syst.
Aida Todri-Sanial, Saraju P. Mohanty, Mariane Comte, Marc Belleville
2016 — conf
Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI - LVT and RVT Configurations.
ISVLSI
Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell
2015 — conf
A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy.
ISVLSI
Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
2015 J jnl
Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies.
Microelectron. J.
Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
2015 — conf
Toward Adaptation of ADCs to Operating Conditions through On-chip Correction.
ISVLSI
Vincent Kerzerho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, Serge Bernard
2014 J jnl
Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements.
Microelectron. J.
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
2014 — conf
Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing.
LATW
Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzerho, Mariane Comte, Michel Renovell
2014 A conf
New implementions of predictive alternate analog/RF test with augmented model redundancy.
DATE
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell
2014 C conf
Solutions for the self-adaptation of communicating systems in operation.
IOLTS
Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos
2014 J jnl
Testing for gate oxide short defects using the detectability interval paradigm.
it Inf. Technol.
Jean-Marc Gallière, Florence Azaïs, Mariane Comte, Michel Renovell
2013 J jnl
A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC.
Microelectron. J.
Vincent Kerzerho, Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, Chuan Shan, G. Bontorin, Michel Renovell
2013 — conf
Accurate and efficient analytical electrical model of antenna for NFC applications.
NEWCAS
Mouhamadou Dieng, Mariane Comte, Serge Bernard, Vincent Kerzerho, Florence Azaïs, Michel Renovell, Thibault Kervaon, Paul-Henri Pugliesi-Conti
2013 B conf
Implementing model redundancy in predictive alternate test to improve test confidence.
ETS
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell
2013 — conf
MIRID: Mixed-Mode IR-Drop Induced Delay Simulator.
Asian Test Symposium
Jie Jiang, Marina Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, Ilia Polian
2013 — conf
Pre-characterization procedure for a mixed mode simulation of IR-drop induced delays.
LATW
Marina Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, Jie Jiang, Ilia Polian, Bernd Becker
2012 A conf
Making predictive analog/RF alternate test strategy independent of training set size.
ITC
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell
2012 Misc conf
Smart selection of indirect parameters for DC-based alternate RF IC testing.
VTS
Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, Vincent Kerzerho, Olivier Potin, Christophe Kelma
2011 J jnl
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics.
J. Electron. Test.
Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell
2009 — conf
A multi-converter DFT technique for complex SIP: Concepts and validation.
ECCTD
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
2009 Misc conf
An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects.
VTS
Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker
2008 B conf
A Simulator of Small-Delay Faults Caused by Resistive-Open Defects.
ETS
Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker
2008 J jnl
ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator.
VLSI Design
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib
2007 B conf
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC.
ETS
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
2007 J jnl
Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC.
IET Comput. Digit. Tech.
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
2006 B conf
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC.
ETS
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
2006 J jnl
A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs.
IEEE Des. Test Comput.
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
2006 — conf
A Specific ATPG technique for Resistive Open with Sequence Recursive Dependency.
ATS
Michel Renovell, Mariane Comte, Ilia Polian, Piet Engelke, Bernd Becker
2006 — conf
Electrical Behavior of GOS Fault affected Domino Logic Cell.
DELTA
Mariane Comte, Satoshi Ohtake, Hideo Fujiwara, Michel Renovell
2005 J jnl
Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications.
J. Electron. Test.
Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell
2004 J jnl
Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure.
J. Electron. Test.
Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell
2004 J jnl
Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors.
J. Electron. Test.
Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell
2003 A conf
A New Methodology For ADC Test Flow Optimization.
ITC
Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell
2003 J jnl
A-to-D converters static error detection from dynamic parameter measurement.
Microelectron. J.
Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell
2002 — conf
Estimating Static Parameters of A-to-D Converters from Spectral Analysis.
LATW
Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell, Marcelo Lubaszewski