Marcelo Soares Lubaszewski

11 papers Journal 2Unranked 9
YearRankTypeTitle / Venue / Authors
2026 — conf
Evaluating an Analog Test Pattern Generation Tool by Means of Hardware-Emulated Fault Injection.
LATS
Luis A. Duarte, Lucas B. Zilch, Állan G. Ferreira, Marcelo Soares Lubaszewski, Tiago R. Balen
2025 J jnl
Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning.
IEEE Des. Test
Állan G. Ferreira, Lucas B. Zilch, Marcelo Soares Lubaszewski, Tiago R. Balen
2023 — conf
Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits.
SBCCI
Állan G. Ferreira, Lucas B. Zilch, Vinícius Navarro, Marcelo Soares Lubaszewski, Tiago R. Balen
2022 — conf
Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool.
LATS
Lucas B. Zilch, Állan G. Ferreira, Marcelo Soares Lubaszewski, Tiago R. Balen
2015 J jnl
Exploring design diversity redundancy to improve resilience in mixed-signal systems.
Microelectron. Reliab.
Cristiano P. Chenet, Lucas A. Tambara, Gabriel de M. Borges, Fernanda Lima Kastensmidt, Marcelo Soares Lubaszewski, Tiago R. Balen
2014 — conf
A 2-Transistor Sub-1V Low Power Temperature Compensated CMOS Voltage Reference.
SBCCI
Alfredo Olmos, Juan Pablo Martinez Brito, Fabrício Jorge Antunes Ferreira, Fernando Chávez, Marcelo Soares Lubaszewski
2013 — conf
Evaluating the scalability of test buses.
ISSoC
Alexandre M. Amory, Matheus T. Moreira, Ney Laert Vilar Calazans, Fernando Gehm Moraes, Cristiano Lazzari, Marcelo Soares Lubaszewski
2012 — conf
Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers.
LATW
Guilherme Schwanke Cardoso, Tiago R. Balen, Marcelo Soares Lubaszewski, Rafael Galhardo Vaz, Odair Lelis Goncalez
2011 — conf
Investigating the effects of transient faults in Programmable Capacitor Arrays.
LATW
Tiago R. Balen, Guilherme Schwanke Cardoso, Odair Lelis Gonçalez, Marcelo Soares Lubaszewski
2000 — conf
Fault Models and Compact Test Vectors for MOS OpAmp circuits.
SBCCI
José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski, Antonio Carneiro de Mesquita Filho
2000 — conf
Mixed-Signal Test Bus IEEE 1149.4 Compatible BIST Scheme for Classical 2nd Order Filter Approximations using the Transient Response Analysis Method.
LATW
José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski