| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2017 | — | conf |
SIBGRAPI
|
| 2014 | — | conf |
SBCCI
|
| 2014 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2012 | — | conf |
SBESC
|
| 2007 | B | conf |
ETS
|
| 2007 | B | conf |
ETS
|
| 2007 | J | jnl |
CoRR
|
| 2007 | Misc | conf |
VTS
|
| 2007 | J | jnl |
J. Electron. Test.
|
| 2006 | A | conf |
DATE
|
| 2005 | J | jnl |
J. Electron. Test.
|
| 2005 | J | jnl |
J. Electron. Test.
|
| 2005 | A | conf |
DATE
|
| 2004 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2004 | A | conf |
DATE
|
| 2004 | C | conf |
IOLTS
|
| 2004 | B | conf |
ETS
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | J | jnl |
IEEE Des. Test Comput.
|
| 2003 | — | conf |
SBCCI
|
| 2003 | J | jnl |
Microelectron. J.
|
| 2003 | A* | conf |
DAC
|
| 2003 | Misc | conf |
VTS
|
| 2002 | — | conf |
SBCCI
|
| 2002 | — | conf |
SBCCI
|
| 2002 | — | conf |
IOLTW
|
| 2002 | — | conf |
SBCCI
|
| 2002 | — | conf |
LATW
|
| 2000 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2000 | A | conf |
DATE
|
| 1998 | A* | conf |
DAC
|