Marcelo Lubaszewski

130 papers A 15B 2C 10Misc 12Journal 31Unranked 58

Year	Rank	Type	Title / Venue / Authors
2020	—	`conf`	A Highly Reliable Wearable Device for Fall Detection. LATS João Carlos Britto Filho, Marcelo Lubaszewski
2019	—	`ed.`	Proceedings of the 32nd Symposium on Integrated Circuits and Systems Design, SBCCI 2019, Sao Paulo, Brazil, August 26-30, 2019. SBCCI João Antonio Martino, Marcelo Lubaszewski, Matteo Sonza Reorda
2016	—	`conf`	Successful prototyping of complex integrated circuits with focused ion beam. SBCCI E. Petitprez, Dalton M. Colombo, Felipe M. Henes, Laurent Courcelle, R. Tararam, S. Jacobsen, R. Soares, C. Krug, Marcelo Lubaszewski
2015	C	`conf`	A low-power RFID enabled temperature sensor for cold chain management. ISCAS Francisco O. O. Gomes, Luciano de Paula, Joao C. S. Santos, Laurent Courcelle, Daniel Piovani, Filipe Viera, Felipe M. Henes, Marcelo Lubaszewski
2015	—	`conf`	Low power, high-sensitivity clock recovery circuit for LF/HF RFID applications. SBCCI Rafael Cantalice, Alexandre Simionovski, Fernando Paixão Cortes, Marcelo Lubaszewski
2014	—	`conf`	A low-power RF/analog front-end architecture for LF passive RFID tags with dynamic power sensing. IEEE RFID Fernando Paixão Cortes, Juan Pablo Martinez Brito, Rafael Cantalice, Everton Ghignatti, Alfredo Olmos, Fernando Chávez, Marcelo Lubaszewski
2014	—	`conf`	A power management system architecture for LF passive RFID tags. LASCAS Fernando da Rocha Paixão Cortes, Juan Pablo Martinez Brito, Everton Ghignatti, Alfredo Olmos, Fernando Chávez, Marcelo Lubaszewski
2013	—	`conf`	Determining the test sources/sinks for NoC TAMs. ISVLSI Alexandre M. Amory, Edson I. Moreno, Fernando Moraes, Marcelo Lubaszewski
2013	—	`conf`	Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC. ISVLSI Lucas A. Tambara, Fernanda Lima Kastensmidt, Paolo Rech, Tiago R. Balen, Marcelo Lubaszewski
2012	—	`conf`	Low pin count DfT technique for RFID ICs. DFT Marcelo de Souza Moraes, Marcos Barcellos Hervé, Marcelo Lubaszewski
2011	J	`jnl`	A new test scheduling algorithm based on Networks-on-Chip as Test Access Mechanisms. J. Parallel Distributed Comput. Alexandre M. Amory, Cristiano Lazzari, Marcelo Lubaszewski, Fernando Gehm Moraes
2011	J	`jnl`	Contributions to the evaluation of ensembles of combinational logic gates. Microelectron. J. Renato P. Ribas, Simone Bavaresco, N. Schuch, Vinicius Callegaro, Marcelo Lubaszewski, André Inácio Reis
2011	—	`conf`	Early estimation of wire length for dedicated test access mechanisms in networks-on-chip based SoCs. SBCCI Alexandre M. Amory, Cristiano Lazzari, Marcelo Lubaszewski, Fernando Gehm Moraes
2011	A	`conf`	Evaluating energy consumption of homogeneous MPSoCs using spare tiles. DATE Alexandre M. Amory, Luciano Ost, César A. M. Marcon, Fernando Gehm Moraes, Marcelo Lubaszewski
2011	J	`jnl`	Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps. J. Electron. Test. Luiz Fernando Gonçalves, Jefferson Luiz Bosa, Tiago Roberto Balen, Marcelo Lubaszewski, Eduardo Luis Schneider, Renato V. B. Henriques
2011	J	`jnl`	Functional Test of Mesh-Based NoCs with Deterministic Routing: Integrating the Test of Interconnects and Routers. J. Electron. Test. Marcos Barcellos Hervé, Marcelo de Souza Moraes, Pedro Almeida, Marcelo Lubaszewski, Fernanda Lima Kastensmidt, Érika F. Cota
2011	J	`jnl`	Improving the yield of NoC-based systems through fault diagnosis and adaptive routing. J. Parallel Distributed Comput. Caroline Concatto, João Almeida, Guilherme Fachini, Marcos Hervé, Fernanda Lima Kastensmidt, Érika F. Cota, Marcelo Lubaszewski
2011	C	`conf`	Task mapping on NoC-based MPSoCs with faulty tiles: Evaluating the energy consumption and the application execution time. International Symposium on Rapid System Prototyping Alexandre M. Amory, César A. M. Marcon, Fernando Gehm Moraes, Marcelo Lubaszewski
2010	C	`conf`	A broad strategy to detect crosstalk faults in network-on-chip interconnects. VLSI-SoC Mariza Botelho, Fernanda Lima Kastensmidt, Marcelo Lubaszewski, Érika F. Cota, Luigi Carro
2010	—	`conf`	Concurrent test of Network-on-Chip interconnects and routers. LATW Marcos Hervé, Pedro Almeida, Fernanda Lima Kastensmidt, Érika F. Cota, Marcelo Lubaszewski
2010	—	`conf`	Diversity TMR: Proof of concept in a mixed-signal case. LATW Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski
2010	C	`conf`	Efficiently using data splitting and retransmission to tolerate faults in networks-on-chip interconnects. ISCAS Matheus Braga, Érika F. Cota, Fernanda Lima Kastensmidt, Marcelo Lubaszewski
2010	—	`conf`	Evaluating the effectiveness of a mixed-signal TMR scheme based on design diversity. SBCCI Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski
2010	—	`conf`	Fault prediction in electrical valves using temporal Kohonen maps. LATW Luiz Fernando Gonçalves, Eduardo Luis Schneider, Renato Ventura Bayan Henriques, Marcelo Lubaszewski, Jefferson Luiz Bosa, Paulo Martins Engel
2010	B	`conf`	Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy. ETS Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski
2010	C	`conf`	Radiation effects on programmable analog devices and mitigation techniques. IOLTS Tiago R. Balen, Marcelo Lubaszewski
2010	Misc	`conf`	Special session 12B: Embedded tutorial test and fault tolerance of networks-on-chip. VTS Marcelo Lubaszewski, Érika F. Cota
2009	—	`conf`	Can Functional Test Achieve Low-cost Full Coverage of NoC Faults? DFT Marcelo Lubaszewski
2009	—	`conf`	Design of an embedded system for the proactive maintenance of electrical valves. SBCCI Luiz Fernando Gonçalves, Jefferson Luiz Bosa, Renato V. B. Henriques, Marcelo Lubaszewski
2009	—	`conf`	Diagnosis of interconnect shorts in mesh NoCs. NOCS Marcos Hervé, Érika F. Cota, Fernanda Lima Kastensmidt, Marcelo Lubaszewski
2009	C	`conf`	Efficient Test Circuit to Qualify Logic Cells. ISCAS Renato P. Ribas, Simone Bavaresco, Marcelo Lubaszewski, André Inácio Reis
2009	J	`jnl`	Guest editorial. Microelectron. J. Marcelo Lubaszewski, Andrew Richardson, C. C. Su
2009	C	`conf`	Improving yield of torus nocs through fault-diagnosis-and-repair of interconnect faults. IOLTS Caroline Concatto, Pedro Almeida, Fernanda Lima Kastensmidt, Érika F. Cota, Marcelo Lubaszewski, Marcos Hervé
2009	—	`conf`	NoC interconnection functional testing: Using boundary-scan to reduce the overall testing time. LATW Marcos Barcellos Hervé, Érika F. Cota, Fernanda Lima Kastensmidt, Marcelo Lubaszewski
2009	—	`conf`	Resource-and-time-aware test strategy for configurable quaternary logic blocks. SBCCI Érika F. Cota, Luigi Carro, Felipe Pinto, Ricardo Augusto da Luz Reis, Marcelo Lubaszewski
2009	—	`conf`	Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors. LATW Franco Leite, Tiago R. Balen, Marcos Hervé, Marcelo Lubaszewski, Gilson I. Wirth
2008	J	`jnl`	A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip. IEEE Trans. Computers Érika F. Cota, Fernanda Gusmão de Lima Kastensmidt, Maico Cassel, Marcos Hervé, Pedro Almeida, Paulo Meirelles, Alexandre M. Amory, Marcelo Lubaszewski
2008	C	`conf`	A fault-tolerant, DFA-resistant AES core. ISCAS Carlos Roberto Moratelli, Felipe Ghellar, Érika F. Cota, Marcelo Lubaszewski
2008	—	`conf`	A novel AES cryptographic core highly resistant to differential power analysis attacks. SBCCI Felipe Ghellar, Marcelo Lubaszewski
2008	—	`ed.`	Proceedings of the 21st Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2008, Gramado, Brazil, September 1-4, 2008 SBCCI Marcelo Lubaszewski, Michel Renovell, Rajesh K. Gupta
2008	J	`jnl`	Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop. VLSI Design Bozena Kaminska, Marcelo Lubaszewski, José Machado da Silva
2007	J	`jnl`	Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. J. Electron. Test. Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell
2007	Misc	`conf`	DfT for the Reuse of Networks-on-Chip as Test Access Mechanism. VTS Alexandre M. Amory, Frederico Ferlini, Marcelo Lubaszewski, Fernando Moraes
2007	J	`jnl`	Guest Editorial. J. Electron. Test. Marcelo Lubaszewski, Andrew Richardson, C. C. Su
2007	A	`conf`	Redefining and testing interconnect faults in Mesh NoCs. ITC Érika F. Cota, Fernanda Lima Kastensmidt, Maico Cassel, Paulo Meirelles, Alexandre M. Amory, Marcelo Lubaszewski
2007	—	`conf`	Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation. ISVLSI Tiago R. Balen, Fernanda Lima Kastensmidt, Marcelo Lubaszewski, Michel Renovell
2007	J	`jnl`	Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture CoRR Alexandre M. Amory, Marcelo Lubaszewski, Fernando Gehm Moraes, Edson I. Moreno
2007	J	`jnl`	Wrapper design for the reuse of a bus, network-on-chip, or other functional interconnect as test access mechanism. IET Comput. Digit. Tech. Alexandre M. Amory, Kees Goossens, Erik Jan Marinissen, Marcelo Lubaszewski, Fernando Moraes
2006	—	`conf`	A cryptography core tolerant to DFA fault attacks. SBCCI Carlos Roberto Moratelli, Érika F. Cota, Marcelo Lubaszewski
2006	Misc	`conf`	Functional Test of Field Programmable Analog Arrays. VTS Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell
2006	C	`conf`	Improving ATPG Gate-Level Fault Coverage by using Test Vectors generated from Behavioral HDL Descriptions. VLSI-SoC Margrit R. Krug, Marcelo Lubaszewski, Marcelo de Souza Moraes
2006	—	`conf`	Using a software testing technique to identify registers for partial scan implementation. SBCCI Margrit R. Krug, Marcelo de Souza Moraes, Marcelo Lubaszewski
2006	B	`conf`	Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism. ETS Alexandre M. Amory, Kees Goossens, Erik Jan Marinissen, Marcelo Lubaszewski, Fernando Moraes
2005	J	`jnl`	A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters. J. Electron. Test. Florence Azaïs, Marcelo Lubaszewski, Pascal Nouet, Michel Renovell
2005	—	`conf`	A constraint-based solution for on-line testing of processors embedded in real-time applications. SBCCI Marcelo de Souza Moraes, Érika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski
2005	A	`conf`	A scalable test strategy for network-on-chip routers. ITC Alexandre M. Amory, Eduardo Wenzel Brião, Érika F. Cota, Marcelo Lubaszewski, Fernando Gehm Moraes
2005	J	`jnl`	Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. J. Electron. Test. Tiago R. Balen, Antonio Q. Andrade, Florence Azaïs, Marcelo Lubaszewski, Michel Renovell
2005	J	`jnl`	Built-in self-test of global interconnects of field programmable analog arrays. Microelectron. J. Antonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell
2005	A	`conf`	Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture. DATE Alexandre M. Amory, Marcelo Lubaszewski, Fernando Gehm Moraes, Edson I. Moreno
2005	Misc	`conf`	Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. VTS Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell
2004	J	`jnl`	A New FPGA for DSP Applications Integrating BIST Capabilities. J. Electron. Test. Alex Gonsales, Marcelo Lubaszewski, Luigi Carro, Michel Renovell
2004	Misc	`conf`	An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. VTS Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell
2004	—	`conf`	Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST. SBCCI Antonio Andrade Jr., Érika F. Cota, Marcelo Lubaszewski
2004	—	`conf`	Reducing test time with processor reuse in network-on-chip based systems. SBCCI Alexandre M. Amory, Érika F. Cota, Marcelo Lubaszewski, Fernando Gehm Moraes
2004	J	`jnl`	Reusing an on-chip network for the test of core-based systems. ACM Trans. Design Autom. Electr. Syst. Érika F. Cota, Luigi Carro, Marcelo Lubaszewski
2004	J	`jnl`	Searching for Global Test Costs Optimization in Core-Based Systems. J. Electron. Test. Érika F. Cota, Luigi Carro, Marcelo Lubaszewski, Alex Orailoglu
2004	—	`conf`	Test and Design-for-Test of Mixed-Signal Integrated Circuits. IFIP Congress Tutorials Marcelo Lubaszewski, José Luis Huertas
2004	A	`conf`	Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. ITC Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski
2003	—	`conf`	Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors. IWSOC José Vicente Calvano, Marcelo Lubaszewski
2003	A	`conf`	Power-aware NoC Reuse on the Testing of Core-based Systems. ITC Érika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski
2003	—	`conf`	SIFU! - A Didactic Stuck-at Fault Simulator. MSE Vinícius P. Correia, Marcelo Lubaszewski, André Inácio Reis
2003	Misc	`conf`	The Impact of NoC Reuse on the Testing of Core-based Systems. VTS Érika F. Cota, Márcio Eduardo Kreutz, Cesar A. Zeferino, Luigi Carro, Marcelo Lubaszewski, Altamiro Amadeu Susin
2003	J	`jnl`	The SigmaDelta-BIST Method Applied to Analog Filters. J. Electron. Test. L. Cassol, O. Betat, Luigi Carro, Marcelo Lubaszewski
2002	—	`conf`	A New FPGA for DSP Applications Integrating BIST Capabilities. LATW Alex Gonsales, Marcelo Lubaszewski, Luigi Carro, Michel Renovell
2002	—	`conf`	Designing for Test Butterworth and Chebyshev Low-Pass Filters of Any Order. LATW José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho
2002	—	`conf`	Estimating Static Parameters of A-to-D Converters from Spectral Analysis. LATW Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell, Marcelo Lubaszewski
2002	Misc	`conf`	Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus. VTS José Vicente Calvano, Vladimir Castro Alves, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski
2002	—	`conf`	Generic and Detailed Search for TAM Definition in Core-Based Systems. LATW Érika F. Cota, Luigi Carro, Alex Orailoglu, Marcelo Lubaszewski
2002	—	`conf`	State Model Approach for Analog Fault Modeling. LATW José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski, Vladimir Castro Alves
2002	A	`conf`	Test Planning and Design Space Exploration in a Core-Based Environment. DATE Érika F. Cota, Luigi Carro, Marcelo Lubaszewski, Alex Orailoglu
2002	—	`conf`	Testability Properties of BDDs. SBCCI Felipe S. Marques, Vinícius P. Correia, A. Prado, Marcelo Lubaszewski, André Inácio Reis
2001	—	`conf`	A BIST Procedure for Analog Mixers in Software Radio. SBCCI André C. Nácul, Luigi Carro, Daniel Janner, Marcelo Lubaszewski
2001	—	`conf`	A Test Method for a Broad Class of DSP Circuits. LATW Érika F. Cota, Luigi Carro, Marcelo Lubaszewski
2001	—	`conf`	An Analog-based Approach for MEMS Testing. LATW Bernard Courtois, Salvador Mir, Benoît Charlot, Marcelo Lubaszewski
2001	C	`conf`	Built-in Test of Analog Non-Linear Circuits in a SOC Environment. VLSI-SOC Luigi Carro, André C. Nácul, Daniel Janner, Marcelo Lubaszewski
2001	J	`jnl`	Concepção de Circuitos e Sistemas Integrados. RITA Renato P. Ribas, André Inácio Reis, Marcelo Lubaszewski
2001	—	`conf`	Designing Testable Networks for Transfer Function Realization. LATW José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho
2001	J	`jnl`	Fault Models and Test Generation for OpAmp Circuits - The FFM. J. Electron. Test. José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski
2001	—	`conf`	Filter Sensitivity Analysis Using the TRAM. LATW José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski
2001	J	`jnl`	Guest Editorial. J. Electron. Test. Marcelo Lubaszewski, Víctor H. Champac
2001	J	`jnl`	Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults. J. Electron. Test. Érika F. Cota, Fernanda Lima, Sana Rezgui, Luigi Carro, Raoul Velazco, Marcelo Lubaszewski, Ricardo Reis
2001	—	`conf`	The Sigma-Delta-Bist Method Applied to Linear Analog Circuits. LATW L. Cassol, Luigi Carro, Marcelo Lubaszewski
2000	—	`conf`	A Self-Testing Mask Programmable Matrix Using Built-in Current Sensing. LATW Fernanda Gusmão de Lima, Eduardo D'Avila, Mauricio Moraes, Marcelo Lubaszewski, Ricardo Reis
2000	J	`jnl`	A new adaptive analog test and diagnosis system. IEEE Trans. Instrum. Meas. Érika F. Cota, Marcelo Negreiros, Luigi Carro, Marcelo Lubaszewski
2000	J	`jnl`	Design of self-checking fully differential circuits and boards. IEEE Trans. Very Large Scale Integr. Syst. Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois
2000	—	`conf`	Designing a Radiation Hardened 8051-Like Micro-Controller. SBCCI Fernanda Gusmão de Lima, Érika F. Cota, Luigi Carro, Marcelo Lubaszewski, Ricardo Reis, Raoul Velazco, Sana Rezgui
2000	Misc	`conf`	Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations. VTS José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski
2000	—	`conf`	Implementing a Self-Checking PROFIBUS Slave. LATW Margrit Reni Krug, Marcelo Lubaszewski, José Manuel Martins Ferreira, Gustavo Ribeiro da Costa Alves
2000	—	`conf`	On the Temperature Dependencies of Analog BIST. LATW Luigi Carro, Michel Renovell, Érika F. Cota, Marcelo Lubaszewski, Yves Bertrand, Florence Azaïs
2000	A	`conf`	Reuse of Existing Resources for Analog BIST of a Switch Capacitor Filte. DATE Érika F. Cota, Michel Renovell, Florence Azaïs, Yves Bertrand, Luigi Carro, Marcelo Lubaszewski
2000	—	`conf`	Synthesis of a 8051-Like Microcontroller Tolerant to Transient Faults. LATW Érika F. Cota, Marcelo Lubaszewski, Raoul Velasco, Sana Rezgui
2000	—	`conf`	TI-BIST: a temperature independent analog BIST for switched-capacitor filters. Asian Test Symposium Luigi Carro, Érika F. Cota, Marcelo Lubaszewski, Yves Bertrand, Florence Azaïs, Michel Renovell
2000	—	`conf`	Testability Properties of Vertex Precedent BDDs. SBCCI André Inácio Reis, A. Prado, Marcelo Lubaszewski
2000	—	`conf`	Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers. Asian Test Symposium José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski
2000	—	`conf`	The Use of Macromodels on Op-Amp Circuits Fault Modeling. LATW José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski
2000	—	`conf`	Using Reconfigurability Features to Break Down Test Costs: a Case Study. LATW Luigi Carro, Luciano Agostini, Roberto Pacheco, Marcelo Lubaszewski
1999	A	`conf`	A Method to Diagnose Faults in Linear Analog Circuits using an Adaptive Tester. DATE Érika F. Cota, Luigi Carro, Marcelo Lubaszewski
1999	Misc	`conf`	Design and Test of MEMs. VLSI Design Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner
1999	A	`conf`	Fault modeling of suspended thermal MEMS. ITC Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois
1998	—	`conf`	A Built-In Multi-Mode Stimuli Generator for Analogue and Mixed-Signal Testing. SBCCI Marcelo Lubaszewski, Michel Renovell, Salvador Mir, Florence Azaïs, Yves Bertrand
1998	J	`jnl`	A Reliable Fail-Safe System. IEEE Trans. Computers Marcelo Lubaszewski, Bernard Courtois
1998	—	`conf`	An Approach to the On-Line Testing of Operational Amplifiers. Asian Test Symposium Jaime Velasco-Medina, Marcelo Lubaszewski, Michael Nicolaidis
1998	—	`conf`	Bridging the Gap between Microelectronics and Micromechanics Testing. Asian Test Symposium Marcelo Lubaszewski
1998	A	`conf`	Microsystems Testing: an Approach and Open Problems. DATE Marcelo Lubaszewski, Érika F. Cota, Bernard Courtois
1998	Misc	`conf`	Testing MEMS. VTS Jean-Michel Karam, Marcelo Lubaszewski, R. D. Shawn Blanton, Andrew Richardson
1998	J	`jnl`	Thermal Monitoring of Self-Checking Systems. J. Electron. Test. Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois
1997	J	`jnl`	A CAT Tool for Frequency-domain Testing and Diagnosis on Analog. J. Braz. Comput. Soc. Érika F. Cota, José Di Elias Domênico, Marcelo Lubaszewski
1996	A	`conf`	ABILBO: Analog BuILt-in Block Observer. ICCAD Marcelo Lubaszewski, Salvador Mir, Leandro Pulz
1996	—	`conf`	Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits. ED&TC Salvador Mir, Bernard Courtois, Marcelo Lubaszewski, Vladimir Kolarik
1996	—	`conf`	Design of high-performance band-pass sigma-delta modulator with concurrent error detection. ICECS Fabrizio Francesconi, Valentino Liberali, Marcelo Lubaszewski, Salvador Mir
1996	J	`jnl`	Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electron. Test. Salvador Mir, Marcelo Lubaszewski, Bernard Courtois
1996	—	`conf`	Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois
1996	J	`jnl`	Unified built-in self-test for fully differential analog circuits. J. Electron. Test. Salvador Mir, Marcelo Lubaszewski, Bernard Courtois
1995	J	`jnl`	Analog checkers with absolute and relative tolerances. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Vladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois
1995	Misc	`conf`	Frequency-based BIST for analog circuit testin. VTS Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski
1995	—	`conf`	Mixed-signal circuits and boards for high safety applications. ED&TC Marcelo Lubaszewski, Vladimir Kolarik, Salvador Mir, C. Nielsen, Bernard Courtois
1994	A	`conf`	Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois
1994	Misc	`conf`	Designing self-exercising analogue checkers. VTS Vladimir Kolarik, Marcelo Lubaszewski, Bernard Courtois
1993	A	`conf`	Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards. ICCAD Meryem Marzouki, Marcelo Lubaszewski, Mohamed Hedi Touati
1992	A	`conf`	On the Design of Self-Checking Boundary Scannable Boards. ITC Marcelo Lubaszewski, Bernard Courtois