Marcelino B. Santos

100 papers A 10B 3C 17Misc 4Journal 21Unranked 44

Year	Rank	Type	Title / Venue / Authors
2025	C	`conf`	A 0.5V Programmable Voltage Reference with Integrated Differential-Pair Trimming achieving 28.1ppm/°C Temperature Coefficient. ISCAS Diogo Ralo, Valter Sádio, Fábio Passos, Tiago H. Moita, Marcelino B. Santos
2025	—	`conf`	A 300 mA Fully-Integrated Inverter-Based LDO with Enhanced Supply Insensitivity for Smart Edge AI Applications. DCIS M. Clara Simões, Floriberto Lima, Marcelino B. Santos, Fábio Passos
2025	C	`conf`	An Ultra Low Power Circuits M.Sc. Course Proposal for the GreenChips-EDU Platform. ISCAS Jorge R. Fernandes, Ricardo Martins, Gonçalo Rodrigues, Marcelino B. Santos
2025	J	`jnl`	Incorporation of Piezoelectric Materials in Military Uniforms. IEEE Access Rodrigues de Fátima Jacinto, Ricardo A. Marques Lameirinhas, Catarina P. Correia V. Bernardo, João Paulo N. Torres, Pedro Mendonça dos Santos, Marcelino B. Santos, Antonio Baptista
2025	—	`conf`	On the Usage of Genetic Algorithms, Reinforcement Learning and Bayesian Optimisation for RF IC Design Automation. SMACD Margarida Lourenço, Bingbing Zhao, Junde Li, Marcelino B. Santos, Pui-In Mak, Rui Paulo Martins, Wei-Han Yu, Fábio Passos
2025	—	`conf`	Technology-independent Layout Generator of Industry-grade Power Devices Validated Down to 22-nm Nodes. SMACD Duarte Marques, Ricardo Martins, Marcelino B. Santos
2024	—	`conf`	A Small-Area Current-Mode Input ΣΔ Modulator for Under-the-Sensors ADC Arrays. DCIS Hanna Iva Busse, Taimur Gibran Rabuske, Mário Silva, Gonçalo Rodrigues, Diogo Miguel Caetano, Marcelino B. Santos, Jorge R. Fernandes
2024	—	`conf`	Integrated Demodulator for Manchester-Coded AM Signals with Clock Retrieval in US Applications. MWSCAS Hanna Iva Busse, Gonçalo Rodrigues, Diogo Miguel Caetano, Marcelino B. Santos, Jorge R. Fernandes
2024	C	`conf`	WIP: Building an Education Ecosystem for Next Generation Microelectronics Experts in Green and Circular Economy with Digitally-Supported Teaching Methods for Sustainable Chips and Applications (EU Project GreenChips-EDU). FIE Klaus Hofmann, Ferdinand Keil, David Riehl, Alicja Michalowska-Forsyth, Nikolaus Czepl, Sarah Woywod, Dominik Zupan, Mario R. Casu, Carlo Ricciardi, Massimo Violante, Mariagrazia Graziano, Yuri Ardesi, Fabrizio Mo, Dominik Berger, Sabine Sill, Volker Visotschnig, Panagiota Morfouli, Liliana Prejbeanu, Katell Morin-Allory, Cyrille Chavet, Davide Bucci, Skandar Basrour, Jean-Christophe Crebier, Nhu-Huan Nguyen, Ernesto Quisbert-Trujillo, Christian Defélix, Isabelle Corbett-Etchevers, Johannes Sturm, Jens Peter Konrath, Ulla Birnbacher, Thomas Klinger, Wolfgang Werth, Jorge Fernandes, Marcelino B. Santos, Antonio Rubio, Alba Pagès-Zamora, Josep Pegueroles, Jordi Salazar, Beatriz Otero, J. Manuel Moreno, X. Aragones, Israel Martin, Aleix Sole, Dunja Suttnig, Julia Calabro, Floriberto Lima, Eric Jouseau, François Cerisier, Cristian Rivier, Sepp Eisenriegler, Harald Reichl, Miroslav Macan, Dubravko Kruselj, Mladen Puskaric, Mirjana Tatalovic, Vinko Zelenicic, Bernd Deutschmann
2023	—	`conf`	Delta-Sigma Control Loop For Energy-Efficient Electrical Stimulation with Arbitrary-Shape Stimuli. BioCAS Amin Rashidi, Hassan Rivandi, Milos Grubor, André Agostinho, Valter Sádio, Marcelino B. Santos, Wouter A. Serdijn, Vasiliki Giagka
2023	—	`conf`	Paving the Way for the Electronic Design Automation of Power Management Units. SMACD Carlos Santos, Jorge R. Fernandes, Marcelino B. Santos, Ricardo Martins
2022	—	`conf`	Asynchronous Controller Design and Simulation Using Signal Transition Graphs. DCIS Diogo Domingos, Marcelino B. Santos
2022	—	`conf`	DRAM Performance Sensor. HCI (7) Jorge Semião, Luís Santos, Marcelino B. Santos
2022	—	`conf`	Load Optimized Gate Driving for Charge Pumps. DCIS Carlos Santos, Jorge R. Fernandes, Marcelino B. Santos
2021	—	`conf`	SRAM Performance Sensor. DCIS Jorge Semião, Luís Santos, Marcelino B. Santos
2020	—	`ch.`	Internet of Things and Artificial Intelligence - A Wining Partnership? Convergence of Artificial Intelligence and the Internet of Things Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2019	—	`conf`	Applying Model Checking in the Verification of a Clock Masking Unit. DCIS José M. Leitão, Ricardo Chaves, Marcelino B. Santos
2018	—	`conf`	Low noise, high efficiency, segmented LCD drivers for ultra-low power applications in 22 nm FD-SOI. DCIS Rodrigo B. Capeleiro, Marcelino B. Santos
2018	—	`conf`	Low-power frequency monitoring circuit for clock failure detection. DCIS Rodrigo B. Capeleiro, José M. Leitão, Ricardo Chaves, Marcelino B. Santos
2018	—	`conf`	Performance Sensor for Reliable Operation. HCI (8) Jorge Semião, Ruben Cabral, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2015	J	`jnl`	Fault-Tolerance in Field Programmable Gate Array with Dynamic Voltage and Frequency Scaling. J. Low Power Electron. Carlos Leong, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2015	—	`conf`	Fault-tolerance in FPGA focusing power reduction or performance enhancement. LATS Carlos Leong, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2014	J	`jnl`	Digital modular control of high frequency DC-DC converters. Microelectron. J. Abilio Parreira, Floriberto A. Lima, Marcelino B. Santos
2014	—	`conf`	Implicit current DC-DC Digital Voltage-Mode Control. ISIE Carlos Moreira, Marcelino B. Santos
2014	—	`conf`	Performance sensor for tolerance and predictive detection of delay-faults. DFT Jorge Semião, David Saraiva, Carlos Leong, André Romão, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2013	B	`conf`	Aging monitoring with local sensors in FPGA-based designs. FPL Carlos Leong, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira, María Dolores Valdés, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas
2013	J	`jnl`	Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion. J. Electron. Test. Julio César Vázquez, Víctor H. Champac, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
2013	J	`jnl`	Ultra low power capless LDO with dynamic biasing of derivative feedback. Microelectron. J. Jorge O. M. Esteves, João Pereira, Júlio Paisana, Marcelino B. Santos
2012	J	`jnl`	Aging-Aware Power or Frequency Tuning With Predictive Fault Detection. IEEE Des. Test Comput. Jackson Pachito, Celestino V. Martins, Bruno Jacinto, Jorge Semião, Julio César Vázquez, Víctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2012	—	`conf`	An ultra-low noise current source for magnetoresistive biosensors biasing. BioCAS Tiago L. Costa, Moisés Simões Piedade, Marcelino B. Santos
2012	J	`jnl`	Modeling of Inherent Losses of Fully Integrated Switched Capacitor DC-DC Converters. J. Low Power Electron. Valter Sádio, Fabian Rein, Christian Münker, Marcelino B. Santos
2011	Misc	`conf`	Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors. VTS Celestino V. Martins, Jorge Semião, Julio César Vázquez, Víctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2011	—	`conf`	Digital LQR control with Kalman Estimator for DC-DC Buck converter. EUROCON Carlos O. Moreira, J. Fernando A. da Silva, Sónia Ferreira Pinto, Marcelino B. Santos
2011	J	`jnl`	Digital Sliding Mode Control of DC-DC Buck Converters. J. Low Power Electron. Bruno Jacinto, Carlos Moreira, Marcelino B. Santos
2011	C	`conf`	ICT: Interface software for the characterization and test of mixed-signal power cores. IOLTS Jorge O. M. Esteves, Tiago H. Moita, Carlos B. Almeida, Marcelino B. Santos
2011	—	`conf`	Mixed-Signal Fault Equivalence: Search and Evaluation. Asian Test Symposium Nuno Guerreiro, Marcelino B. Santos
2011	J	`jnl`	On-Line BIST for Performance Failure Prediction Under NBTI-Induced Aging in Safety-Critical Applications. J. Low Power Electron. R. S. Oliveira, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
2011	—	`conf`	On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications. LATW R. S. Oliveira, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
2010	Misc	`conf`	Low-sensitivity to process variations aging sensor for automotive safety-critical applications. VTS Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel Maria Cacho Teixeira, Marcelino B. Santos, João Paulo Teixeira
2010	C	`conf`	Predictive error detection by on-line aging monitoring. IOLTS Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
2010	A	`conf`	Programmable aging sensor for automotive safety-critical applications. DATE Julio César Vázquez, Víctor H. Champac, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
2009	C	`conf`	Built-in aging monitoring for safety-critical applications. IOLTS Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
2009	C	`conf`	Controllability and observability in mixed signal cores. IOLTS José F. da Rocha, Nuno Dias, Angelo Monteiro, Alexandre Neves, Gabriel Santos, Marcelino B. Santos, João Paulo Teixeira
2009	C	`conf`	Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies. IOLTS Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2009	J	`jnl`	Gate Driver Voltage Optimization for Multi-Mode Low Power DC-DC Conversion. J. Low Power Electron. Nuno Dias, Marcelino B. Santos, Angelo Monteiro, Pedro Braga, Alexandre Neves
2009	—	`conf`	Measuring clock-signal modulation efficiency for Systems-on-Chip in electromagnetic interference environment. LATW Jorge Semião, Judit Freijedo, Marlon Moraes, M. Mallmann, Carlos Lemos Antunes, Juliano Benfica, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Juan J. Rodríguez-Andina, João Paulo Teixeira, Daniel Lupi, Edmundo Gatti, Luis Garcia, Fernando Hernandez
2009	J	`jnl`	Noise Minimization for Low Power Bandgap Reference and Low Dropout Regulator Cores. J. Low Power Electron. Angelo Monteiro, Marcelino B. Santos, Alexandre Neves, Nuno Dias
2008	—	`conf`	Adjustable low consumption circuit for monitorization of power source voltages in a SoC. APCCAS Rodrigo Duarte, Júlio Paisana, Marcelino B. Santos, Floriberto A. Lima
2008	C	`conf`	Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits. IOLTS Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2008	—	`conf`	Monolithic Multi-mode DC-DC Converter with Gate Voltage Optimization. PATMOS Nuno Dias, Marcelino B. Santos, Floriberto A. Lima, Beatriz Vieira Borges, Júlio Paisana
2008	C	`conf`	Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits. DDECS Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2008	J	`jnl`	Time Management for Low-Power Design of Digital Systems. J. Low Power Electron. Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2007	—	`conf`	Enhancing the Tolerance to Power-Supply Instability in Digital Circuits. ISVLSI Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2007	J	`jnl`	Functional-oriented mask-based built-in self-test. IET Comput. Digit. Tech. Marcelino B. Santos, João Paulo Teixeira
2007	C	`conf`	Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits. DDECS Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2007	C	`conf`	On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits. IOLTS Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2006	—	`conf`	BIST Architectures and Fault Emulation. LATW Abilio Parreira, Marcelino B. Santos, João Paulo Teixeira
2006	—	`conf`	DFT and Probabilistic Testability Analysis at RTL. HLDVT José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João Paulo Cacho Teixeira
2006	C	`conf`	Functional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage. DDECS F. Guerreiro, Jorge Semião, A. Pierce, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2006	C	`conf`	Probabilistic Testability Analysis and DFT Methods at RTL. DDECS José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João Paulo Teixeira
2005	C	`conf`	Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test. IOLTS Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2005	J	`jnl`	Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip. J. Electron. Test. D. Barros Júnior, Marcial Jesús Rodríguez-Irago, Marcelino B. Santos, Isabel C. Teixeira, Fabian Vargas, João Paulo Teixeira
2004	A	`conf`	A Probabilistic Method for the Computation of Testability of RTL Constructs. DATE José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João Paulo Teixeira
2004	J	`jnl`	Built-In Self-Test Quality Assessment Using Hardware Fault Emulation In FPGAs. Comput. Artif. Intell. Abilio Parreira, João Paulo Teixeira, Marcelino B. Santos
2004	B	`conf`	FPGAs BIST Evaluation. FPL Abilio Parreira, João Paulo Teixeira, Marcelino B. Santos
2004	C	`conf`	Modeling and Simulation of Time Domain Faults in Digital Systems. IOLTS Daniel Barros Jr., Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2004	J	`jnl`	On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. J. Electron. Test. Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Luz Balado, Joan Figueras
2003	B	`conf`	Fault Simulation Using Partially Reconfigurable Hardware. FPL Abilio Parreira, João Paulo Teixeira, A. Pantelimon, Marcelino B. Santos, José T. de Sousa
2003	C	`conf`	Property Coverage for Quality Assessment of Fault Tolerant or Fail Safe Systems. IOLTS Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2003	A	`conf`	RTL Test Pattern Generation for High Quality Loosely Deterministic BIST. DATE Marcelino B. Santos, José M. Fernandes, Isabel C. Teixeira, João Paulo Teixeira
2002	J	`jnl`	Design and Test of a Certifiable ASIC for a Safety-Critical Gas Burner Control System. J. Electron. Test. Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2002	—	`conf`	On High-Quality, Low Energy BIST Preparation at RT-Level. LATW Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Luz Balado, Joan Figueras
2002	J	`jnl`	RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage. J. Electron. Test. Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira
2002	A	`conf`	RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. ITC Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Rosa Rodríguez-Montañés, Joan Figueras
2002	—	`conf`	Self-Checking and Fault Tolerance Quality Assessment Using Fault Sampling. DFT Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2001	—	`conf`	Design and Test of Certifiable ASICs for Safety-Critical Gas Burners Contro. IOLTW Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2001	A	`conf`	Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-level. ITC Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2001	—	`conf`	RTL design validation, DFT and test pattern generation for high defects coverage. ETW Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira
2001	J	`jnl`	RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems. J. Electron. Test. Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira
2000	—	`conf`	Experiments on RTL ATPG and Fault Simulation for High Defect Coverage in Digital Systems-on-a-Chip. LATW Marcelino B. Santos, João Paulo Teixeira
2000	J	`jnl`	Low Power BIST by Filtering Non-Detecting Vectors. J. Electron. Test. Salvador Manich, A. Gabarró, M. Lopez, Joan Figueras, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, João Paulo Teixeira, Marcelino B. Santos
2000	—	`conf`	Quality of Electronic Design: From Architectural Level to Test Coverage. ISQED Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2000	—	`conf`	RTL-based functional test generation for high defects coverage in digital SOCs. ETW Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira
1999	A	`conf`	Defect-Oriented Mixed-Level Fault Simulation of Digital Systems-on-a-Chip Using HDL. DATE Marcelino B. Santos, João Paulo Teixeira
1999	Misc	`conf`	Defect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified Fault Sampling Technique. VTS Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira
1999	—	`conf`	From system level to defect-oriented test: a case study. ETW Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira
1999	—	`conf`	Low power BIST by filtering non-detecting vectors. ETW Salvador Manich, A. Gabarró, M. Lopez, Joan Figueras, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, João Paulo Teixeira, Marcelino B. Santos
1999	—	`conf`	Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity. ISCAS (1) Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Joan Figueras, Salvador Manich, João Paulo Teixeira, Marcelino B. Santos
1998	A	`conf`	Defect-oriented test quality assessment using fault sampling and simulation. ITC Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
1998	—	`conf`	Defect-oriented testing of analogue and mixed signal ICs. ICECS Marcelino B. Santos, Fernando M. Gonçalves, Michael J. Ohletz, João Paulo Teixeira
1996	A	`conf`	Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation. ITC F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos, João Paulo Teixeira
1996	—	`conf`	VHDL fault simulation for defect-oriented test and diagnosis of digital ICs. EURO-DAC João Paulo Teixeira, F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos
1995	Misc	`conf`	Test preparation for high coverage of physical defects in CMOS digital ICs. VTS Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira
1995	—	`conf`	Test preparation methodology for high coverage of physical defects in CMOS digital ICs. ED&TC Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira
1994	A	`conf`	Back Annotation of Physical Defects into Gate-Level, Realistic Faults in Digital ICs. ITC Mario Calha, Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira
1994	—	`conf`	On the Analysis of Routing Cells and Adjacency Faults in CMOS Digital Circuits. DFT A. P. Casimiro, Fernando M. Gonçalves, João Paulo Teixeira, Marcelino B. Santos
1993	—	`conf`	Experiments on Bridging Fault Analysis and Layout-Level DFT for CMOS Designs. DFT A. P. Casimiro, M. Simões, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
1993	—	`conf`	Realistic Fault Analysis of CMOS Analog Building Blocks. DFT P. Nicolau, J. Barbosa, M. Saraiva, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
1992	J	`jnl`	On the design of a highly testable cell library. Microprocess. Microprogramming M. Saraiva, Marcelino B. Santos, A. P. Casimiro, Isabel Maria Cacho Teixeira, João Paulo Teixeira
1992	A	`conf`	Physical DFT for High Coverage of Realistic Faults. ITC M. Saraiva, P. Casimiro, Marcelino B. Santos, José T. de Sousa, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira