Marc E. Levitt

13 papers A* 1A 3C 1Journal 5Unranked 2

Year	Rank	Type	Title / Venue / Authors
2004	—	`conf`	Design for Manufacturing? Design for Yield!!! ISQED Marc E. Levitt
1997	—	`conf`	A fault diagnosis methodology for the UltraSPARC ED&TC Sridhar Narayanan, R. Srinivasan, R. P. Kunda, Marc E. Levitt, Saied Bozorgui-Nesbat
1997	J	`jnl`	Designing UltraSparc for Testability. IEEE Des. Test Comput. Marc E. Levitt
1997	J	`jnl`	Guest Editor's Introduction: Microprocessors Lead the Way in Complex Design. IEEE Des. Test Comput. Marc E. Levitt
1996	A	`conf`	Formal Verification of the UltraSPARC ITC Marc E. Levitt
1995	J	`jnl`	A 64-b microprocessor with multimedia support. IEEE J. Solid State Circuits Lavi Lev, Andy Charnas, Marc Tremblay, Alexander Dalal, Bruce A. Frederick, Chakra R. Srivatsa, David Greenhill, Dennis L. Wendell, Duy Dinh Pham, Eric Anderson, Hemraj K. Hingarh, Inayat Razzack, James M. Kaku, Ken Shin, Marc E. Levitt, Michael Allen, Philip A. Ferolito, Richard L. Bartolotti, Robert K. Yu, Ronald J. Melanson, Shailesh I. Shah, Sophie Nguyen, Sundari S. Mitra, Vinita Reddy, Vidyasagar Ganesan, Willem J. de Lange
1995	A	`conf`	Testability, Debuggability, and Manufacturability Features of the UltraSPARC ITC Marc E. Levitt, Srinivas Nori, Sridhar Narayanan, G. P. Grewal, Lynn Youngs, Anjali Jones, Greg Billus, Siva Paramanandam
1994	J	`jnl`	BiCMOS logic testing. IEEE Trans. Very Large Scale Integr. Syst. Marc E. Levitt, Kaushik Roy, Jacob A. Abraham
1994	A*	`conf`	Microprocessor Testing: Which Technique is Best? (Panel). DAC Jacob A. Abraham, Sandip Kundu, Janak H. Patel, Manuel A. d'Abreu, Bulent I. Dervisoglu, Marc E. Levitt, Hector R. Sucar, Ron G. Walther
1990	C	`conf`	BiCMOS fault models: is stuck-at adequate? ICCD Marc E. Levitt, Kaushik Roy, Jacob A. Abraham
1990	J	`jnl`	Physical design of testable VLSI: techniques and experiments. IEEE J. Solid State Circuits Marc E. Levitt, Jacob A. Abraham
1990	—	`—`	Time-based strategies for semiconductor manufacture and test Marc E. Levitt
1989	A	`conf`	The Economics of Scan Design. ITC Marc E. Levitt, Jacob A. Abraham