Manuel Iván Rodríguez-Borbón

11 papers Journal 11
YearRankTypeTitle / Venue / Authors
2025 J jnl
Introduction of an arc rank order statistic for analysis of optimal solutions in travelling salesman problems.
Int. J. Math. Oper. Res.
Jerry L. Shaw, Donovan Fuqua, Hansuk Sohn, Manuel Iván Rodríguez-Borbón
2020 J jnl
Lean Manufacturing Critical Success Factors for the Transportation Equipment Manufacturing Industry in Mexico.
IEEE Access
Marina De La Vega, Yolanda A. Báez-López, Jorge Limon-Romero, Diego A. Tlapa, Dora-Luz Flores, Manuel Iván Rodríguez-Borbón, Aidé Aracely Maldonado-Macías
2019 J jnl
A Deconvolution Approach for Degradation Modeling With Measurement Error.
IEEE Access
Luis Alberto Rodríguez-Picón, Luis Asunción Pérez Dominguez, José Mejía, Iván Jc Pérez-Olguín, Manuel Iván Rodríguez-Borbón
2018 J jnl
Degradation modeling based on gamma process models with random effects.
Commun. Stat. Simul. Comput.
Luis Alberto Rodríguez-Picón, Anna Patricia Rodríguez-Picón, Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Alejandro Alvarado-Iniesta
2017 J jnl
Optimization of Multiple Response Variables Using the Desirability Function and a Bayesian Predictive Distribution.
Res. Comput. Sci.
Jorge Limon-Romero, Yolanda A. Báez, Diego A. Tlapa, Mitzy Pory-Lugo, Manuel Iván Rodríguez-Borbón
2017 J jnl
Reliability Estimation for Accelerated Life Tests Based on a Cox Proportional Hazard Model with Error Effect.
Qual. Reliab. Eng. Int.
Manuel Iván Rodríguez-Borbón, Manuel Arnoldo Rodríguez-Medina, Luis Alberto Rodríguez-Picón, Alejandro Alvarado-Iniesta, Naijun Sha
2016 J jnl
Non-normal Capability Indices for the Weibull and Lognormal Distributions.
Qual. Reliab. Eng. Int.
Manuel R. Piña-Monarrez, Jesús F. Ortiz-Yañez, Manuel Iván Rodríguez-Borbón
2016 J jnl
Reliability Analysis for Laptop Computer Under Electrical Harmonics.
Qual. Reliab. Eng. Int.
Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Manuel R. Piña-Monarrez, Roberto Ambrosio, Arturo Del Valle
2016 J jnl
Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution.
Qual. Reliab. Eng. Int.
Luis Alberto Rodríguez-Picón, Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Arturo Del Valle
2016 J jnl
Reliability Model for Electronic Devices under Time Varying Voltage.
Qual. Reliab. Eng. Int.
Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Delia J. Valles-Rosales, Arturo Del Valle, Arnoldo Rodriguez
2013 J jnl
Optimization of the material flow in a manufacturing plant by use of artificial bee colony algorithm.
Expert Syst. Appl.
Alejandro Alvarado-Iniesta, Jorge Luis García-Alcaraz, Manuel Iván Rodríguez-Borbón, Aidé Maldonado