Manoj Saxena

21 papers Misc 2Journal 13Unranked 6
YearRankTypeTitle / Venue / Authors
2026 Misc conf
Leveraging XAI for Semiconductor Electrical - Parameter Characterization Using Machine Learning.
VLSID
Siddhi Srivastava, Debojyoti Roy, Hriddhi Srivastava, Khushwant Sehra, Manoj Saxena
2025 Misc conf
An Ensemble MLP-RF Model for the Prediction of DG-MOSFETs: Addressing Fabrication Process Variations.
VLSID
Vaikunth Muthuraman, Khushwant Sehra, Vandana Kumari, Manoj Saxena
2024 J jnl
Ohmic contacts to n-type SiC: Influence of Au and Ta intermediate layers.
Microelectron. J.
Chanchal, Mohammad Faisal, Robert Laishram, Sharmila, Sonalee Kapoor, Jaya Lohani, D. S. Rawal, Manoj Saxena
2023 J jnl
Secure digital image watermarking using memristor-based hyperchaotic circuit.
Vis. Comput.
Sonam, Khushwant Sehra, Raghvendra Pratap Singh, Sharat Singh, Shweta Wadhera, Poonam Kasturi, Geetika Jain Saxena, Manoj Saxena
2022 — conf
Implications of Field Plate HEMT Towards Power Performance at Microwave X - Band.
VDAT
Khushwant Sehra, Jeffin Shibu, Meena Mishra, Mridula Gupta, Dipendra Singh Rawal, Manoj Saxena
2022 J jnl
Interplay Between γ-Ray Irradiation and 3DEG for Dosimeter Applications.
IEEE Access
Khushwant Sehra, Vandana Kumari, Poonam Kasturi, Mridula Gupta, Meena Mishra, Dipendra Singh Rawal, Manoj Saxena
2022 — conf
Investigation of Traps in AlGaN/GaN HEMT Epitaxial Structure Using Conductance Method.
VDAT
Chanchal, Ajay Kumar Visvkarma, Hardhyan Sheoran, Amit Malik, Robert Laishram, Dipendra Singh Rawal, Manoj Saxena
2022 J jnl
Investigation of proton irradiated dual field plate AlGaN/GaN HEMTs: TCAD based assessment.
Microelectron. J.
Neha, Vandana Kumari, Mridula Gupta, Manoj Saxena
2021 J jnl
A comparative study on the accuracy of small-signal equivalent circuit modeling for large gate periphery GaN HEMT with different source to drain length and gate width.
Microelectron. J.
Anupama Anand, Reeta, Dipendra Singh Rawal, Rakhi Narang, Meena Mishra, Manoj Saxena, Mridula Gupta
2021 J jnl
Robust and Secure Digital Image Watermarking Technique Using Arnold Transform and Memristive Chaotic Oscillators.
IEEE Access
Khushwant Sehra, Samriddhi Raut, Ashutosh Mishra, Poonam Kasturi, Shweta Wadhera, Geetika Jain Saxena, Manoj Saxena
2018 — conf
Threshold Voltage Investigation of Recessed Dual-Gate MISHEMT: Simulation Study.
VDAT
Preeti Singh, Vandana Kumari, Manoj Saxena, Mridula Gupta
2017 — conf
Analysis of Electrolyte-Insulator-Semiconductor Tunnel Field-Effect Transistor as pH Sensor.
VDAT
Ajay Singh, Rakhi Narang, Manoj Saxena, Mridula Gupta
2017 — conf
Improved Gate Modulation in Tunnel Field Effect Transistors with Non-rectangular Tapered Y-Gate Geometry.
VDAT
Rakhi Narang, Mridula Gupta, Manoj Saxena
2017 — conf
Variability Investigation of Double Gate JunctionLess (DG-JL) Transistor for Circuit Design Perspective.
VDAT
Vandana Kumari, Manoj Saxena, Mridula Gupta
2014 J jnl
Temperature dependent subthreshold model of long channel GAA MOSFET including localized charges to study variations in its temperature sensitivity.
Microelectron. Reliab.
Rajni Gautam, Manoj Saxena, R. S. Gupta, Mridula Gupta
2013 J jnl
Drain current model for a gate all around (GAA) p-n-p-n tunnel FET.
Microelectron. J.
Rakhi Narang, Manoj Saxena, R. S. Gupta, Mridula Gupta
2013 J jnl
Numerical analysis of localised charges impact on static and dynamic performance of nanoscale cylindrical surrounding gate MOSFET based CMOS inverter.
Microelectron. Reliab.
Rajni Gautam, Manoj Saxena, R. S. Gupta, Mridula Gupta
2012 J jnl
Effect of localised charges on nanoscale cylindrical surrounding gate MOSFET: Analog performance and linearity analysis.
Microelectron. Reliab.
Rajni Gautam, Manoj Saxena, R. S. Gupta, Mridula Gupta
2012 J jnl
Immunity against temperature variability and bias point invariability in double gate tunnel field effect transistor.
Microelectron. Reliab.
Rakhi Narang, Manoj Saxena, R. S. Gupta, Mridula Gupta
2012 J jnl
Simulation study of Insulated Shallow Extension Silicon On Nothing (ISESON) MOSFET for high temperature applications.
Microelectron. Reliab.
Vandana Kumari, Manoj Saxena, R. S. Gupta, Mridula Gupta
2012 J jnl
Temperature dependent drain current model for Gate Stack Insulated Shallow Extension Silicon On Nothing (ISESON) MOSFET for wide operating temperature range.
Microelectron. Reliab.
Vandana Kumari, Manoj Saxena, R. S. Gupta, Mridula Gupta