| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2016 | — | conf |
NEWCAS
|
| 2015 | A | conf |
ITC
|
| 2015 | — | conf |
DFTS
|
| 2014 | Misc | conf |
VTS
|
| 2014 | A | conf |
ITC
|
| 2014 | Misc | conf |
VTS
|
| 2013 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2012 | A | conf |
ITC
|
| 2011 | C | conf |
ISCAS
|
| 2011 | A | conf |
ITC
|
| 2011 | C | conf |
ISCAS
|
| 2010 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2009 | Misc | conf |
VTS
|
| 2009 | C | conf |
ISCAS
|
| 2008 | A | conf |
ITC
|
| 2008 | Misc | conf |
VTS
|
| 2008 | C | conf |
ISCAS
|
| 2007 | A | conf |
ITC
|
| 2007 | C | conf |
ISCAS
|
| 2007 | A | conf |
ITC
|
| 2007 | — | conf |
CICC
|
| 2006 | A | conf |
ITC
|
| 2006 | A | conf |
ITC
|
| 2006 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2006 | Misc | conf |
VTS
|
| 2005 | A | conf |
ICCAD
|
| 2005 | A | conf |
ITC
|
| 2005 | A | conf |
ITC
|
| 2005 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2004 | A | conf |
ITC
|
| 2004 | A | conf |
ITC
|
| 2004 | Misc | conf |
VTS
|
| 2004 | — | conf |
ISCAS (1)
|
| 2004 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2003 | A | conf |
ITC
|
| 2003 | A | conf |
ITC
|
| 2003 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2003 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2003 | Misc | conf |
VTS
|
| 2003 | J | jnl |
Timing Jitter Measurement of Intrinsic Random Jitter and Sinusoidal Jitter Using Frequency Division.
J. Electron. Test.
|
| 2002 | A | conf |
ITC
|
| 2002 | A | conf |
ITC
|
| 2002 | — | conf |
Asian Test Symposium
|
| 2002 | Misc | conf |
VTS
|
| 2001 | Misc | conf |
VTS
|
| 2001 | Misc | conf |
VTS
|
| 2001 | J | jnl |
IEEE Des. Test Comput.
|
| 2001 | — | conf |
LATW
|
| 2001 | A | conf |
ITC
|
| 2001 | A | conf |
ITC
|
| 2000 | Misc | conf |
VTS
|
| 2000 | Misc | conf |
VTS
|
| 2000 | A | conf |
ITC
|
| 1999 | Misc | conf |
VTS
|
| 1999 | — | conf |
Asian Test Symposium
|
| 1999 | A | conf |
ITC
|
| 1999 | A | conf |
ITC
|
| 1999 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1998 | J | jnl |
Integr.
|
| 1998 | A | conf |
ICCAD
|
| 1997 | A | conf |
ITC
|
| 1997 | J | jnl |
IEEE J. Solid State Circuits
|
| 1997 | A | conf |
ITC
|
| 1997 | A | conf |
ITC
|
| 1997 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 1996 | A* | conf |
DAC
|
| 1996 | A | conf |
ITC
|
| 1995 | A | conf |
ICCAD
|
| 1994 | Misc | conf |
VTS
|
| 1994 | A | conf |
ICCAD
|
| 1993 | A | conf |
ITC
|
| 1993 | A | conf |
ITC
|
| 1993 | J | jnl |
J. Electron. Test.
|
| 1992 | J | jnl |
IEEE Des. Test Comput.
|
| 1991 | J | jnl |
IEEE J. Solid State Circuits
|
| 1991 | Misc | conf |
VTS
|
| 1990 | A | conf |
ITC
|
| 1990 | J | jnl |
IEEE Trans. Biomed. Eng.
|
| 1990 | J | jnl |
IEEE J. Solid State Circuits
|
| 1990 | A | conf |
ITC
|
| 1990 | A | conf |
ITC
|
| 1990 | C | conf |
VCIP
|
| 1989 | B | conf |
SMC
|
| 1988 | A | conf |
ITC
|
| 1988 | A | conf |
ITC
|
| 1987 | J | jnl |
IEEE Trans. Biomed. Eng.
|
| 1987 | J | jnl |
IEEE Trans. Biomed. Eng.
|
| 1987 | J | jnl |
IEEE Trans. Biomed. Eng.
|