Mango C.-T. Chao

20 papers A* 1A 3Misc 5Journal 6Unranked 5
YearRankTypeTitle / Venue / Authors
2024 A* conf
Arbitrary-size Multi-layer OARSMT RL Router Trained with Combinatorial Monte-Carlo Tree Search.
DAC
Liang-Ting Chen, Hung-Ru Kuo, Yih-Lang Li, Mango C.-T. Chao
2023 Misc conf
Test Generation for Defect-Based Faults of Scan Flip-Flops.
VTS
Yu-Teng Nien, Chen-Hong Li, Pei-Yin Wu, Yung-Jheng Wang, Kai-Chiang Wu, Mango C.-T. Chao
2022 — conf
A Reinforcement Learning Agent for Obstacle-Avoiding Rectilinear Steiner Tree Construction.
ISPD
Po-Yan Chen, Bing-Ting Ke, Tai-Cheng Lee, I-Ching Tsai, Tai-Wei Kung, Li-Yi Lin, En-Cheng Liu, Yun-Chih Chang, Yih-Lang Li, Mango C.-T. Chao
2022 A conf
Improving Cell-Aware Test for Intra-Cell Short Defects.
DATE
Dong-Zhen Lee, Ying-Yen Chen, Kai-Chiang Wu, Mango C.-T. Chao
2022 — conf
Path-Based Pre-Routing Timing Prediction for Modern Very Large-Scale Integration Designs.
ISQED
Li-Wei Chen, Yao-Nien Sui, Tai-Cheng Lee, Yih-Lang Li, Mango C.-T. Chao, I-Ching Tsai, Tai-Wei Kung, En-Cheng Liu, Yun-Chih Chang
2022 Misc conf
Rule Generation for Classifying SLT Failed Parts.
VTS
Ho-Chieh Hsu, Cheng-Che Lu, Shih-Wei Wang, Kelly Jones, Kai-Chiang Wu, Mango C.-T. Chao
2022 J jnl
Test Methodology for Defect-Based Bridge Faults.
IEEE Trans. Very Large Scale Integr. Syst.
Shuo-Wen Chang, Yu-Teng Nien, Yu-Pang Hu, Kai-Chiang Wu, Chi Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao
2020 A conf
Power Distribution Network Generation for Optimizing IR-Drop Aware Timing.
ICCAD
Wen-Hsiang Chang, Li-Yi Lin, Yu-Guang Chen, Mango C.-T. Chao
2020 — conf
Test Methodology for Defect-based Bridge Faults.
ITC-Asia
Yu-Pang Hu, Shuo-Wen Chang, Kai-Chiang Wu, Chi Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao
2019 Misc conf
Layout-Based Dual-Cell-Aware Tests.
VTS
Tse-Wei Wu, Dong-Zhen Lee, Yu-Hao Huang, Mango C.-T. Chao, Kai-Chiang Wu, Shu-Yi Kao, Ying-Yen Chen, Po-Lin Chen, Mason Chern, Jih-Nung Lee
2018 J jnl
A Model-Based-Random-Forest Framework for Predicting V
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Chien-Hsueh Lin, Chih-Ying Tsai, Kao-Chi Lee, Sung-Chu Yu, Wen-Rong Liau, Alex Chun-Liang Hou, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao
2018 — conf
DVFS Binning Using Machine-Learning Techniques.
ITC-Asia
Keng-Wei Chang, Chun-Yang Huang, Szu-Pang Mu, Jian-Min Huang, Shi-Hao Chen, Mango C.-T. Chao
2017 J jnl
Generating Routing-Driven Power Distribution Networks With Machine-Learning Technique.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Wen-Hsiang Chang, Chien-Hsueh Lin, Szu-Pang Mu, Li-De Chen, Cheng-Hong Tsai, Yen-Chih Chiu, Mango C.-T. Chao
2017 Misc conf
Methodology of generating dual-cell-aware tests.
VTS
Yu-Hao Huang, Ching-Ho Lu, Tse-Wei Wu, Yu-Teng Nien, Ying-Yen Chen, Max Wu, Jih-Nung Lee, Mango C.-T. Chao
2017 — conf
Predicting Vt variation and static IR drop of ring oscillators using model-fitting techniques.
ASP-DAC
Tzu-Hsuan Huang, Wei-Tse Hung, Hao-Yu Yang, Wen-Hsiang Chang, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao
2016 J jnl
Predicting Shot-Level SRAM Read/Write Margin Based on Measured Transistor Characteristics.
IEEE Trans. Very Large Scale Integr. Syst.
Shu-Yung Bin, Shih-Feng Lin, Ya Ching Cheng, Wen-Rong Liau, Alex Hou, Mango C.-T. Chao
2016 Misc conf
Predicting Vt mean and variance from parallel Id measurement with model-fitting technique.
VTS
Chih-Ying Tsai, Kao-Chi Lee, Chien-Hsueh Lin, Sung-Chu Yu, Wen-Rong Liau, Alex Chun-Liang Hou, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao
2016 J jnl
Statistical Framework and Built-In Self-Speed-Binning System for Speed Binning Using On-Chip Ring Oscillators.
IEEE Trans. Very Large Scale Integr. Syst.
Szu-Pang Mu, Mango C.-T. Chao, Shi-Hao Chen, Yi-Ming Wang
2016 A conf
Statistical methodology to identify optimal placement of on-chip process monitors for predicting fmax.
ICCAD
Szu-Pang Mu, Wen-Hsiang Chang, Mango C.-T. Chao, Yi-Ming Wang, Ming-Tung Chang, Min-Hsiu Tsai
2011 J jnl
A Novel Pixel Design for AM-OLED Displays Using Nanocrystalline Silicon TFTs.
IEEE Trans. Very Large Scale Integr. Syst.
Chen-Wei Lin, Mango C.-T. Chao, Yen-Shih Huang