Man Ho Ling

32 papers Journal 31Unranked 1
YearRankTypeTitle / Venue / Authors
2026 J jnl
Acceptance sampling plan under step stress accelerated life test for one-shot devices.
Reliab. Eng. Syst. Saf.
Man Ho Ling, Chien-Tai Lin, Narayanaswamy Balakrishnan
2026 J jnl
Statistical inference and optimal design for step-stress accelerated life testing with hybrid group censoring for non-destructive one-shot devices.
Reliab. Eng. Syst. Saf.
Man Ho Ling, Erhard Cramer, Suk Joo Bae
2026 J jnl
Unified Accelerated Life Testing for One-Shot Devices With Weibull Lifetime Distributions.
IEEE Trans. Reliab.
Hung-Ping Tung, Man Ho Ling
2025 J jnl
An Extended Gamma Process for Accelerated Destructive Degradation Test: Modeling and Optimal Design.
IEEE Trans. Reliab.
Man Ho Ling, Suk Joo Bae, Shengxin Jin, Hon Keung Tony Ng
2025 J jnl
Artificial intelligence in teaching and teacher professional development: A systematic review.
Comput. Educ. Artif. Intell.
Xiao Tan, Gary Cheng, Man Ho Ling
2025 J jnl
Enhancing teachers' AI competency: A professional development intervention study based on intelligent-TPACK framework.
Comput. Educ. Artif. Intell.
Xiao Tan, Gary Cheng, Man Ho Ling
2025 J jnl
Investigating the mediating role of TPACK on teachers' AI competency and their teaching performance in higher education.
Comput. Educ. Artif. Intell.
Xiao Tan, Gary Cheng, Man Ho Ling
2025 J jnl
Optimal Designs of Multiple Step-Stress Accelerated Life Tests for One-Shot Devices With Weibull Lifetime Distributions.
IEEE Trans. Reliab.
Man Ho Ling
2024 J jnl
A random-effect gamma process model with random initial degradation for accelerated destructive degradation testing data.
Qual. Reliab. Eng. Int.
Man Ho Ling, Suk Joo Bae
2024 J jnl
OTL web interface: outlier testing in lifetime data.
Commun. Stat. Simul. Comput.
Chien-Tai Lin, Yu-Nan Wu, N. Balakrishnan, Man Ho Ling
2024 J jnl
On the application of inverted Dirichlet distribution for reliability inference of completely censored components with dependence structure.
Comput. Ind. Eng.
Man Ho Ling, Narayanaswamy Balakrishnan, Suk Joo Bae
2022 J jnl
Exact tests for outliers in Laplace samples.
Commun. Stat. Simul. Comput.
Chien-Tai Lin, Narayanaswamy Balakrishnan, Man Ho Ling
2022 J jnl
Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis.
Qual. Reliab. Eng. Int.
Narayanaswamy Balakrishnan, Elena Castilla, Man Ho Ling
2021 J jnl
Prognostics for lithium-ion batteries using a two-phase gamma degradation process model.
Reliab. Eng. Syst. Saf.
Chun Pang Lin, Man Ho Ling, Javier Cabrera, Fangfang Yang, Denis Yau Wai Yu, Kwok Leung Tsui
2020 J jnl
Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions.
Reliab. Eng. Syst. Saf.
Man Ho Ling, X. W. Hu
2019 J jnl
Bayesian and likelihood inferences on remaining useful life in two-phase degradation models under gamma process.
Reliab. Eng. Syst. Saf.
Man Ho Ling, H. K. T. Ng, Kwok Leung Tsui
2017 J jnl
Comparison of algorithms to simulate disease transmission.
J. Simulation
Xiaobei Shen, Zoie Shui-Yee Wong, Man Ho Ling, David Goldsman, Kwok-Leung Tsui
2017 J jnl
Efficient heterogeneous sampling for stochastic simulation with an illustration in health care applications.
Commun. Stat. Simul. Comput.
Man Ho Ling, Shui Yee Wong, Kwok-Leung Tsui
2017 — conf
Learning Analytics for Monitoring Students Participation Online: Visualizing Navigational Patterns on Learning Management System.
ICBL
Leonard K. M. Poon, Siu-Cheung Kong, Thomas S. H. Yau, Michael Y. W. Wong, Man Ho Ling
2017 J jnl
Model Mis-Specification Analyses of Weibull and Gamma Models Based on One-Shot Device Test Data.
IEEE Trans. Reliab.
Man Ho Ling, Narayanaswamy Balakrishnan
2016 J jnl
A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks.
IEEE Trans. Reliab.
Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling
2016 J jnl
Autopsy Data Analysis for a Series System With Active Redundancy Under a Load-Sharing Model.
IEEE Trans. Reliab.
Man Ho Ling, Hon Keung Tony Ng, Ping Shing Chan, Narayanaswamy Balakrishnan
2016 J jnl
EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution.
IEEE Trans. Reliab.
Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling
2016 J jnl
Likelihood Inference Under Proportional Hazards Model for One-Shot Device Testing.
IEEE Trans. Reliab.
Man Ho Ling, Hon Yiu So, Narayanaswamy Balakrishnan
2015 J jnl
Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process.
IEEE Trans. Reliab.
Man Ho Ling, Kwok-Leung Tsui, Narayanaswamy Balakrishnan
2015 J jnl
EM algorithm for one-shot device testing with competing risks under exponential distribution.
Reliab. Eng. Syst. Saf.
Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling
2014 J jnl
Best Constant-Stress Accelerated Life-Test Plans With Multiple Stress Factors for One-Shot Device Testing Under a Weibull Distribution.
IEEE Trans. Reliab.
Narayanaswamy Balakrishnan, Man Ho Ling
2014 J jnl
Gamma lifetimes and one-shot device testing analysis.
Reliab. Eng. Syst. Saf.
Narayanaswamy Balakrishnan, Man Ho Ling
2014 J jnl
Healthcare Intelligence: Turning Data into Knowledge.
IEEE Intell. Syst.
Hui Yang, O. Erhun Kundakcioglu, Jing Li, Teresa Wu, Joseph Ross Mitchell, Amy K. Hara, William Pavlicek, Leland S. Hu, Alvin C. Silva, Christine M. Zwart, Sait Tunç, Oguzhan Alagöz, Elizabeth S. Burnside, W. Art Chaovalitwongse, Georgiy Presnyakov, Yulian Cao, Sirirat Sujitnapitsatham, Daehan Won, Tara M. Madhyastha, Kurt E. Weaver, Paul R. Borghesani, Thomas J. Grabowski, Lianjie Shu, Man Ho Ling, Shui Yee Wong, Kwok-Leung Tsui
2013 J jnl
Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress.
IEEE Trans. Reliab.
Narayanaswamy Balakrishnan, Man Ho Ling
2012 J jnl
EM algorithm for one-shot device testing under the exponential distribution.
Comput. Stat. Data Anal.
Narayanaswamy Balakrishnan, Man Ho Ling
2012 J jnl
Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution.
IEEE Trans. Reliab.
Narayanaswamy Balakrishnan, Man Ho Ling