Maike Taddiken

16 papers C 3Misc 1Journal 2Unranked 10
YearRankTypeTitle / Venue / Authors
2024 C conf
6G-TakeOff: Holistic 3D Networks for 6G Wireless Communications.
DSD
Marko S. Andjelkovic, Nebojsa Maletic, Nicola Miglioranza, Milos Krstic, Enrico Koeck, Jan Buchholz, Maike Taddiken, Markus Fehrenz, Shaden Baradie, Dirk Wübben, Markus Breitbach
2019 — conf
Charge-Based Model for Reliability Analysis Flow of Flip- Flops under Process Variation and Aging.
SMACD
Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen
2018 J jnl
Design for reliability of generic sensor interface circuits.
Microelectron. Reliab.
Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen
2018 — conf
LUT-Based Stochastic Modeling for Non-Normal Performance Distributions.
SMACD
Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen
2018 Misc conf
On-line monitoring and error correction in sensor interface circuits using digital calibration techniques.
VTS
Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen
2018 — conf
ReSeMBleD-Methods for Response Surface Model Behavioral Description.
SMACD
Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen
2018 — conf
Yield Approximation of Analog Integrated Circuits Under Time-Dependent Variability.
SMACD
Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen
2017 — conf
Behavioral modeling of a sensor interface circuit including various non-idealities.
SMACD
Sascha Heinssen, Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen
2017 — conf
Variation- and degradation-aware stochastic behavioral modeling of analog circuit components.
SMACD
Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen
2016 J jnl
Analysis of aging effects - From transistor to system level.
Microelectron. Reliab.
Maike Taddiken, Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul
2016 — conf
Degradation and temperature analysis of voltage-controlled ring oscillators for robust and reliable oscillator designs in a 65nm bulk CMOS process.
MIXDES
Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen
2016 C conf
Online monitoring of NBTI and HCD in beta-multiplier circuits.
IOLTS
Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen
2016 — conf
Parameter identification for behavioral modeling of analog components including degradation.
MIXDES
Maike Taddiken, Theodor Hillebrand, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen
2016 — conf
Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits.
MIXDES
Theodor Hillebrand, Nico Hellwege, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen
2016 C conf
Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process.
IOLTS
Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen
2014 — conf
Analog behavioral modeling for age-dependent degradation of complex analog circuits.
MIXDES
Nils Heidmann, Nico Hellwege, Maike Taddiken, Dagmar Peters-Drolshagen, Steffen Paul