| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Sustain. Comput. Informatics Syst.
|
| 2025 | — | conf |
ISQED
|
| 2025 | C | conf |
SECRYPT
|
| 2025 | — | conf |
ISQED
|
| 2025 | C | conf |
PDP
|
| 2024 | — | conf |
ISVLSI
|
| 2024 | J | jnl |
CoRR
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | C | conf |
IOLTS
|
| 2023 | J | jnl |
Comput. Electr. Eng.
|
| 2023 | J | jnl |
IEEE Trans. Emerg. Top. Comput.
|
| 2022 | — | conf |
IGSC
|
| 2022 | J | jnl |
J. Supercomput.
|
| 2022 | J | jnl |
Microprocess. Microsystems
|
| 2022 | — | conf |
ISQED
|
| 2022 | J | jnl |
Application Layer DDoS Attack Detection Using Cuckoo Search Algorithm-Trained Radial Basis Function.
IEEE Access
|
| 2022 | J | jnl |
Microprocess. Microsystems
|
| 2022 | J | jnl |
IEEE Access
|
| 2021 | — | conf |
DFT
|
| 2021 | J | jnl |
Integr.
|
| 2021 | J | jnl |
Cryptogr.
|
| 2021 | — | conf |
HPEC
|
| 2021 | J | jnl |
J. Circuits Syst. Comput.
|
| 2021 | J | jnl |
IEEE Trans. Computers
|
| 2021 | J | jnl |
IEEE Trans. Computers
|
| 2020 | J | jnl |
IACR Cryptol. ePrint Arch.
|
| 2020 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2020 | — | conf |
ISVLSI
|
| 2020 | C | conf |
ISCAS
|
| 2020 | C | conf |
IOLTS
|
| 2020 | J | jnl |
IET Inf. Secur.
|
| 2019 | J | jnl |
J. Circuits Syst. Comput.
|
| 2019 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2019 | — | conf |
Restricting Switching Activity Using Logic Locking to Improve Power Analysis-Based Trojan Detection.
IVSW
|
| 2019 | J | jnl |
Microelectron. J.
|
| 2018 | J | jnl |
Int. J. Parallel Program.
|
| 2018 | — | conf |
ISVLSI
|
| 2018 | — | conf |
IVSW
|
| 2018 | J | jnl |
J. Electron. Test.
|
| 2018 | — | conf |
ISVLSI
|
| 2018 | J | jnl |
IET Inf. Secur.
|
| 2017 | C | conf |
KSEM
|
| 2017 | — | conf |
ReCoSoC
|
| 2017 | J | jnl |
IET Comput. Digit. Tech.
|
| 2017 | — | conf |
MCSoC
|
| 2017 | J | jnl |
ISC Int. J. Inf. Secur.
|
| 2017 | J | jnl |
Turkish J. Electr. Eng. Comput. Sci.
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2016 | C | conf |
IOLTS
|
| 2016 | — | conf |
EWDTS
|
| 2016 | J | jnl |
IET Comput. Digit. Tech.
|
| 2016 | J | jnl |
Integr.
|
| 2016 | J | jnl |
Microprocess. Microsystems
|
| 2016 | J | jnl |
ISC Int. J. Inf. Secur.
|
| 2015 | J | jnl |
Wirel. Pers. Commun.
|
| 2015 | J | jnl |
J. Circuits Syst. Comput.
|
| 2014 | J | jnl |
IEEE Comput. Archit. Lett.
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2014 | J | jnl |
J. Circuits Syst. Comput.
|
| 2013 | J | jnl |
Math. Comput. Model.
|
| 2013 | — | conf |
IC3
|
| 2013 | A | conf |
DSN
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2013 | — | conf |
BWCCA
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | Misc | conf |
Memory Mapped SPM: Protecting Instruction Scratchpad Memory in Embedded Systems against Soft Errors.
EDCC
|
| 2011 | — | conf |
ICECS
|
| 2011 | C | conf |
EUC
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2011 | A | conf |
DATE
|
| 2011 | C | conf |
IOLTS
|
| 2010 | C | conf |
DSD
|
| 2010 | A | conf |
DSN
|
| 2010 | J | jnl |
Integr.
|
| 2009 | A | conf |
DSN
|
| 2009 | J | jnl |
Low energy single event upset/single event transient-tolerant latch for deep subMicron technologies.
IET Comput. Digit. Tech.
|
| 2008 | — | conf |
HASE
|
| 2008 | Misc | conf |
VLSI Design
|
| 2008 | — | conf |
DFT
|
| 2008 | J | jnl |
J. Electron. Test.
|
| 2008 | B | conf |
FEDC: Control Flow Error Detection and Correction for Embedded Systems without Program Interruption.
ARES
|
| 2007 | C | conf |
PRDC
|
| 2007 | — | conf |
CNSR
|
| 2007 | A | conf |
DSN
|
| 2007 | — | conf |
ICECS
|
| 2006 | — | conf |
DFT
|
| 2006 | C | conf |
DASC
|
| 2006 | C | conf |
IES
|
| 2005 | A | conf |
IPDPS
|
| 2005 | — | conf |
LADC
|
| 2005 | — | conf |
DFT
|
| 2005 | — | conf |
Systems Communications
|
| 2005 | C | conf |
ICA3PP
|