Magali Estrada

29 papers Journal 21Unranked 8
YearRankTypeTitle / Venue / Authors
2017 J jnl
Characterization of MIS structures and thin film transistors using RF-sputtered HfO
Microelectron. Reliab.
Isaí Hernández, César Adrián Pons-Flores, Ivan Garduño, Julio C. Tinoco, Israel Mejia, Magali Estrada
2016 — conf
Modeling the variation of threshold voltage, mobility factor and saturation coefficient in amorphous Indium-Gallium-Zinc Oxide thin film transistors.
CCE
Y. Hernandez-Barrios, F. Avila-Herrera, Magali Estrada, Antonio Cerdeira, Oana Moldovan, Benjamín Iñíguez, Rodrigo Picos
2016 J jnl
On the series resistance in staggered amorphous thin film transistors.
Microelectron. Reliab.
Antonio Cerdeira, Magali Estrada, Lluís F. Marsal, Josep Pallarès, Benjamín Iñíguez
2016 — conf
Performance parameters degradation of inverted organic solar cells exposed under solar and artificial irradiance, using PTB7: PC70BM as active layer.
CCE
Magaly Ramirez-Como, Victor Samuel Balderrama, Magali Estrada
2016 J jnl
Temperature dependence of the electrical characteristics up to 370 K of amorphous In-Ga-ZnO thin film transistors.
Microelectron. Reliab.
Magali Estrada, M. Rivas, Ivan Garduño, F. Avila-Herrera, Antonio Cerdeira, Marcelo Antonio Pavanello, Israel Mejia, M. A. Quevedo-Lopez
2014 J jnl
Characterization of MIS structures and PTFTs using TiOx deposited by spin-coating.
Microelectron. Reliab.
C. Meneses, José G. Sánchez, Magali Estrada, Antonio Cerdeira, Josep Pallarès, Benjamín Iñíguez, Lluís F. Marsal
2014 — conf
Polyfluorene-based light-emitting diodes using TiOx as an electron injection layer.
CCE
Mónica Vuelvas Trinidad, Luis M. Reséndiz-Mendoza, Víctor Cabrera-Arenas, Magali Estrada
2013 J jnl
Correlation between P3HT inter-chain structure and J
Microelectron. Reliab.
V. S. Balderrama, Magali Estrada, Aurelien Viterisi, Pilar Formentin, Josep Pallarès, Josep Ferré-Borrull, Emilio Palomares, Lluís F. Marsal
2012 J jnl
Effect of interface charge on the dc bias stress-induced deformation and shift of the transfer characteristic of amorphous oxide thin-film transistors.
Microelectron. Reliab.
Magali Estrada, Antonio Cerdeira, Benjamín Iñíguez
2012 J jnl
Modeling the behavior of amorphous oxide thin film transistors before and after bias stress.
Microelectron. Reliab.
Antonio Cerdeira, Magali Estrada, Blanca S. Soto-Cruz, Benjamín Iñíguez
2012 J jnl
Optimised design of an organic thin-film transistor amplifier using the gm/ID methodology.
IET Circuits Devices Syst.
Rodrigo Picos, Eugenio García-Moreno, Miquel Roca, Benjamín Iñíguez, Magali Estrada, Antonio Cerdeira
2012 J jnl
Organic thin-film transistor bias-dependent capacitance compact model in accumulation regime.
IET Circuits Devices Syst.
Alejandra Castro-Carranza, Magali Estrada, Jairo C. Nolasco, Antonio Cerdeira, Lluís F. Marsal, Benjamín Iñíguez, Josep Pallarès
2012 — conf
Preparation, deposition and characterization of PTFTs based on PCDTBT/PMMA.
CCE
L. Fernando Ulloa, Magali Estrada, José G. Sánchez, V. M. Flores, Luis Reséndiz
2011 — conf
Gate leakage currents modeling for oxynitride gate dielectric in double gate MOSFETs.
CCE
Salvador Ivan Garduño, Antonio Cerdeira, Magali Estrada
2011 — conf
Influence and relationship of film morphology on Organic Solar Cells manufactured with different P3HT: PC[70]BM blend solutions.
CCE
V. S. Balderrama, Magali Estrada, Pilar Formentin, Aurelien Viterisi, Josep Ferré-Borrull, Josep Pallarès, Emilio Palomares, Lluís F. Marsal
2011 J jnl
Influence of P3HT: PCBM blend preparation on the active layer morphology and cell degradation.
Microelectron. Reliab.
V. S. Balderrama, Magali Estrada, Antonio Cerdeira, Blanca S. Soto-Cruz, Lluís F. Marsal, Josep Pallarès, Jairo C. Nolasco, Benjamín Iñíguez, Emilio Palomares, Josep Albero
2011 — conf
Modeling the subthreshold region of OTFTs.
CCE
Antonio Cerdeira, Magali Estrada, Benjamín Iñíguez, S. Soto
2011 — conf
Preparation, deposition and characterization of TiOx layers for organic PLEDs, solar cells and PTFTs.
CCE
José G. Sánchez, V. M. Flores, Luis Reséndiz, Magali Estrada
2009 J jnl
Stability of the J-V characteristics of (BEHP-PPV)-co-(MEH-PPV) based light-emitting diodes.
Microelectron. Reliab.
J. C. Sánchez, Magali Estrada
2008 J jnl
Conduction mechanisms of silicon oxide/titanium oxide MOS stack structures.
Microelectron. Reliab.
Julio C. Tinoco, Magali Estrada, Benjamín Iñíguez, Antonio Cerdeira
2008 J jnl
Improved upper contacts PMMA on P3HT PTFTS using photolithographic processes.
Microelectron. Reliab.
Israel Mejia, Magali Estrada, M. Avila
2005 J jnl
Effect of localized traps on the anomalous behavior of the transconductance in nanocrystalline TFTs.
Microelectron. Reliab.
Magali Estrada, Antonio Cerdeira, Luis Reséndiz, Benjamín Iñíguez, Lluís F. Marsal, Josep Pallarès
2004 J jnl
Editorial.
Microelectron. Reliab.
Juan Santana, Magali Estrada, Ofelia Martinez
2004 J jnl
Photo-CVD process for ultra thin SiO
Microelectron. Reliab.
V. Sánchez, J. Munguía, Magali Estrada
2003 J jnl
Effects of impurity concentration, hydrogen plasma process and crystallization temperature on poly-crystalline films obtained from PECVD a-Si: H layers.
Microelectron. Reliab.
Rodolfo Zolá García-Lozano, Magali Estrada, Antonio Cerdeira
2003 J jnl
FD MOS SOI circuit to enhance the ratio of illuminated to dark current of a co-integrated a-Si: H photodiode.
Microelectron. Reliab.
Magali Estrada, A. Afzalian, Denis Flandre, Antonio Cerdeira, Héctor Báez-Medina, A. de Lucca
2003 J jnl
Room temperature plasma oxidation mechanism to obtain ultrathin silicon oxide and titanium oxide layers.
Microelectron. Reliab.
Julio C. Tinoco, Magali Estrada, G. Romero
2002 J jnl
A review of recent MOSFET threshold voltage extraction methods.
Microelectron. Reliab.
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Antonio Cerdeira, Magali Estrada, Y. Yue
2001 J jnl
Determination of trap cross-section in a-Si: H p-i-n diodes parameters using simulation and parameter extraction.
Microelectron. Reliab.
Magali Estrada, Antonio Cerdeira, Adelmo Ortiz-Conde, Francisco J. García-Sánchez