Magali Bastian

14 papers A* 1A 4B 1C 1Misc 2Journal 2Unranked 3
YearRankTypeTitle / Venue / Authors
2009 A conf
A new design-for-test technique for SRAM core-cell stability faults.
DATE
Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin
2009 J jnl
Analysis of Resistive-Open Defects in SRAM Sense Amplifiers.
IEEE Trans. Very Large Scale Integr. Syst.
Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
2008 A conf
A Design-for-Diagnosis Technique for SRAM Write Drivers.
DATE
Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin
2008 A conf
A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs.
ITC
Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
2008 — conf
A Novel Dummy Bitline Driver for Read Margin Improvement in an eSRAM.
DELTA
Michael Yap San Min, Philippe Maurine, Magali Bastian, Michel Robert
2008 Misc conf
An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing.
VTS
Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin
2008 — conf
Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects.
ISVLSI
Michael Yap San Min, Philippe Maurine, Magali Bastian, Michel Robert
2007 J jnl
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits.
J. Electron. Test.
Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
2007 B conf
Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs.
ETS
Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
2007 — conf
Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior.
ATS
Magali Bastian, Vincent Gouin, Patrick Girard, Christian Landrault, Alexandre Ney, Serge Pravossoudovitch, Arnaud Virazel
2007 A conf
Slow write driver faults in 65nm SRAM technology: analysis and March test solution.
DATE
Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
2007 Misc conf
Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs.
VTS
Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
2006 C conf
March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit.
DDECS
Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
2005 A* conf
Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies.
DAC
Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian