Madhu K. Iyer

14 papers A* 2A 5Misc 3Journal 2Unranked 2
YearRankTypeTitle / Venue / Authors
2005 A conf
An Efficient Sequential SAT Solver With Improved Search Strategies.
DATE
Feng Lu, Madhu K. Iyer, Ganapathy Parthasarathy, Li-C. Wang, Kwang-Ting Cheng, Kuang-Chien Chen
2005 A conf
Efficient Conflict-Based Learning in an RTL Circuit Constraint Solver.
DATE
Madhu K. Iyer, Ganapathy Parthasarathy, Kwang-Ting Cheng
2005 A conf
RTL SAT simplification by Boolean and interval arithmetic reasoning.
ICCAD
Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Forrest Brewer
2005 A* conf
Structural search for RTL with predicate learning.
DAC
Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Forrest Brewer
2004 A* conf
An efficient finite-domain constraint solver for circuits.
DAC
Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang
2004 — conf
Efficient reachability checking using sequential SAT.
ASP-DAC
Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang
2004 J jnl
Safety Property Verification Using Sequential SAT and Bounded Model Checking.
IEEE Des. Test Comput.
Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang
2003 — conf
A comparison of BDDs, BMC, and sequential SAT for model checking.
HLDVT
Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang
2003 A conf
SATORI - A Fast Sequential SAT Engine for Circuits.
ICCAD
Madhu K. Iyer, Ganapathy Parthasarathy, Kwang-Ting Cheng
2002 A conf
Combining ATPG and Symbolic Simulation for Efficient Validation of Embedded Array Systems.
ITC
Ganapathy Parthasarathy, Madhu K. Iyer, Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Magdy S. Abadir
2002 Misc conf
Software-Based Weighted Random Testing for IP Cores in Bus-Based Programmable SoCs.
VTS
Madhu K. Iyer, Kwang-Ting Cheng
2001 Misc conf
A Self-Test Methodology for IP Cores in Bus-Based Programmable SoCs.
VTS
Jing-Reng Huang, Madhu K. Iyer, Kwang-Ting Cheng
1999 J jnl
Effect of Noise on Analog Circuit Testing.
J. Electron. Test.
Madhu K. Iyer, Michael L. Bushnell
1998 Misc conf
Effect of Noise on Analog Circuit Testing.
VTS
Madhu K. Iyer, Michael L. Bushnell