M. H. Konijnenburg

11 papers A 6Misc 2Unranked 3
YearRankTypeTitle / Venue / Authors
1999 — conf
Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation.
Asian Test Symposium
M. H. Konijnenburg, Hans van der Linden, Ad J. van de Goor
1999 A conf
Illegal State Space Identification for Sequential Circuit Test Generation.
DATE
M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
1999 A conf
Testability of the Philips 80C51 micro-controller.
ITC
M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
1998 — conf
Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection.
Asian Test Symposium
J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor
1997 A conf
Sequential Test Generation with Advanced Illegal State Search.
ITC
M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
1996 A conf
Accelerated Compact Test Set Generation for Three-State Circuits.
ITC
M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
1996 — conf
Circuit Partitioned Automatic Test Pattern Generation Constrained by Three-State Buses and Restrictors.
Asian Test Symposium
J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor
1995 Misc conf
Compact test sets for industrial circuits.
VTS
M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
1994 A conf
Parallel Pattern Fast Fault Simulation for Three-State Circuits and Bidirectional I/O.
ITC
J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor
1994 Misc conf
Test generation and three-state elements, buses, and bidirectionals.
VTS
J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor
1993 A conf
Test Pattern Generation with Restrictors.
ITC
M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
2025 Best paper conf
Assessing the Effectiveness of the Tigress Obfuscator Against MOPSA and BinaryNinja.
CheckMATE
Nicolò Altamura, Enrico Bragastini, Marco Campion, Mila Dalla Preda
2026 Best paper preprint
ASSEMBLAGE-DEEPHISTORY: A Cross-Build Binary Dataset with Temporal Coverage.
arXiv
Chang Liu, Noah Fleischmann, Nicolò Altamura, Edward Raff, James Holt, Kristopher Micinski