M. Enamul Amyeen

32 papers A 8Misc 12Journal 6Unranked 6

Year	Rank	Type	Title / Venue / Authors
2024	—	`conf`	Generating Storage-Aware Test Sets Targeting Several Fault Models. ISVLSI Hari Addepalli, Irith Pomeranz, M. Enamul Amyeen, Suriyaprakash Natarajan, Arani Sinha, Srikanth Venkataraman
2022	—	`conf`	Using Fault Detection Tests to Produce Diagnostic Tests Targeting Large Sets of Candidate Faults. ATS Hari Addepalli, Irith Pomeranz, M. Enamul Amyeen, Suriyaprakash Natarajan, Arani Sinha, Srikanth Venkataraman
2021	J	`jnl`	Hybrid Pass/Fail and Full Fail Data for Reduced Fail Data Volume. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Irith Pomeranz, M. Enamul Amyeen
2021	J	`jnl`	Logic Diagnosis with Hybrid Fail Data. ACM Trans. Design Autom. Electr. Syst. Irith Pomeranz, M. Enamul Amyeen
2018	—	`conf`	Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests. DFT Naixing Wang, Irith Pomeranz, Brady Benware, M. Enamul Amyeen, Srikanth Venkataraman
2017	J	`jnl`	Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction. IEEE Trans. Very Large Scale Integr. Syst. Shraddha Bodhe, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman
2017	J	`jnl`	Test Modification for Reduced Volumes of Fail Data. ACM Trans. Design Autom. Electr. Syst. Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman
2017	A	`conf`	Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure. ITC Srikanth Venkataraman, Irith Pomeranz, Shraddha Bodhe, M. Enamul Amyeen
2016	—	`conf`	A Joint Diagnostic Test Generation Procedure with Dynamic Test Compaction. ATS M. Enamul Amyeen, Irith Pomeranz, Srikanth Venkataraman
2016	A	`conf`	A novel diagnostic test generation methodology and its application in production failure isolation. ITC M. Enamul Amyeen, Dongok Kim, Maheshwar Chandrasekar, Mohammad Noman, Srikanth Venkataraman, Anurag Jain, Neha Goel, Ramesh Sharma
2016	J	`jnl`	Diagnostic Fail Data Minimization Using an N-Cover Algorithm. IEEE Trans. Very Large Scale Integr. Syst. Shraddha Bodhe, M. Enamul Amyeen, Irith Pomeranz, Srikanth Venkataraman
2016	A	`conf`	Diagnostic resolution improvement through learning-guided physical failure analysis. ITC Carlston Lim, Yang Xue, Xin Li, Ronald D. Blanton, M. Enamul Amyeen
2016	Misc	`conf`	Reduction of diagnostic fail data volume and tester time using a dynamic N-cover algorithm. VTS Shraddha Bodhe, M. Enamul Amyeen, Clariza Galendez, Houston Mooers, Irith Pomeranz, Srikanth Venkataraman
2015	Misc	`conf`	Innovative practices session 5C: Advancements in test -keeping moore moving! VTS M. Enamul Amyeen
2014	—	`conf`	Built-in generation of functional broadside tests considering primary input constraints. ACM Great Lakes Symposium on VLSI Bo Yao, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen
2011	A	`conf`	Logic BIST silicon debug and volume diagnosis methodology. ITC M. Enamul Amyeen, Andal Jayalakshmi, Srikanth Venkataraman, Sundar V. Pathy, Ewe C. Tan
2010	Misc	`conf`	Defect diagnosis based on DFM guidelines. VTS Dongok Kim, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman
2009	A	`conf`	Microprocessor system failures debug and fault isolation methodology. ITC M. Enamul Amyeen, Srikanth Venkataraman, Mun Wai Mak
2008	—	`conf`	Prioritizing the Application of DFM Guidelines Based on the Detectability of Systematic Defects. ATS Dongok Kim, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman
2007	A	`conf`	Testing for systematic defects based on DFM guidelines. ITC Dongok Kim, M. Enamul Amyeen, Srikanth Venkataraman, Irith Pomeranz, Swagato Basumallick, Berni Landau
2007	Misc	`conf`	Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. VTS Vishnu C. Vimjam, M. Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang
2006	Misc	`conf`	Dominance Based Analysis for Large Volume Production Fail Diagnosis. VTS Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen, Sudhakar M. Reddy
2006	Misc	`conf`	Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. VTS Ruifeng Guo, Subhasish Mitra, M. Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman
2006	A	`conf`	Improving Precision Using Mixed-level Fault Diagnosis. ITC M. Enamul Amyeen, Debashis Nayak, Srikanth Venkataraman
2004	Misc	`conf`	An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. VTS Srikanth Venkataraman, Srihari Sivaraj, M. Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo
2004	Misc	`conf`	Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. VLSI Design Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, M. Enamul Amyeen
2004	A	`conf`	Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. ITC M. Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee
2003	Misc	`conf`	Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. VTS Xiaoming Yu, M. Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz
2003	J	`jnl`	Fault equivalence identification in combinational circuits using implication and evaluation techniques. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. M. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana
2002	Misc	`conf`	Theorems for Efficient Identification of Indistinguishable Fault Pairs in Synchronous Sequential Circuits. VTS M. Enamul Amyeen, Irith Pomeranz, W. Kent Fuchs
2001	Misc	`conf`	Fault Equivalence Identification Using Redundancy Information and Static and Dynamic Extraction. VTS M. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana
1999	Misc	`conf`	Implication and Evaluation Techniques for Proving Fault Equivalence. VTS M. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana