M. A. Styblinski

27 papers A 3C 8Journal 11Unranked 5
YearRankTypeTitle / Venue / Authors
1997 J jnl
Parameter extraction for statistical IC modeling based on recursive inverse approximation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ming Qu, M. A. Styblinski
1996 — conf
A new approach to system level modeling and optimization of integrated circuits.
ICECS
D. Alexander, M. A. Styblinski
1996 — conf
Statistical characterization and optimization of integrated circuits based on singular value decomposition.
ICECS
M. A. Styblinski, Joos Vandewalle, M. Sengupta
1995 J jnl
A new analytical/iterative approach to statistical delay characterization of cmos digital combinational circuits.
Int. J. Circuit Theory Appl.
Syed A. Aftab, M. A. Styblinski
1995 C conf
An Adaptive Approach to Statistical Macromodeling of Analog Integrated Circuits.
ISCAS
Ming Qu, M. A. Styblinski
1995 C conf
An Efficient Jacobian Updating Technique for Analog Circuit Optimization.
ISCAS
M. Sengupta, M. A. Styblinski
1995 C conf
Comparison of Symbolic Approximation and Macromodelling Techniques for Statistical Design of Analog Integrated Circuits.
ISCAS
M. A. Styblinski, Ming Qu
1994 A conf
A new efficient approach to statistical delay modeling of CMOS digital combinational circuits.
ICCAD
Syed A. Aftab, M. A. Styblinski
1994 C conf
IC Variability Minimization using a New Cp and Cpk Based Variability/Performance Measure.
ISCAS
Syed A. Aftab, M. A. Styblinski
1994 C conf
Statistical Characterization and Modeling of Analog Functional Blocks.
ISCAS
Ming Qu, M. A. Styblinski
1993 C conf
A Heursitsic Global Optimization Algorithm and Its Application to CMOS Circuit Variability Minimization.
ISCAS
Ming Qu, M. A. Styblinski
1993 C conf
A Systematic Approach of Statistical Modeling and Its Application to CMOS Circuits.
ISCAS
Jian Chen, M. A. Styblinski
1993 C conf
Adaptive Hierarchical Multi-objective Fuzzy Optimization for Circuit Design.
ISCAS
B. R. S. Rodrigues, M. A. Styblinski
1993 J jnl
Combination of interpolation and self-organizing approximation techniques-a new approach to circuit performance modeling.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
M. A. Styblinski, Syed A. Aftab
1993 J jnl
Drift reliability optimization in IC design: generalized formulation and practical examples.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
M. A. Styblinski, Min Huang
1992 — conf
A generic software system for drift reliability optimization of VLSI circuits.
EURO-DAC
Min Huang, M. A. Styblinski
1992 — conf
GOSSIP: a generic system for statistical circuit design.
EURO-DAC
Leszek J. Opalski, M. A. Styblinski
1991 A conf
Circuit Performance Variability Reduction: Principles, Problems, and Practical Solutions.
ICCAD
M. A. Styblinski, J. C. Zhang
1991 J jnl
Efficient performance function interpolation scheme and its application to statistical circuit design.
Int. J. Circuit Theory Appl.
R. M. Biernacki, M. A. Styblinski
1991 J jnl
Signal Flow Graphs vs Fuzzy Cognitive Maps in Application to Qualitative Circuit Analysis.
Int. J. Man Mach. Stud.
M. A. Styblinski, B. D. Meyer
1990 A conf
Design for Circuit Quality: Yield Maximization, Minimax, and Taguchi Approach.
ICCAD
M. A. Styblinski
1990 J jnl
Experiments in nonconvex optimization: Stochastic approximation with function smoothing and simulated annealing.
Neural Networks
M. A. Styblinski, Tian-Shen Tang
1988 — conf
Fuzzy cognitive maps, signal flow graphs, and qualitative circuit analysis.
ICNN
M. A. Styblinski, B. D. Meyer
1988 J jnl
Yield optimization for nondifferentiable density functions using convolution techniques.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Tian-Shen Tang, M. A. Styblinski
1986 J jnl
Algorithms and Software Tools for IC Yield Optimization Based on Fundamental Fabrication Parameters.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
M. A. Styblinski, Leszek J. Opalski
1986 J jnl
Generalization of Yield Optimization Problem: Maximum Income Approach.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Leszek J. Opalski, M. A. Styblinski
1986 J jnl
Problems of Yield Gradient Estimation for Truncated Probability Density Functions.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
M. A. Styblinski