| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 1997 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1996 | — | conf |
ICECS
|
| 1996 | — | conf |
ICECS
|
| 1995 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 1995 | C | conf |
ISCAS
|
| 1995 | C | conf |
ISCAS
|
| 1995 | C | conf |
ISCAS
|
| 1994 | A | conf |
ICCAD
|
| 1994 | C | conf |
ISCAS
|
| 1994 | C | conf |
ISCAS
|
| 1993 | C | conf |
ISCAS
|
| 1993 | C | conf |
ISCAS
|
| 1993 | C | conf |
ISCAS
|
| 1993 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1993 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1992 | — | conf |
EURO-DAC
|
| 1992 | — | conf |
EURO-DAC
|
| 1991 | A | conf |
ICCAD
|
| 1991 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 1991 | J | jnl |
Int. J. Man Mach. Stud.
|
| 1990 | A | conf |
ICCAD
|
| 1990 | J | jnl |
Neural Networks
|
| 1988 | — | conf |
ICNN
|
| 1988 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1986 | J | jnl |
Algorithms and Software Tools for IC Yield Optimization Based on Fundamental Fabrication Parameters.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1986 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1986 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|