Lung-Jen Lee

12 papers Journal 5Unranked 7
YearRankTypeTitle / Venue / Authors
2019 — conf
A Low-Complexity Color Image Compression Algorithm Based on AMBTC.
ICCE-TW
Hsiao-Hsuan Cheng, Chiung-An Chen, Lung-Jen Lee, Ting-Lan Lin, Yih-Shyh Chiou, Shih-Lun Chen
2013 J jnl
Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction.
J. Electron. Test.
Lung-Jen Lee
2012 J jnl
$2^{n}$ Pattern Run-Length for Test Data Compression.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Cheng-Ho Chang
2012 — conf
Deterministic ATPG for Low Capture Power Testing.
MTV
Lung-Jen Lee, Chia-Cheng He, Wang-Dauh Tseng
2012 — conf
Dual-LFSR Reseeding for Low Power Testing.
MTV
Lung-Jen Lee, Wang-Dauh Tseng, Wen-Ting Yang
2012 — conf
Two-Way Multicasting for Test Data Compression.
MTV
Lung-Jen Lee, Wang-Dauh Tseng, Wei-Shun Chen
2010 J jnl
Deterministic built-in self-test using multiple linear feedback shift registers for test power and test volume reduction.
IET Comput. Digit. Tech.
Wang-Dauh Tseng, Lung-Jen Lee, Rung-Bin Lin
2010 J jnl
Test Data Compression Using Multi-dimensional Pattern Run-length Codes.
J. Electron. Test.
Wang-Dauh Tseng, Lung-Jen Lee
2009 — conf
A Multi-dimensional Pattern Run-Length Method for Test Data Compression.
Asian Test Symposium
Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Chen-Lun Lee
2009 — conf
Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing.
Asian Test Symposium
Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Chi-Wei Yu
2008 J jnl
Power Reduction during Scan Testing Based on Multiple Capture Technique.
IEICE Trans. Electron.
Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin
2007 — conf
Reduction of Power Dissipation during Scan Testing by Test Vector Ordering.
MTV
Wang-Dauh Tseng, Lung-Jen Lee