Luis Carlos Méndez-González

14 papers Journal 14
YearRankTypeTitle / Venue / Authors
2024 J jnl
Characterization and Dataset Compilation of Torque-Angle Curve Behavior for M2/M3 Screws.
Data
Iván Juan Carlos Pérez-Olguín, Consuelo Catalina Fernández-Gaxiola, Luis Alberto Rodríguez-Picón, Luis Carlos Méndez-González
2023 J jnl
A Gamma Process with Three Sources of Variability.
Symmetry
Luis Alberto Rodríguez-Picón, Luis Carlos Méndez-González, Iván Juan Carlos Pérez-Olguín, Jesús Israel Hernández Hernández
2023 J jnl
A reliability analysis for electronic devices under an extension of exponentiated perks distribution.
Qual. Reliab. Eng. Int.
Luis Carlos Méndez-González, Luis Alberto Rodríguez-Picón, Iván Juan Carlos Pérez-Olguín, Vicente García, Abel Eduardo Quezada-Carreón
2023 J jnl
An Additive Chen Distribution with Applications to Lifetime Data.
Axioms
Luis Carlos Méndez-González, Luis Alberto Rodríguez-Picón, Iván Juan Carlos Pérez-Olguín, Luis Ricardo Vidal Portilla
2023 J jnl
Emotional Classification Method (ECW): A Methodology for Measuring Emotional Sustainability in a Work Environment Utilizing Artificial Intelligence.
Axioms
Florencio Abraham Roldán-Castellanos, Iván Juan Carlos Pérez-Olguín, Aimeé Gutiérrez-Vázquez, Luis Carlos Méndez-González, Luis Alberto Rodríguez-Picón
2022 J jnl
A Study of Stopping Rules in the Steepest Ascent Methodology for the Optimization of a Simulated Process.
Axioms
Paulo Eduardo García-Nava, Luis Alberto Rodríguez-Picón, Luis Carlos Méndez-González, Iván Juan Carlos Pérez-Olguín
2021 J jnl
Revisiting the Dissimilarity Representation in the Context of Regression.
IEEE Access
Vicente García, J. Salvador Sánchez, Rafael Martínez-Peláez, Luis Carlos Méndez-González
2019 J jnl
Reliability analysis using exponentiated Weibull distribution and inverse power law.
Qual. Reliab. Eng. Int.
Luis Carlos Méndez-González, Luis Alberto Rodríguez-Picón, Delia J. Valles-Rosales, Alejandro Alvarado-Iniesta, Abel Eduardo Quezada-Carreón
2019 J jnl
Using regression models for predicting the product quality in a tubing extrusion process.
J. Intell. Manuf.
Vicente García, J. Salvador Sánchez, Luis Alberto Rodríguez-Picón, Luis Carlos Méndez-González, Humberto de Jesús Ochoa Domínguez
2018 J jnl
Degradation modeling based on gamma process models with random effects.
Commun. Stat. Simul. Comput.
Luis Alberto Rodríguez-Picón, Anna Patricia Rodríguez-Picón, Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Alejandro Alvarado-Iniesta
2017 J jnl
Reliability analysis for electronic devices using beta-Weibull distribution.
Qual. Reliab. Eng. Int.
Luis Carlos Méndez-González, Luis Alberto Rodríguez-Picón, Delia J. Valles-Rosales, Roberto Romero-López, Abel Eduardo Quezada-Carreón
2016 J jnl
Reliability Analysis for Laptop Computer Under Electrical Harmonics.
Qual. Reliab. Eng. Int.
Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Manuel R. Piña-Monarrez, Roberto Ambrosio, Arturo Del Valle
2016 J jnl
Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution.
Qual. Reliab. Eng. Int.
Luis Alberto Rodríguez-Picón, Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Arturo Del Valle
2016 J jnl
Reliability Model for Electronic Devices under Time Varying Voltage.
Qual. Reliab. Eng. Int.
Luis Carlos Méndez-González, Manuel Iván Rodríguez-Borbón, Delia J. Valles-Rosales, Arturo Del Valle, Arnoldo Rodriguez