Luis A. Escobar

11 papers Journal 11
YearRankTypeTitle / Venue / Authors
2019 J jnl
Effects of Antimodularity and Multiscale Influence in Random Boolean Networks.
Complex.
Luis A. Escobar, Hyobin Kim, Carlos Gershenson
2017 J jnl
Estimating a Parametric Component Lifetime Distribution from a Collection of Superimposed Renewal Processes.
Technometrics
Wei Zhang, Ye Tian, Luis A. Escobar, William Q. Meeker
2013 J jnl
Methods for Planning Repeated Measures Degradation Studies.
Technometrics
Brian P. Weaver, William Q. Meeker, Luis A. Escobar, Joanne Wendelberger
2011 J jnl
Peak demand forecasting for a seasonal product using Bayesian approach.
J. Oper. Res. Soc.
M. A. Rahman, Bhaba R. Sarker, Luis A. Escobar
2009 J jnl
Accelerated Destructive Degradation Test Planning.
Technometrics
Ying Shi, Luis A. Escobar, William Q. Meeker
2009 J jnl
Using Accelerated Life Tests Results to Predict Product Field Reliability.
Technometrics
William Q. Meeker, Luis A. Escobar, Yili Hong
2008 J jnl
Avoiding Problems With Normal Approximation Confidence Intervals for Probabilities.
Technometrics
Yili Hong, William Q. Meeker, Luis A. Escobar
2008 J jnl
The Relationship Between Confidence Intervals for Failure Probabilities and Life Time Quantiles.
IEEE Trans. Reliab.
Yili Hong, William Q. Meeker, Luis A. Escobar
2005 J jnl
Sample Size and Number of Failure Requirements for Demonstration Tests With Log-Location-Scale Distributions and Failure Censoring.
Technometrics
Scott W. McKane, Luis A. Escobar, William Q. Meeker
2004 J jnl
Discussion.
Technometrics
William Q. Meeker, Luis A. Escobar
1999 J jnl
Statistical Prediction Based on Censored Life Data.
Technometrics
Luis A. Escobar, William Q. Meeker