Louay Abdallah

17 papers A 4B 1C 1Misc 1Journal 2Unranked 8
YearRankTypeTitle / Venue / Authors
2018 J jnl
Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning.
J. Electron. Test.
Parth kansara, Sharanabasavaraja Bheema Reddy, Louay Abdallah, Ke Huang
2015 A conf
Fast deployment of alternate analog test using Bayesian model fusion.
DATE
John Liaperdos, Haralampos-G. D. Stratigopoulos, Louay Abdallah, Yiorgos Tsiatouhas, Angela Arapoyanni, Xin Li
2015 — conf
Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors.
ISVLSI
Athanasios Dimakos, Martin Andraud, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Emmanuel Simeu, Salvador Mir
2014 — conf
Low-cost EVM built-in test of RF transceivers.
IDT
Ayssar Serhan, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir
2014 — conf
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes.
MWSCAS
Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo
2013 Misc conf
Defect-oriented non-intrusive RF test using on-chip temperature sensors.
VTS
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet
2013 — conf
Multivariate statistical techniques for analog parametric test metrics estimation.
DTIS
Ke Huang, Haralampos-G. D. Stratigopoulos, Louay Abdallah, Salvador Mir, Ahcène Bounceur
2013 A conf
True non-intrusive sensors for RF built-in test.
ITC
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir
2012 — conf
Accurate estimation of analog test metrics with extreme circuits.
ICECS
Kamel Beznia, Ahcène Bounceur, Louay Abdallah, Ke Huang, Salvador Mir, Reinhardt Euler
2012 A conf
Experiences with non-intrusive sensors for RF built-in test.
ITC
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma
2012 A conf
Testing RF circuits with true non-intrusive built-in sensors.
DATE
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet
2011 — conf
Implicit test of high-speed analog circuits using non-intrusive sensors.
ECCTD
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir
2011 — conf
On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study.
Asian Test Symposium
Alexios Spyronasios, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir
2011 J jnl
RF Front-End Test Using Built-in Sensors.
IEEE Des. Test Comput.
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma
2010 — conf
Adaptive Logical Control of RF LNA Performances for Efficient Energy Consumption.
VLSI-SoC (Selected Papers)
Rafik Khereddine, Louay Abdallah, Emmanuel Simeu, Salvador Mir, Fabio Cenni
2010 C conf
Adaptive logical control of RF LNA performances for efficient energy consumption.
VLSI-SoC
Rafik Khereddine, Louay Abdallah, Emmanuel Simeu, Salvador Mir, Fabio Cenni
2010 B conf
Sensors for built-in alternate RF test.
ETS
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Christophe Kelma, Salvador Mir