Lothar Frey

15 papers C 1Journal 10Unranked 4
YearRankTypeTitle / Venue / Authors
2018 J jnl
Normalized differential conductance to study current conduction mechanisms in MOS structures.
Microelectron. Reliab.
T. H. Nouibat, Zitouni Messai, D. Chikouch, Zahir Ouennoughi, N. Rouag, Mathias Rommel, Lothar Frey
2017 — conf
Determination of the Selectivity of Printed Wearable Sweat Sensors.
BIODEVICES
Alicia Zörner, Susanne Oertel, Björn Schmitz, Nadine Lang, Michael P. M. Jank, Lothar Frey
2017 J jnl
Waveguide Bragg Gratings in Ormocer
Sensors
Maiko Girschikofsky, Manuel Rosenberger, Michael Förthner, Mathias Rommel, Lothar Frey, Ralf Hellmann
2016 — conf
Screen-printed Biochemical Sensors for Detection of Ammonia Levels in Sweat - Towards Integration with Vital Parameter Monitoring Sports Gear.
BIODEVICES
Susanne Oertel, Michael P. M. Jank, Lothar Frey, Christian Hofmann, Nadine Lang, Matthias Struck
2015 J jnl
Current conduction mechanism of MIS devices using multidimensional minimization system program.
Microelectron. Reliab.
N. Rouag, Zahir Ouennoughi, Mathias Rommel, Katsuhisa Murakami, Lothar Frey
2015 C conf
Integrated galvanically isolated MOSFET and IGBT gate-driver circuit with switching speed control.
IECON
Vincent R. H. Lorentz, Radu Schwarz, T. Heckel, Martin März, Lothar Frey
2014 J jnl
Analytical stress characterization after different chip separation methods.
Microelectron. Reliab.
M. Fuegl, G. Mackh, Elke Meissner, Lothar Frey
2014 — conf
Galvanically isolated differential data transmission using capacitive coupling and a modified Manchester algorithm for smart power converters.
ISIE
M. T. Niedermeier, Martin M. Wenger, Radu Filimon, V. O. Sedlacek, Vincent R. H. Lorentz, C. Fort, Martin März, Jean-Paul Ferrieux, Lothar Frey
2013 J jnl
Conduction mechanisms in thermal nitride and dry gate oxides grown on 4H-SiC.
Microelectron. Reliab.
Zahir Ouennoughi, C. Strenger, F. Bourouba, V. Haeublein, Heiner Ryssel, Lothar Frey
2012 — conf
Novel cost-efficient contactless distributed monitoring concept for smart battery cells.
ISIE
Vincent R. H. Lorentz, Martin M. Wenger, Joshua L. Grosch, Martin Giegerich, Michael P. M. Jank, Martin März, Lothar Frey
2011 J jnl
Investigation of the reliability of 4H-SiC MOS devices for high temperature applications.
Microelectron. Reliab.
Martin Le-Huu, Holger Schmitt, Stefan Noll, Michael Grieb, Frederik F. Schrey, Anton J. Bauer, Lothar Frey, Heiner Ryssel
2011 J jnl
Leakage current and defect characterization of p
Microelectron. Reliab.
Guntrade Roll, Matthias Goldbach, Lothar Frey
2005 J jnl
Electrical properties of hafnium silicate films obtained from a single-source MOCVD precursor.
Microelectron. Reliab.
Martin Lemberger, Albena Paskaleva, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel
2003 J jnl
Electrical characterization of zirconium silicate films obtained from novel MOCVD precursors.
Microelectron. Reliab.
Albena Paskaleva, Martin Lemberger, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel
2001 J jnl
Electrical reliability aspects of through the gate implanted MOS structures with thin oxides.
Microelectron. Reliab.
Michael P. M. Jank, Martin Lemberger, Anton J. Bauer, Lothar Frey, Heiner Ryssel