| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2026 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2026 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2026 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2025 | J | jnl |
Integr.
|
| 2025 | A | conf |
DATE
|
| 2025 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2025 | A* | conf |
DAC
|
| 2025 | A* | conf |
DAC
|
| 2024 | A | conf |
DATE
|
| 2024 | A | conf |
DATE
|
| 2024 | B | conf |
ASPDAC
|
| 2024 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2024 | — | conf |
MLCAD
|
| 2024 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2024 | — | conf |
MLCAD
|
| 2024 | — | conf |
MLCAD
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2024 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2023 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | A | conf |
DATE
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | — | conf |
ASICON
|
| 2023 | A | conf |
DATE
|
| 2023 | — | conf |
Graph-Learning-Driven Path-Based Timing Analysis Results Predictor from Graph-Based Timing Analysis.
ASP-DAC
|
| 2023 | J | jnl |
Integr.
|
| 2022 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2022 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2022 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2021 | J | jnl |
IEEE J. Solid State Circuits
|
| 2021 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2021 | — | conf |
ASP-DAC
|
| 2021 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2020 | — | conf |
ISSCC
|
| 2020 | J | jnl |
IEEE Trans. Circuits Syst.
|
| 2020 | J | jnl |
IEEE J. Solid State Circuits
|
| 2020 | A* | conf |
DAC
|
| 2020 | A | conf |
ICCAD
|
| 2020 | J | jnl |
IEEE Embed. Syst. Lett.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
IEEE J. Solid State Circuits
|
| 2020 | A | conf |
DATE
|
| 2020 | J | jnl |
IEEE J. Solid State Circuits
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | A* | conf |
DAC
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2019 | A | conf |
ICCAD
|
| 2019 | J | jnl |
Microelectron. J.
|
| 2019 | — | conf |
ISPD
|
| 2019 | — | conf |
ASICON
|
| 2019 | — | conf |
ASICON
|
| 2019 | J | jnl |
Mach. Vis. Appl.
|
| 2019 | J | jnl |
Microelectron. J.
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | A | conf |
ICCAD
|
| 2019 | J | jnl |
Microprocess. Microsystems
|
| 2019 | A* | conf |
DAC
|
| 2019 | — | conf |
FPT
|
| 2019 | J | jnl |
CoRR
|
| 2018 | — | conf |
A-SSCC
|
| 2018 | J | jnl |
Sensors
|
| 2018 | J | jnl |
IEEE J. Solid State Circuits
|
| 2018 | B | conf |
ICPR
|
| 2018 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2018 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2018 | J | jnl |
J. Syst. Archit.
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2017 | — | conf |
A-SSCC
|
| 2017 | — | conf |
PACRIM
|
| 2017 | — | conf |
PACRIM
|
| 2017 | A | conf |
DATE
|
| 2017 | J | jnl |
Microprocess. Microsystems
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
IEICE Electron. Express
|
| 2017 | J | jnl |
IEEE Access
|
| 2017 | — | conf |
SiPS
|
| 2017 | J | jnl |
Microprocess. Microsystems
|
| 2014 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2014 | A* | conf |
DAC
|
| 2014 | J | jnl |
IEICE Electron. Express
|
| 2014 | B | conf |
RTCSA
|
| 2014 | J | jnl |
IEICE Electron. Express
|
| 2014 | J | jnl |
Microelectron. J.
|
| 2013 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2013 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2013 | J | jnl |
IEICE Electron. Express
|
| 2013 | J | jnl |
IEICE Electron. Express
|
| 2013 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2013 | J | jnl |
IEEE Trans. Signal Process.
|
| 2013 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2013 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2012 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2012 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2012 | J | jnl |
IEICE Electron. Express
|
| 2012 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2012 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2012 | J | jnl |
Fast AdaBoost-Based Face Detection System on a Dynamically Coarse Grain Reconfigurable Architecture.
IEICE Trans. Inf. Syst.
|
| 2012 | J | jnl |
IEICE Trans. Commun.
|
| 2012 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2011 | — | conf |
ASICON
|
| 2011 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2011 | J | jnl |
Microelectron. J.
|
| 2011 | J | jnl |
IEICE Trans. Electron.
|
| 2011 | J | jnl |
IEICE Electron. Express
|
| 2011 | — | conf |
ASICON
|
| 2011 | B | conf |
IWCMC
|
| 2010 | J | jnl |
J. Commun. Networks
|
| 2010 | J | jnl |
Microelectron. Reliab.
|
| 2010 | J | jnl |
Microelectron. Reliab.
|
| 2010 | J | jnl |
J. Signal Process. Syst.
|
| 2009 | J | jnl |
IEICE Trans. Electron.
|
| 2009 | A | conf |
ICME
|
| 2009 | J | jnl |
J. Circuits Syst. Comput.
|
| 2009 | J | jnl |
IEICE Trans. Electron.
|
| 2009 | J | jnl |
Microelectron. J.
|
| 2009 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2009 | J | jnl |
IET Circuits Devices Syst.
|
| 2009 | J | jnl |
IEICE Trans. Commun.
|
| 2008 | J | jnl |
IEICE Trans. Electron.
|
| 2008 | J | jnl |
IET Circuits Devices Syst.
|
| 2008 | — | conf |
APCCAS
|
| 2008 | J | jnl |
Microelectron. Reliab.
|
| 2007 | — | conf |
ISSPA
|
| 2006 | J | jnl |
Microelectron. J.
|
| 2006 | C | conf |
ISCAS
|
| 2006 | J | jnl |
Microelectron. Reliab.
|
| 2005 | — | conf |
SoCC
|
| 2005 | — | conf |
ISQED
|
| 2005 | — | conf |
ISCAS (6)
|
| 2005 | J | jnl |
Microelectron. Reliab.
|
| 2000 | J | jnl |
IEEE J. Solid State Circuits
|