| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
Integr.
|
| 2024 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Sensors
|
| 2022 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2021 | J | jnl |
Sci. China Inf. Sci.
|
| 2021 | J | jnl |
Integr.
|
| 2021 | J | jnl |
IEEE Trans. Emerg. Top. Comput.
|
| 2020 | J | jnl |
IEEE Trans. Reliab.
|
| 2020 | J | jnl |
Inf. Sci.
|
| 2020 | — | conf |
DCIS
|
| 2020 | J | jnl |
IET Comput. Digit. Tech.
|
| 2020 | J | jnl |
Knowl. Based Syst.
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | — | conf |
ASICON
|
| 2019 | C | conf |
IOLTS
|
| 2019 | B | conf |
ICIP
|
| 2019 | J | jnl |
CoRR
|
| 2019 | J | jnl |
CoRR
|
| 2019 | J | jnl |
J. Electron. Test.
|
| 2019 | — | conf |
DFT
|
| 2019 | — | conf |
ASICON
|
| 2019 | — | conf |
DFT
|
| 2019 | J | jnl |
CoRR
|
| 2019 | — | conf |
ICICDT
|
| 2019 | J | jnl |
Sci. China Inf. Sci.
|
| 2019 | — | conf |
ASICON
|
| 2018 | J | jnl |
CoRR
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
CoRR
|
| 2018 | J | jnl |
Knowl. Based Syst.
|
| 2018 | B | conf |
ICPR
|
| 2018 | J | jnl |
CoRR
|
| 2018 | C | conf |
IOLTS
|
| 2017 | — | conf |
ISQED
|
| 2017 | J | jnl |
IEEE Trans. Reliab.
|
| 2017 | — | conf |
ASICON
|
| 2017 | — | conf |
ASICON
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | — | conf |
ISQED
|
| 2017 | — | conf |
ASICON
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | — | conf |
ASP-DAC
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2015 | — | conf |
CAD/Graphics
|
| 2015 | — | conf |
ISQED
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | — | conf |
ISQED
|
| 2015 | J | jnl |
IEEE Trans. Reliab.
|
| 2014 | J | jnl |
Microelectron. J.
|
| 2014 | J | jnl |
Circuits Syst. Signal Process.
|
| 2014 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2014 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2013 | J | jnl |
J. Low Power Electron.
|
| 2013 | J | jnl |
IEEE Signal Process. Lett.
|
| 2013 | J | jnl |
IEEE Micro
|
| 2012 | J | jnl |
J. Low Power Electron.
|
| 2011 | J | jnl |
Microelectron. J.
|
| 2011 | C | conf |
VLSI-SoC
|
| 2011 | J | jnl |
J. Electron. Test.
|
| 2010 | C | conf |
ISCAS
|
| 2010 | — | conf |
DFT
|
| 2009 | A* | conf |
DAC
|
| 2008 | — | conf |
DELTA
|
| 2008 | — | conf |
ICECS
|
| 2008 | — | conf |
DELTA
|
| 2008 | — | conf |
APCCAS
|
| 2008 | C | conf |
PRDC
|
| 2003 | — | conf |
Asian Test Symposium
|
| 2002 | J | jnl |
J. Comput. Sci. Technol.
|
| 2001 | — | conf |
ASP-DAC
|
| 2001 | — | conf |
Annual Simulation Symposium
|