| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Int. J. Model. Simul. Sci. Comput.
|
| 2025 | A* | conf |
MICRO
|
| 2025 | J | jnl |
Int. J. Model. Simul. Sci. Comput.
|
| 2024 | J | jnl |
Comput. Electr. Eng.
|
| 2024 | A | conf |
CIKM
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
J. Electronic Imaging
|
| 2024 | J | jnl |
Neurocomputing
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Access
|
| 2023 | B | conf |
SMC
|
| 2023 | — | conf |
Few-shot Industrial Defect Image Classification Based on Lightweight Model with Attention Mechanism.
ASSE
|
| 2022 | — | conf |
ICPHM
|
| 2022 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
Comput. Ind. Eng.
|
| 2020 | — | conf |
SSCI
|
| 2020 | J | jnl |
Neurocomputing
|
| 2019 | Misc | conf |
ICMLC
|
| 2019 | — | conf |
SSCI
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | B | conf |
SMC
|
| 2019 | — | conf |
SSCI
|
| 2019 | — | conf |
ICPHM
|
| 2018 | J | jnl |
J. Intell. Manuf.
|
| 2018 | J | jnl |
Int. J. Model. Simul. Sci. Comput.
|
| 2018 | — | conf |
SSCI
|
| 2018 | J | jnl |
Wirel. Pers. Commun.
|
| 2018 | — | conf |
ICPHM
|
| 2017 | — | conf |
ROBIO
|
| 2016 | J | jnl |
Int. J. Model. Simul. Sci. Comput.
|
| 2015 | J | jnl |
Int. J. Model. Simul. Sci. Comput.
|
| 2015 | C | conf |
CSCWD
|
| 2015 | J | jnl |
Int. J. Model. Simul. Sci. Comput.
|
| 2013 | — | conf |
AsiaSim
|
| 2013 | — | conf |
AsiaSim
|
| 2012 | — | conf |
AsiaSim (1)
|
| 2012 | B | conf |
PADS
|
| 2008 | J | jnl |
Adv. Eng. Informatics
|
| 2007 | J | jnl |
Comput. Ind.
|
| 2007 | — | conf |
ICNC (1)
|
| 2007 | — | conf |
ICNC (1)
|
| 2006 | C | conf |
CSCWD
|