| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
Appl. Soft Comput.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
Sensors
|
| 2017 | — | conf |
ASICON
|
| 2016 | — | conf |
ICSS
|
| 2015 | — | conf |
ASICON
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
J. Networks
|
| 2013 | J | jnl |
J. Networks
|
| 2012 | J | jnl |
J. Softw.
|
| 2011 | J | jnl |
J. Softw.
|