| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEICE Electron. Express
|
| 2025 | J | jnl |
Microelectron. J.
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
Comput. Ind. Eng.
|
| 2019 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model.
Microelectron. Reliab.
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
Single-event multiple transients in guard-ring hardened inverter chains of different layout designs.
Microelectron. Reliab.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
计算机科学
|
| 2016 | J | jnl |
Int. J. Distributed Sens. Networks
|
| 2014 | C | conf |
AAIM
|
| 2013 | J | jnl |
J. Softw.
|
| 2011 | — | conf |
LISS (3)
|
| 2011 | J | jnl |
J. Softw.
|
| 2009 | — | conf |
CSO (1)
|
| 2005 | C | conf |
AAIM
|
| 2005 | — | conf |
WINE
|