Lihua Dai

15 papers Journal 14Unranked 1
YearRankTypeTitle / Venue / Authors
2026 J jnl
A 7-bit 76-81-GHz Hybrid Vector-Modulated Variable Gain Phase Shifter Combining Phase-Invariant VGA and 1-bit CDAC.
IEEE Trans. Circuits Syst. II Express Briefs
Bowen Ding, Ying Song, Lihua Dai, Shuiyang Lin
2026 J jnl
Double Hopf bifurcation generated by dual memory delays in a diffusive two-species model.
J. Appl. Math. Comput.
Shuai Li, Qian Wei, Xinyu Song, Lihua Dai, Chengdai Huang
2025 J jnl
Dynamical analysis of almost periodic solutions for delayed octonion-valued BAM neural networks.
Comput. Appl. Math.
Jin Gao, Lihua Dai, Min Xiao
2024 J jnl
Finite-time stability of weighted pseudo almost periodic solutions for Clifford-valued shunting inhibitory cellular neural networks with delays.
Int. J. Control
Jin Gao, Lihua Dai
2024 J jnl
The application of deep learning technology in integrated circuit design.
Energy Inform.
Lihua Dai, Ben Wang, Xuemin Cheng, Qin Wang, Xinsen Ni
2022 J jnl
Anti-Periodic Synchronization of Clifford-Valued Neutral-Type Recurrent Neural Networks With D Operator.
IEEE Access
Jin Gao, Lihua Dai
2022 J jnl
Anti-periodic solutions of Clifford-valued fuzzy cellular neural networks with delays.
Comput. Appl. Math.
Jin Gao, Lihua Dai
2021 — conf
Intelligent Grasping Method of Multi-joint Manipulator Based on Deep Learning.
ICISCAE (IEEE)
Lihua Dai, Qingqing Shi
2021 J jnl
S-Asymptotically ω-Periodic Solutions of Fractional-Order Complex-Valued Recurrent Neural Networks With Delays.
IEEE Access
Yuanyuan Hou, Lihua Dai
2020 J jnl
Electrical performance of 130 nm PD-SOI MOSFET with diamond layout.
Microelectron. J.
Xiaonian Liu, Lihua Dai, Pingliang Li, Shichang Zou
2018 J jnl
A novel highly reliable and low-power radiation hardened SRAM bit-cell design.
IEICE Electron. Express
Dianpeng Lin, Yiran Xu, Xiaonian Liu, Wenyi Zhu, Lihua Dai, Mengying Zhang, Xiaoyun Li, Xin Xie, Jianwei Jiang, Huilong Zhu, Zhengxuan Zhang, Shichang Zou
2018 J jnl
Total dose radiation induced changes of the floating body effects in the partially depleted SOI NMOS with ultrathin gate oxide.
IEICE Electron. Express
Zhiyuan Hu, Lihua Dai, Zhengxuan Zhang, Xiaoyun Li, Shichang Zou
2017 J jnl
Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs.
Microelectron. Reliab.
Lihua Dai, Xiaonian Liu, Mengying Zhang, Leqing Zhang, Zhiyuan Hu, Dawei Bi, Zhengxuan Zhang, Shichang Zou
2017 J jnl
Influences of silicon-rich shallow trench isolation on total ionizing dose hardening and gate oxide integrity in a 130 nm partially depleted SOI CMOS technology.
Microelectron. Reliab.
Lei Song, Zhiyuan Hu, Mengying Zhang, Xiaonian Liu, Lihua Dai, Zhengxuan Zhang, Shichang Zou
2016 J jnl
Bias dependence of TID induced single transistor latch for 0.13 μm partially depleted SOI input/output NMOSFETs.
Microelectron. Reliab.
Shuang Fan, Bingxu Ning, Zhiyuan Hu, Zhengxuan Zhang, Dawei Bi, Chao Peng, Lei Song, Lihua Dai